blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP2166314

EP2166314 - PHYSICAL QUANTITY MEASURING DEVICE OF OPTICAL FREQUENCY RANGE REFLECTION MEASURING TYPE, AND TEMPERATURE AND STRAIN MEASURING METHOD USING THE DEVICE [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  26.06.2020
Database last updated on 16.09.2024
FormerExamination is in progress
Status updated on  27.04.2018
Most recent event   Tooltip26.06.2020Application deemed to be withdrawnpublished on 29.07.2020  [2020/31]
Applicant(s)For all designated states
FUJIKURA LTD.
5-1, Kiba 1-chome
Koto-ku
Tokyo 135-8512 / JP
[N/P]
Former [2011/37]For all designated states
FUJIKURA LTD.
5-1, Kiba 1-chome Kohtoh-ku
Tokyo 135-8512 / JP
Former [2010/40]For all designated states
FUJIKURA LTD.
No. 5-1 Kiba 1-chome Kohtoh-ku
Tokyo / JP
Former [2010/12]For all designated states
Fujikura, Ltd.
5-1, Kiba 1-chome Kohtoh-ku
Tokyo 135-8512 / JP
Inventor(s)01 / OMICHI, Koji
c/o Fujikura Ltd. Sakura Works 1440 Mutsuzaki
Sakura-shi Chiba 285-8550 / JP
02 / SAKAMOTO, Akira
c/o Fujikura Ltd. Sakura Works 1440 Mutsuzaki
Sakura-shi Chiba 285-8550 / JP
03 / HIRAFUNE, Shunichirou
c/o Fujikura Ltd. Sakura Works 1440 Mutsuzaki
Sakura-shi Chiba 285-8550 / JP
 [2010/12]
Representative(s)Plasseraud IP
104 Rue de Richelieu
CS92104
75080 Paris Cedex 02 / FR
[N/P]
Former [2010/12]Cabinet Plasseraud
52, rue de la Victoire
75440 Paris Cedex 09 / FR
Application number, filing date09714275.602.03.2009
[2010/12]
WO2009JP53898
Priority number, dateJP2008005134429.02.2008         Original published format: JP 2008051344
JP2008005134529.02.2008         Original published format: JP 2008051345
JP2008031128605.12.2008         Original published format: JP 2008311286
JP2008031128705.12.2008         Original published format: JP 2008311287
[2010/12]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2009107838
Date:03.09.2009
Language:JA
[2009/36]
Type: A1 Application with search report 
No.:EP2166314
Date:24.03.2010
Language:EN
[2010/12]
Type: A8 Corrected patent application 
No.:EP2166314
Date:14.09.2011
[2011/37]
Search report(s)International search report - published on:JP03.09.2009
(Supplementary) European search report - dispatched on:EP15.03.2017
ClassificationIPC:G01D5/353, G01B11/16, G01K11/12, G01K11/32, G01L1/24, G01K7/16
[2017/15]
CPC:
G01K11/3206 (EP,US); G01B11/18 (EP,US); G01D5/35303 (EP,US);
G01D5/35316 (EP); G01D5/35354 (EP); G01L1/246 (EP,US);
G01K2007/166 (EP,US) (-)
Former IPC [2010/12]G01D5/353, G01B11/16, G01K11/12
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2010/12]
TitleGerman:VORRICHTUNG ZUM MESSUNG EINER PHYSICALISCHEN GRÖSSE MITTELS REFLECTIONSMESSUNG EINES OPTISCHER FREQUENZBANDES UND VERFAHREN ZUR TEMPERATUR-UND ZUR DEHNUNGSMESSUNG ANHAND DIESER VORRICHTUNG[2010/12]
English:PHYSICAL QUANTITY MEASURING DEVICE OF OPTICAL FREQUENCY RANGE REFLECTION MEASURING TYPE, AND TEMPERATURE AND STRAIN MEASURING METHOD USING THE DEVICE[2010/12]
French:DISPOSITIF DE MESURE D'UNE QUANTITÉ PHYSIQUE PAR MESURE DE LA RÉFLEXION DE LA GAMME DE FRÉQUENCE OPTIQUE ET PROCÉDÉ DE MESURE DE LA TEMPÉRATURE ET DES CONTRAINTES À L'AIDE DUDIT DISPOSITIF[2010/12]
Entry into regional phase09.02.2010Translation filed 
09.02.2010National basic fee paid 
09.02.2010Search fee paid 
09.02.2010Designation fee(s) paid 
09.02.2010Examination fee paid 
Examination procedure09.02.2010Examination requested  [2010/12]
06.10.2017Amendment by applicant (claims and/or description)
03.05.2018Despatch of a communication from the examining division (Time limit: M04)
10.08.2018Reply to a communication from the examining division
18.07.2019Despatch of a communication from the examining division (Time limit: M04)
29.11.2019Application deemed to be withdrawn, date of legal effect  [2020/31]
07.01.2020Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2020/31]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  03.05.2018
Fees paidRenewal fee
13.01.2011Renewal fee patent year 03
30.01.2012Renewal fee patent year 04
23.01.2013Renewal fee patent year 05
06.02.2014Renewal fee patent year 06
19.01.2015Renewal fee patent year 07
14.01.2016Renewal fee patent year 08
13.01.2017Renewal fee patent year 09
23.01.2018Renewal fee patent year 10
25.01.2019Renewal fee patent year 11
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XY]US2003142319  (RONNEKLEIV ERLEND [NO], et al) [X] 1,2,4,6,8,11 * paragraphs [0065] - [0074]; figures 1a, 4a * [Y] 3,5,7;
 [XY]WO2007149230  (LUNA INNOVATIONS INC [US], et al) [X] 9,10 * abstract * * paragraphs [0003] , [0 12] , [0 14] , [0 15] , [0 44] - [0048] * [Y] 3
 [Y]  - QINRONG YU ET AL, "Simultaneous strain and temperature measurement in PM fibers using Brillouin frequency, power, and bandwidth", PROCEEDINGS OF SPIE, (20040729), vol. 5391, doi:10.1117/12.539986, ISSN 0277-786X, pages 301 - 307, XP055058465 [Y] 5,7 * the whole document *

DOI:   http://dx.doi.org/10.1117/12.539986
International search[A]WO2005015149  (BUSSAN NANOTECH RES INST INC [JP], et al);
 [A]JP2004205368  (NAT AEROSPACE LAB, et al);
 [A]JPH1164119  (FUJIKURA LTD);
 [A]JP2005147900  (JAPAN AEROSPACE EXPLORATION, et al)
by applicantJP2008051344
 JP2008051345
 JP2008311286
 JP2008311287
 JP3740500B
 JP3819119B
 JP4102291B
    - H. IGAWA; H. MURAYAMA; T. KASAI; 1. YAMAGUCHI; K. KAGEYAMA; K. OHTA, "Measurement of strain distributions with long gauge FBG sensor using optical frequency domain reflectometry", PROCEEDINGS OFS-17, (2005), pages 547 - 550
    - B. CHILDERS; M. E. FROGGATT; S. G. ALLISON; T. C. MOORE; D. A. HARE; C. F. BATTEN; D. C. JEGLEY, "Use of 3000 Bragg grating strain sensors distributed on four eight-meter optical fibers during static load test of a composite structure", PROCEEDINGS SPIE'S 8TH INTERNATIONAL SYMPOSIUM ON SMART STRUCTURE AND MATERIALS, (2001), vol. 4332, pages 133 - 142, XP055137874
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.