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Extract from the Register of European Patents

EP About this file: EP2443658

EP2443658 - METHODS OF MAKING VERTICAL JUNCTION FIELD EFFECT TRANSISTORS WITHOUT ION IMPLANTATION AND DEVICES MADE THEREWITH [Right-click to bookmark this link]
Former [2012/17]METHODS OF MAKING VERTICAL JUNCTION FIELD EFFECT TRANSISTORS AND BIPOLAR JUNCTION TRANSISTORS WITHOUT ION IMPLANTATION AND DEVICES MADE THEREWITH
[2015/22]
StatusThe application is deemed to be withdrawn
Status updated on  12.02.2016
Database last updated on 05.10.2024
Most recent event   Tooltip12.02.2016Application deemed to be withdrawnpublished on 16.03.2016  [2016/11]
Applicant(s)For all designated states
Power Integrations, Inc.
5245 Hellyer Avenue
San Jose, CA 95138 / US
[2013/44]
Former [2012/17]For all designated states
SS SC IP, LLC
1401 Livingston Lane
Jackson, MS 39213 / US
Inventor(s)01 / CHENG, Lin
c/o SemiSouth Laboratories Inc.
201 Research Blvd.
Starkville, Mississippi 39759 / US
 [2012/17]
Representative(s)Clark, Jane Anne, et al
Mathys & Squire The Shard
32 London Bridge Street
London SE1 9SG / GB
[N/P]
Former [2012/17]Clark, Jane Anne, et al
Mathys & Squire LLP 120 Holborn
London EC1N 2SQ / GB
Application number, filing date10790237.118.06.2010
WO2010US39114
Priority number, dateUS20090218751P19.06.2009         Original published format: US 218751 P
[2012/17]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2010148271
Date:23.12.2010
Language:EN
[2010/51]
Type: A2 Application without search report 
No.:EP2443658
Date:25.04.2012
Language:EN
The application published by WIPO in one of the EPO official languages on 23.12.2010 takes the place of the publication of the European patent application.
[2012/17]
Search report(s)International search report - published on:KR24.02.2011
(Supplementary) European search report - dispatched on:EP05.07.2013
ClassificationIPC:H01L21/337, H01L29/808, H01L29/10, // H01L29/732, H01L29/24, H01L29/20
[2015/22]
CPC:
H01L29/8083 (EP,US); H01L21/18 (KR); H01L29/1004 (EP,US);
H01L29/1066 (EP,US); H01L29/66068 (EP,US); H01L29/6631 (EP,US);
H01L29/66924 (EP,US); H01L29/73 (KR); H01L29/732 (EP,US);
H01L29/1608 (EP,US); H01L29/2003 (EP,US) (-)
Former IPC [2013/32]H01L21/337, H01L29/808, H01L29/10, // H01L29/732
Former IPC [2012/17]H01L29/73, H01L21/311, H01L29/732
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   SM,   TR [2012/17]
TitleGerman:VERFAHREN ZUR HESTELLUNG VON SPERRSCHICHT-FELDEFFEKTTRANSISTOREN OHNE IONENIMPLANTATION UND VORRICHTUNGEN DARAUS[2015/22]
English:METHODS OF MAKING VERTICAL JUNCTION FIELD EFFECT TRANSISTORS WITHOUT ION IMPLANTATION AND DEVICES MADE THEREWITH[2015/22]
French:PROCÉDÉS DE FABRICATION DE TRANSISTORS VERTICALS À EFFET DE CHAMP À JONCTION SANS IMPLANTATION D'IONS ET DISPOSITIFS FABRIQUÉS À PARTIR DE CEUX-CI[2015/22]
Former [2012/17]VERFAHREN ZUR HESTELLUNG VON FELDEFFEKTTRANSISTOREN MIT VERTIKALEM ANSCHLUSS UND BIPOLARE ANSCHLUSSTRANSISTOREN OHNE IONENIMPLANTATION UND VORRICHTUNGEN DARAUS
Former [2012/17]METHODS OF MAKING VERTICAL JUNCTION FIELD EFFECT TRANSISTORS AND BIPOLAR JUNCTION TRANSISTORS WITHOUT ION IMPLANTATION AND DEVICES MADE THEREWITH
Former [2012/17]PROCÉDÉS DE FABRICATION DE TRANSISTORS À EFFET DE CHAMP À JONCTION VERTICALE ET DE TRANSISTORS À JONCTION BIPOLAIRES SANS IMPLANTATION D'IONS ET DISPOSITIFS FABRIQUÉS À PARTIR DE CEUX-CI
Entry into regional phase04.01.2012National basic fee paid 
04.01.2012Search fee paid 
04.01.2012Designation fee(s) paid 
04.01.2012Examination fee paid 
Examination procedure04.01.2012Examination requested  [2012/17]
03.02.2014Amendment by applicant (claims and/or description)
12.05.2015Communication of intention to grant the patent
23.09.2015Application deemed to be withdrawn, date of legal effect  [2016/11]
27.10.2015Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2016/11]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  12.05.2015
Fees paidRenewal fee
14.06.2012Renewal fee patent year 03
25.06.2013Renewal fee patent year 04
30.06.2014Renewal fee patent year 05
Penalty fee
Additional fee for renewal fee
30.06.201506   M06   Not yet paid
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Documents cited:Search[I]JP2003069041  (DENSO CORP) [I] 11-15 * figures 1-3 *;
 [A]JP2003273358  (DENSO CORP) [A] 1-15 * the whole document *;
 [A]JP2008091934  (DENSO CORP) [A] 1-15* the whole document *
International search[A]US6278143  (EJIRI HIROKAZU [JP]);
 [A]WO2007018578  (SEMISOUTH LAB INC [US], et al);
 [A]KR20070062969  (SEMISOUTH LAB INC [US], et al)
by applicantJP2003069041
 JP2003273358
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.