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Extract from the Register of European Patents

EP About this file: EP2275792

EP2275792 - Sensor failure or abnormality detecting system [Right-click to bookmark this link]
Former [2011/03]Sensor failure or abnormality detecting system incorporated in a physical or dynamic quantity detecting apparatus
[2011/42]
StatusNo opposition filed within time limit
Status updated on  01.02.2013
Database last updated on 26.06.2024
Most recent event   Tooltip30.08.2013Lapse of the patent in a contracting statepublished on 02.10.2013  [2013/40]
Applicant(s)For all designated states
Denso Corporation
1-1, Showa-cho
Kariya-city
Aichi 448-8661 / JP
[N/P]
Former [2011/03]For all designated states
Denso Corporation
1-1, Showa-cho Kariya-city
Aichi 448-8661 / JP
Inventor(s)01 / Tanaka, Hiroaki
c/o DENSO CORPORATION
Intellectual Property Department
1-1, Showa-cho
Kariya-city Aichi 448-0029 / JP
02 / Toyoda, Inao
c/o DENSO CORPORATION
Intellectual Property Department
1-1, Showa-cho
Kariya-city Aichi 448-0029 / JP
 [2012/13]
Former [2011/03]01 / Tanaka, Hiroaki
c/o DENSO CORPORATION Intellectual Property Department 1-1, Showa-cho
Kariya-city Aichi 448-0029 / JP
02 / Toyoda, Inao
c/o DENSO CORPORATION Intellectual Property Department 1-1, Showa-cho
Kariya-city Aichi 448-0029 / JP
Representative(s)Winter, Brandl - Partnerschaft mbB
Alois-Steinecker-Straße 22
85354 Freising / DE
[N/P]
Former [2012/13]Winter, Brandl, Fürniss, Hübner, Röss, Kaiser, Polte - Partnerschaft
Alois-Steinecker-Strasse 22
85354 Freising / DE
Former [2011/03]Winter, Brandl, Fürniss, Hübner, Röss, Kaiser, Polte - Partnerschaft
Alois-Steinecker-Strasse 22
85354 Freising / DE
Application number, filing date10185385.122.09.2000
[2011/03]
Priority number, dateJP1999027044424.09.1999         Original published format: JP 27044499
JP2000001781921.01.2000         Original published format: JP 2000017819
JP2000001781821.01.2000         Original published format: JP 2000017818
JP2000012825527.04.2000         Original published format: JP 2000128255
JP2000022923628.07.2000         Original published format: JP 2000229236
JP2000022899828.07.2000         Original published format: JP 2000228998
JP2000022900728.07.2000         Original published format: JP 2000229007
JP2000022900028.07.2000         Original published format: JP 2000229000
JP2000023164931.07.2000         Original published format: JP 2000231649
JP1999029124113.10.1999         Original published format: JP 29124199
JP1999036645824.12.1999         Original published format: JP 36645899
[2011/03]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP2275792
Date:19.01.2011
Language:EN
[2011/03]
Type: B1 Patent specification 
No.:EP2275792
Date:28.03.2012
Language:EN
[2012/13]
Search report(s)(Supplementary) European search report - dispatched on:EP13.12.2010
ClassificationIPC:G01L9/00, G01L9/02, G01L27/00
[2011/42]
CPC:
G01L27/007 (EP,US); G01D3/08 (EP,US); G01L9/0054 (EP,US);
G01L9/02 (EP,US); G01R17/10 (EP,US)
Former IPC [2011/03]G01L9/04, G01L9/02, G01D3/08, G01L9/06, G01R17/10, G01L1/22
Designated contracting statesDE,   FR [2011/03]
TitleGerman:System zum Bestimmen von Fehlern oder Abnormalitäten eines Messfühlers[2011/42]
English:Sensor failure or abnormality detecting system[2011/42]
French:Système pour détecter de défauts ou des anomalies dans un capteur[2011/42]
Former [2011/03]System zum Bestimmen von Fehlern oder Abnormalitäten eines Messfühlers, eingebaut in ein Gerät zur Messung einer physikalischen oder dynamischen Grösse
Former [2011/03]Sensor failure or abnormality detecting system incorporated in a physical or dynamic quantity detecting apparatus
Former [2011/03]Système pour détecter de défauts ou des anomalies dans un capteur incorporé dans un appareil pour détecter une variable physique ou dynamique
Examination procedure16.03.2011Amendment by applicant (claims and/or description)
16.03.2011Examination requested  [2011/17]
06.10.2011Communication of intention to grant the patent
14.02.2012Fee for grant paid
14.02.2012Fee for publishing/printing paid
Parent application(s)   TooltipEP00120774.5  / EP1087219
EP06005301.4  / EP1666862
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued (EP20000120774) is  20.11.2002
Opposition(s)03.01.2013No opposition filed within time limit [2013/10]
Fees paidRenewal fee
03.10.2010Renewal fee patent year 03
03.10.2010Renewal fee patent year 04
03.10.2010Renewal fee patent year 05
03.10.2010Renewal fee patent year 06
03.10.2010Renewal fee patent year 07
03.10.2010Renewal fee patent year 08
03.10.2010Renewal fee patent year 09
03.10.2010Renewal fee patent year 10
03.10.2010Renewal fee patent year 11
29.09.2011Renewal fee patent year 12
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Lapses during opposition  TooltipFR01.10.2012
[2013/40]
Documents cited:Search[A]DE3508610  (SCHMIEDER LOTHAR DIPL PHYS DR) [A] 1 * page 7, line 1 - page 8, line 26; figure 4 *;
 [A]US4446527  (RUNYAN WESLEY G [US]) [A] 1 * abstract *;
 [A]DE19728381  (BOSCH GMBH ROBERT [DE]) [A] 1 * column 3, line 47 - column 4, line 23 *
by applicantWO9705464
 JPH08247881
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.