-
EP2375217
European procedure
- EP About this file
- EP Legal status
- EP Federated register
- EP Event history
- EP Citations
- EP Patent family
- EP All documents
Extract from the Register of European Patents
EP About this file: EP2375217
| EP2375217 - Aspheric surface measuring apparatus [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 21.09.2012 Database last updated on 03.08.2024 | Most recent event Tooltip | 21.09.2012 | Application deemed to be withdrawn | published on 24.10.2012 [2012/43] | Applicant(s) | For all designated states Fujifilm Corporation 26-30, Nishiazabu 2-chome Minato-ku Tokyo / JP | [N/P] |
| Former [2011/41] | For all designated states Fujifilm Corporation 26-30 Nishiazabu 2-chome Minato-ku Tokyo / JP | Inventor(s) | 01 /
Tomimizu, Masaaki c/o FUJIFILM Corporation 324, Uetake-cho 1-chome Kita-ku, Saitama-shi Saitama / JP | 02 /
Ge, Zongtao c/o FUJIFILM Corporation 324, Uetake-cho 1-chome Kita-ku, Saitama-shi Saitama / JP | 03 /
Iwazaki, Hiroyuki c/o FUJIFILM Corporation 324, Uetake-cho 1-chome Kita-ku, Saitama-shi Saitama / JP | [2011/41] | Representative(s) | Klunker . Schmitt-Nilson . Hirsch Patentanwälte Destouchesstrasse 68 80796 München / DE | [N/P] |
| Former [2011/41] | Klunker . Schmitt-Nilson . Hirsch Patentanwälte Destouchesstrasse 68 80796 München / DE | Application number, filing date | 11160530.9 | 30.03.2011 | [2011/41] | Priority number, date | JP20100083869 | 31.03.2010 Original published format: JP 2010083869 | [2011/41] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP2375217 | Date: | 12.10.2011 | Language: | EN | [2011/41] | Type: | A3 Search report | No.: | EP2375217 | Date: | 02.11.2011 | Language: | EN | [2011/44] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 06.10.2011 | Classification | IPC: | G01B11/24, G01B21/04, G01M11/02 | [2011/41] | CPC: |
G01B11/2441 (EP,US);
G01B21/047 (EP,US);
G01M11/025 (EP,US);
G01M11/0271 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2011/41] | Extension states | BA | Not yet paid | ME | Not yet paid | Title | German: | Asphärische Oberflächen Messvorrichtung | [2011/41] | English: | Aspheric surface measuring apparatus | [2011/41] | French: | Appareil de mesure de surface non sphérique | [2011/41] | Examination procedure | 03.05.2012 | Application deemed to be withdrawn, date of legal effect [2012/43] | 11.06.2012 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [2012/43] |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]JPS63243708 (MATSUSHITA ELECTRIC IND CO LTD) [Y] 3,4 * abstract *; | [Y]US5469259 (GOLBY JOHN A [DE], et al) [Y] 7 * abstract ** column 4 - column 5 *; | [Y]EP1992905 (TNO [NL], et al) [Y] 3,4 * abstract * * paragraph [0039] - paragraph [0052] *; | [XP]EP2228623 (FUJINON CORP [JP]) [XP] 1,6,7 * abstract * * paragraph [0059] - paragraph [0075] *; | [XP]WO2011032572 (ZEISS CARL SMT GMBH [DE], et al) [XP] 1,6 * abstract * * page 24 - page 31 *; | [XAYI] - D.W. DIEHL, C. COTTON, C.J. DITCHMAN, B. STATT, "Transmitted wavefront metrology of hemispheric domes using scanning low-coherence dual-interferometry (SLCDI)", SPIE, PO BOX 10 BELLINGHAM WA 98227-0010 USA, (2007), vol. 6545, pages 65450N-1 - 65450N-10, XP040239694 [X] 1,6 * the whole document * [A] 5 [Y] 3,4,7 [I] 2 | by applicant | JPS62126305 | US6956657 |