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Extract from the Register of European Patents

EP About this file: EP2294389

EP2294389 - METHOD AND DEVICE FOR QUANTIFYING SURFACE PARTICULATE CONTAMINANTS [Right-click to bookmark this link]
Former [2011/11]METHOD AND DEVICE FOR QUANTIFYING SURFACE PARTICULATE CONTAMINANTS BY IMPROVED ANALYSIS
[2014/20]
StatusNo opposition filed within time limit
Status updated on  21.08.2015
Database last updated on 15.06.2024
Most recent event   Tooltip22.06.2018Lapse of the patent in a contracting state
New state(s): MK		published on 25.07.2018  [2018/30]
Applicant(s)For all designated states
Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Bâtiment "Le Ponant D" 25, rue Leblanc
75015 Paris / FR
[2011/11]
Former [2011/11]For all designated states
Commissariat à l'énergie atomique et aux énergies alternatives
Bâtiment "Le Ponant D" 25, rue Leblanc
75015 Paris / FR
Inventor(s)01 / TOVENA-PECAULT, Isabelle
24 chemin de l'Hermitage
F-33850 Leognan / FR
 [2011/11]
Representative(s)Ilgart, Jean-Christophe
BREVALEX
95, Rue d'Amsterdam
75378 Paris Cedex 8 / FR
[N/P]
Former [2014/42]Ilgart, Jean-Christophe
BREVALEX
95, rue d'Amsterdam
75378 Paris Cedex 8 / FR
Former [2011/11]Ilgart, Jean-Christophe
BREVALEX 95 rue d'Amsterdam
75378 Paris Cedex 8 / FR
Former [2011/11]Ilgart, Jean-Christophe
BREVALEX 3, rue du Docteur Lancereaux
75008 Paris / FR
Application number, filing date09779933.224.06.2009
[2011/11]
WO2009EP57931
Priority number, dateFR2008005426126.06.2008         Original published format: FR 0854261
[2011/11]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report
No.:WO2010003825
Date:14.01.2010
Language:FR
[2010/02]
Type: A1 Application with search report 
No.:EP2294389
Date:16.03.2011
Language:FR
The application published by WIPO in one of the EPO official languages on 14.01.2010 takes the place of the publication of the European patent application.
[2011/11]
Type: B1 Patent specification 
No.:EP2294389
Date:15.10.2014
Language:FR
[2014/42]
Search report(s)International search report - published on:EP14.01.2010
ClassificationIPC:G01N21/94, G06T7/00, G01N15/14
[2014/20]
CPC:
G01N21/94 (EP,US); G01N15/1433 (EP,US); G06T7/001 (EP,US);
G01N2001/028 (EP,US); G01N2015/1486 (EP,US); G01N2021/8822 (EP,US);
G01N21/8851 (EP,US); G06T2207/30108 (EP,US) (-)
Former IPC [2011/11]G01N21/94, G01N21/53, G01N1/24, G01N15/06, G06T7/00, B07C5/04
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2011/11]
TitleGerman:VERFAHREN UND VORRICHTUNG ZUR QUANTIFIZIERUNG PARTIKELFÖRMIGER OBERFLÄCHENVERUNREINIGUNGEN[2014/20]
English:METHOD AND DEVICE FOR QUANTIFYING SURFACE PARTICULATE CONTAMINANTS[2014/20]
French:PROCÉDÉ ET DISPOSITIF DE QUANTIFICATION DES CONTAMINANTS PARTICULAIRES DE SURFACE[2014/21]
Former [2011/11]VERFAHREN UND VORRICHTUNG ZUR QUANTIFIZIERUNG PARTIKELFÖRMIGER OBERFLÄCHENVERUNREINIGUNGEN DURCH VERBESSERTE ANALYSE
Former [2011/11]METHOD AND DEVICE FOR QUANTIFYING SURFACE PARTICULATE CONTAMINANTS BY IMPROVED ANALYSIS
Former [2011/11]PROCÈDE ET DISPOSITIF DE QUANTIFICATION DES CONTAMINANT PARTICULAIRES DE SURFACE PAR ANALYSE AMÉLIORÉE
Entry into regional phase21.12.2010National basic fee paid 
21.12.2010Designation fee(s) paid 
21.12.2010Examination fee paid 
Examination procedure21.12.2010Examination requested  [2011/11]
19.05.2014Communication of intention to grant the patent
04.09.2014Fee for grant paid
04.09.2014Fee for publishing/printing paid
04.09.2014Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  19.05.2014
Opposition(s)16.07.2015No opposition filed within time limit [2015/39]
Fees paidRenewal fee
22.06.2011Renewal fee patent year 03
21.05.2012Renewal fee patent year 04
29.05.2013Renewal fee patent year 05
31.03.2014Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU24.06.2009
AT15.10.2014
BG15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
IT15.10.2014
LT15.10.2014
LV15.10.2014
MC15.10.2014
MK15.10.2014
MT15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
SI15.10.2014
SK15.10.2014
TR15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
IE24.06.2015
LU24.06.2015
BE30.06.2015
CH30.06.2015
LI30.06.2015
[2018/30]
Former [2017/39]HU24.06.2009
AT15.10.2014
BG15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
IT15.10.2014
LT15.10.2014
LV15.10.2014
MC15.10.2014
MT15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
SI15.10.2014
SK15.10.2014
TR15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
IE24.06.2015
LU24.06.2015
BE30.06.2015
CH30.06.2015
LI30.06.2015
Former [2017/03]AT15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
IT15.10.2014
LT15.10.2014
LV15.10.2014
MC15.10.2014
MT15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
SI15.10.2014
SK15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
IE24.06.2015
LU24.06.2015
CH30.06.2015
LI30.06.2015
Former [2016/22]AT15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
IT15.10.2014
LT15.10.2014
LV15.10.2014
MC15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
SI15.10.2014
SK15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
IE24.06.2015
LU24.06.2015
CH30.06.2015
LI30.06.2015
Former [2016/20]AT15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
IT15.10.2014
LT15.10.2014
LV15.10.2014
MC15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
SI15.10.2014
SK15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
IE24.06.2015
LU24.06.2015
Former [2016/11]AT15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
IT15.10.2014
LT15.10.2014
LV15.10.2014
MC15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
SI15.10.2014
SK15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
LU24.06.2015
Former [2016/09]AT15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
IT15.10.2014
LT15.10.2014
LV15.10.2014
MC15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
SK15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
Former [2015/37]AT15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
IT15.10.2014
LT15.10.2014
LV15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
SK15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
Former [2015/36]AT15.10.2014
CY15.10.2014
CZ15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
LT15.10.2014
LV15.10.2014
NL15.10.2014
PL15.10.2014
RO15.10.2014
SE15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
Former [2015/35]AT15.10.2014
CY15.10.2014
DK15.10.2014
EE15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
LT15.10.2014
LV15.10.2014
NL15.10.2014
PL15.10.2014
SE15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
Former [2015/26]AT15.10.2014
CY15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
LT15.10.2014
LV15.10.2014
NL15.10.2014
PL15.10.2014
SE15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
Former [2015/25]AT15.10.2014
ES15.10.2014
FI15.10.2014
HR15.10.2014
LT15.10.2014
LV15.10.2014
NL15.10.2014
PL15.10.2014
SE15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
Former [2015/24]ES15.10.2014
FI15.10.2014
HR15.10.2014
LT15.10.2014
LV15.10.2014
NL15.10.2014
PL15.10.2014
SE15.10.2014
NO15.01.2015
GR16.01.2015
IS15.02.2015
PT16.02.2015
Former [2015/23]ES15.10.2014
FI15.10.2014
LT15.10.2014
NL15.10.2014
NO15.01.2015
IS15.02.2015
PT16.02.2015
Former [2015/22]LT15.10.2014
NL15.10.2014
NO15.01.2015
PT16.02.2015
Former [2015/21]LT15.10.2014
NL15.10.2014
NO15.01.2015
Former [2015/20]LT15.10.2014
NL15.10.2014
Former [2015/16]NL15.10.2014
Cited inInternational search[A]US3362141  (ROYSTER JR GEORGE W, et al) [A] 4,7 * the whole document *;
 [A]EP0265229  (INSPEX INC [US]) [A] 1,6,12 * abstract *;
 [DA]US5253538  (SWICK ROBERT H [US], et al) [DA] 1,6,12* the whole document *;
 [A]US5493123  (KNOLLENBERG ROBERT G [US], et al) [A] 1,5,6,8,12 * abrégé; figures 1B, 4, 8 *;
 [A]US7010991  (LUTZ DONALD G [US], et al) [A] 1,4,6,7,10-12 * abrégé; col. 3, l. 63 à col. 5, l. 25; figures 2A, 2B, 4 *;
 [A]  - SHAW W P, SOPHER R P, "High Speed Automatic Particle Counter. February 1975.", IBM TECHNICAL DISCLOSURE BULLETIN, New York, US, (19750201), vol. 17, no. 9, page 2588, XP002514852 [A] 1,6,12 * the whole document *
 [A]  - BHARAT BHUSHAN ET AL, "Detection and Sizing of Particulate Contamination in Rigid Disk Drives: Instruments and Sampling Techniques", IEEE TRANSACTIONS ON MAGNETICS, IEEE SERVICE CENTER, NEW YORK, NY, US, (19990301), vol. 35, no. 2, ISSN 0018-9464, pages 956 - 962, XP011032217 [A] 1,6,12 * the whole document *

DOI:   http://dx.doi.org/10.1109/20.753815
 [A]  - GERMER T A ET AL, "Particle Size Metrology: Comparison Between Aerosol Electrical Mobility and Laser Surface Light Scattering Techniques", AIP CONFERENCE PROCEEDINGS, AMERICAN INSTITUTE OF PHYSICS, NEW YORK,NY, (20050315), vol. 788, ISSN 0094-243X, pages 579 - 583, XP007907196 [A] 1,6,12 * the whole document *

DOI:   http://dx.doi.org/10.1063/1.2063021
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