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Extract from the Register of European Patents

EP About this file: EP2230042

EP2230042 - Laser processing method [Right-click to bookmark this link]
Former [2010/38]Laser processing method and semiconductor device
[2017/20]
StatusNo opposition filed within time limit
Status updated on  31.08.2018
Database last updated on 27.07.2024
FormerThe patent has been granted
Status updated on  22.09.2017
FormerGrant of patent is intended
Status updated on  09.05.2017
FormerExamination is in progress
Status updated on  16.01.2017
Most recent event   Tooltip31.08.2018No opposition filed within time limitpublished on 03.10.2018  [2018/40]
Applicant(s)For all designated states
Hamamatsu Photonics K.K.
1126-1, Ichino-cho
Higashi-ku
Hamamatsu-shi, Shizuoka 435-8558 / JP
[2017/43]
Former [2010/38]For all designated states
Hamamatsu Photonics K.K.
1126-1 Ichino-cho, Hamamatsu-shi
Shizuoka 435-8558 / JP
Inventor(s)01 / Kuno, Koji
c/o Hamamatsu Photonics K.K.
1126-1, Ichino-cho
Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
02 / Suzuki, Tatsuya
c/o Hamamatsu Photonics K.K.
1126-1, Ichino-cho
Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
03 / Sakamoto, Takeshi
c/o Hamamatsu Photonics K.K.
1126-1, Ichino-cho
Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
 [2017/43]
Former [2010/38]01 / Kuno, Koji
c/o Hamamatsu Photonics K.K. 1126-1 Ichino-cho Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
02 / Suzuki, Tatsuya
c/o Hamamatsu Photonics K.K. 1126-1 Ichino-cho Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
03 / Sakamoto, Takeshi
c/o Hamamatsu Photonics K.K. 1126-1 Ichino-cho Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstraße 4
80802 München / DE
[2017/43]
Former [2010/38]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Leopoldstrasse 4
80802 München / DE
Application number, filing date10006971.527.07.2005
[2010/38]
Priority number, dateJP2004023155506.08.2004         Original published format: JP 2004231555
[2010/38]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP2230042
Date:22.09.2010
Language:EN
[2010/38]
Type: A3 Search report 
No.:EP2230042
Date:13.08.2014
Language:EN
[2014/33]
Type: B1 Patent specification 
No.:EP2230042
Date:25.10.2017
Language:EN
[2017/43]
Search report(s)(Supplementary) European search report - dispatched on:EP15.07.2014
ClassificationIPC:B23K26/40, B28D5/00, // B23K101/40
[2010/38]
CPC:
B28D1/221 (EP,KR,US); B23K26/53 (EP,KR,US); H01L23/562 (KR,US);
B23K26/0622 (EP,KR,US); B23K26/40 (EP,KR,US); B28D5/0011 (EP,KR,US);
C03B33/0222 (EP,KR,US); B23K2101/40 (EP,KR,US); B23K2103/172 (EP,KR,US);
B23K2103/50 (EP,KR,US); H01L2924/0002 (EP,KR,US) (-)
C-Set:
H01L2924/0002, H01L2924/00 (EP,US)
Designated contracting statesDE,   FR,   GB,   NL [2017/43]
Former [2010/38]DE,  FR,  GB,  NL 
TitleGerman:Laserbearbeitungsverfahren[2017/23]
English:Laser processing method[2017/20]
French:Procédé de traitement laser[2017/20]
Former [2010/38]Laserbearbeitungsverfahren und halbleiterbauelement
Former [2010/38]Laser processing method and semiconductor device
Former [2010/38]Procédé de traitement laser et dispositif semi-conducteur
Examination procedure06.07.2010Examination requested  [2010/38]
10.02.2015Amendment by applicant (claims and/or description)
22.10.2015Despatch of a communication from the examining division (Time limit: M06)
02.05.2016Reply to a communication from the examining division
12.09.2016Despatch of a communication from the examining division (Time limit: M06)
20.03.2017Reply to a communication from the examining division
10.05.2017Communication of intention to grant the patent
12.09.2017Fee for grant paid
12.09.2017Fee for publishing/printing paid
12.09.2017Receipt of the translation of the claim(s)
Parent application(s)   TooltipEP05767042.4  / EP1775059
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued (EP20050767042) is  23.10.2009
Opposition(s)26.07.2018No opposition filed within time limit [2018/40]
Fees paidRenewal fee
06.07.2010Renewal fee patent year 03
06.07.2010Renewal fee patent year 04
06.07.2010Renewal fee patent year 05
06.07.2010Renewal fee patent year 06
28.07.2011Renewal fee patent year 07
27.07.2012Renewal fee patent year 08
30.07.2013Renewal fee patent year 09
29.07.2014Renewal fee patent year 10
28.07.2015Renewal fee patent year 11
27.07.2016Renewal fee patent year 12
12.07.2017Renewal fee patent year 13
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipNL25.10.2017
[2018/17]
Documents cited:Search[XA]JPH0737559  (MATSUSHITA ELECTRIC IND CO LTD) [X] 4 * the whole document *[A] 1;
 [XAY]EP1338371  (HAMAMATSU PHOTONICS KK [JP]) [X] 4 * the whole document * [A] 3 [Y] 2;
 [XY]JP2003334675  (HAMAMATSU PHOTONICS KK) [X] 1,4 * the whole document * [Y] 2;
 [X]JP2003338636  (HAMAMATSU PHOTONICS KK) [X] 1,4 * the whole document *;
 [XA]JP2004001076  (HAMAMATSU PHOTONICS KK) [X] 4 * the whole document * [A] 1
by applicantJPS59212185
    - "Internal Marking of Glass Substrate with Solid-state Laser", PROCEEDINGS OF THE 45TH LASER MATERIALS PROCESSING CONFERENCE, (199812), pages 23 - 28
    - "Silicon Processing Characteristic Evaluation by Picosecond Pulse Laser", PREPRINTS OF THE NATIONAL MEETINGS OF JAPAN WELDING SOCIETY, (200004), vol. 66, pages 72 - 73
    - "Forming of Photoinduced Structure within Glass by Femtosecond Laser Irradiation", PROCEEDINGS OF THE 42ND LASER MATERIALS PROCESSING CONFERENCE, (199711), pages 105 - 111
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.