EP2525392 - METHOD OF FORMING METAL OXIDE THIN FILM PATTERN USING NANOIMPRINT AND MANUFACTURING METHOD OF LED ELEMENT USING SAME [Right-click to bookmark this link] | |||
Former [2012/47] | METHOD FOR FORMING METAL OXIDE THIN FILM PATTERN USING NANOIMPRINT AND MANUFACTURING METHOD OF LED ELEMENT USING SAME | ||
[2018/44] | Status | No opposition filed within time limit Status updated on 24.01.2020 Database last updated on 06.07.2024 | |
Former | The patent has been granted Status updated on 15.02.2019 | ||
Former | Grant of patent is intended Status updated on 09.10.2018 | ||
Former | Examination is in progress Status updated on 09.03.2018 | Most recent event Tooltip | 08.07.2022 | Lapse of the patent in a contracting state New state(s): MK | published on 10.08.2022 [2022/32] | Applicant(s) | For all designated states Korea Institute Of Machinery & Materials 171, Jang-dong Yuseong-gu Daejeon 305-343 / KR | [2012/47] | Inventor(s) | 01 /
Park, Hyeong Ho 301, 544-6 Guam-dong Yuseong-gu Daejeon 305-800 / KR | 02 /
Jeong, Jun Ho 202-1505 Yeolmae Maeul 2 Danji Jijok-dong Yuseong-gu Daejeon 305-330 / KR | 03 /
Kim, Ki Don 9-110 Miseong Apt. 17-6 Sincheon-dong Songpa-gu Seoul 138-240 / KR | 04 /
Choi, Dae Geun 501-1303 Songnim 5 Danji Hagi-dong Yuseong-gu Daejeon 305-759 / KR | 05 /
Choi, Jun Hyuk 106-306 Hanbit Apt. 99 Eoeun-dong Yuseong-gu Daejeon 305-755 / KR | 06 /
Lee, Ji Hye 105-804 Sejong Apt. Jeonmin-dong Yuseong-gu Daejeon 305-728 / KR | 07 /
Lee, Soon Won 101, 140-23 Sinseong-dong Yuseong-gu Daejeon 305-804 / KR | [2012/47] | Representative(s) | Delorme, Nicolas Cabinet Germain & Maureau BP 6153 69466 Lyon Cedex 06 / FR | [2012/47] | Application number, filing date | 10843242.8 | 26.01.2010 | [2019/12] | WO2010KR00472 | Priority number, date | KR20100003109 | 13.01.2010 Original published format: KR 20100003109 | [2012/47] | Filing language | KO | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2011087176 | Date: | 21.07.2011 | Language: | KO | [2011/29] | Type: | A1 Application with search report | No.: | EP2525392 | Date: | 21.11.2012 | Language: | EN | [2012/47] | Type: | B1 Patent specification | No.: | EP2525392 | Date: | 20.03.2019 | Language: | EN | [2019/12] | Search report(s) | International search report - published on: | KR | 21.07.2011 | (Supplementary) European search report - dispatched on: | EP | 01.02.2016 | Classification | IPC: | H01L21/027, H01L33/22, H01L33/42 | [2016/09] | CPC: |
H01L33/42 (EP,KR,US);
G03F7/0002 (KR);
B29C59/022 (KR);
B82Y40/00 (KR);
H01L2924/0002 (EP,KR,US);
H01L2933/0016 (EP,KR,US);
Y10T428/24802 (EP,US)
(-)
| C-Set: |
H01L2924/0002, H01L2924/00 (EP,US)
|
Former IPC [2012/47] | H01L21/027, H01L33/22 | Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR [2012/47] | Extension states | AL | Not yet paid | BA | Not yet paid | RS | Not yet paid | Title | German: | VERFAHREN ZUR FORMUNG EINER METALLOXID-DÜNNSCHICHTSTRUKTUR DURCH NANOPRÄGUNG UND HERSTELLUNGSVERFAHREN FÜR EIN LED-ELEMENT DAMIT | [2012/47] | English: | METHOD OF FORMING METAL OXIDE THIN FILM PATTERN USING NANOIMPRINT AND MANUFACTURING METHOD OF LED ELEMENT USING SAME | [2018/44] | French: | PROCÉDÉ DE FORMER UN MOTIF DE COUCHE MINCE D'OXYDE MÉTALLIQUE AU MOYEN D'UNE NANO-IMPRESSION ET PROCÉDÉ DE PRODUCTION D'UN ÉLÉMENT DE DEL AU MOYEN DUDIT PROCÉDÉ | [2018/44] |
Former [2012/47] | METHOD FOR FORMING METAL OXIDE THIN FILM PATTERN USING NANOIMPRINT AND MANUFACTURING METHOD OF LED ELEMENT USING SAME | ||
Former [2012/47] | PROCEDE POUR FORMER UN MOTIF DE COUCHE MINCE D'OXYDE METALLIQUE AU MOYEN D'UNE NANO-IMPRESSION ET PROCEDE DE PRODUCTION D'UN ELEMENT DE DEL AU MOYEN DUDIT PROCEDE | Entry into regional phase | 29.06.2012 | Translation filed | 29.06.2012 | National basic fee paid | 29.06.2012 | Search fee paid | 29.06.2012 | Designation fee(s) paid | 29.06.2012 | Examination fee paid | Examination procedure | 29.06.2012 | Examination requested [2012/47] | 24.08.2016 | Amendment by applicant (claims and/or description) | 08.03.2018 | Despatch of a communication from the examining division (Time limit: M04) | 17.07.2018 | Reply to a communication from the examining division | 10.10.2018 | Communication of intention to grant the patent | 05.02.2019 | Fee for grant paid | 05.02.2019 | Fee for publishing/printing paid | 05.02.2019 | Receipt of the translation of the claim(s) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 08.03.2018 | Opposition(s) | 02.01.2020 | No opposition filed within time limit [2020/09] | Fees paid | Renewal fee | 05.07.2012 | Renewal fee patent year 03 | 10.01.2013 | Renewal fee patent year 04 | 21.01.2014 | Renewal fee patent year 05 | 13.01.2015 | Renewal fee patent year 06 | 11.01.2016 | Renewal fee patent year 07 | 11.01.2017 | Renewal fee patent year 08 | 15.01.2018 | Renewal fee patent year 09 | 15.01.2019 | Renewal fee patent year 10 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | HU | 26.01.2010 | CY | 20.03.2019 | CZ | 20.03.2019 | DK | 20.03.2019 | EE | 20.03.2019 | ES | 20.03.2019 | FI | 20.03.2019 | HR | 20.03.2019 | IT | 20.03.2019 | LT | 20.03.2019 | LV | 20.03.2019 | MC | 20.03.2019 | MK | 20.03.2019 | MT | 20.03.2019 | NL | 20.03.2019 | PL | 20.03.2019 | RO | 20.03.2019 | SI | 20.03.2019 | SK | 20.03.2019 | SM | 20.03.2019 | TR | 20.03.2019 | BG | 20.06.2019 | NO | 20.06.2019 | GR | 21.06.2019 | IS | 20.07.2019 | PT | 20.07.2019 | [2022/32] |
Former [2022/27] | HU | 26.01.2010 | |
CY | 20.03.2019 | ||
CZ | 20.03.2019 | ||
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SM | 20.03.2019 | ||
TR | 20.03.2019 | ||
BG | 20.06.2019 | ||
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GR | 21.06.2019 | ||
IS | 20.07.2019 | ||
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BG | 20.06.2019 | ||
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NO | 20.06.2019 | Documents cited: | Search | [A]US2007065588 (KIHARA NAOKO [JP], et al) [A] 1-15 * claims 1-9 *; | [A]US2009263631 (SAKAMOTO YOSHINORI [JP], et al) [A] 1-15 * claims 13-20 *; | [E]US2011049548 (PARK HYEONG-HO [KR], et al) [E] 1-15* the whole document * | International search | [A]KR20060067875 (INTERNAT TEST & ENGINEERING SE [JP]); | [A]KR20070021876 (LG CHEM. LTD.); | [A]JP2007080455 (TOSHIBA CORP) | Examination | WO2008018936 | US2009184334 | EP2474996 |