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Extract from the Register of European Patents

EP About this file: EP2619936

EP2619936 - METHOD FOR CORRECTING AN ASYMMETRY IN A DELAY [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  12.05.2017
Database last updated on 09.09.2024
FormerExamination is in progress
Status updated on  30.01.2017
Most recent event   Tooltip12.05.2017Application deemed to be withdrawnpublished on 14.06.2017  [2017/24]
Applicant(s)For all designated states
ALCATEL LUCENT
148/152 route de la Reine
92100 Boulogne-Billancourt / FR
[2014/34]
Former [2013/31]For all designated states
Alcatel Lucent
3, avenue Octave Gréard
75007 Paris / FR
Inventor(s)01 / LE PALLEC, Michel
Alcatel Lucent Bell Labs France
Centre de Villarceaux
Route de Villejust
F-91620 Nozay / FR
02 / BUI, Dinh Thai
Alcatel Lucent Bell Labs France
Centre de Villarceaux
Route de Villejust
F-91620 Nozay / FR
 [2013/31]
Representative(s)Croonenbroek, Thomas Jakob, et al
Innovincia
11, avenue des Tilleuls
74200 Thonon-les-Bains / FR
[2014/01]
Former [2013/31]Sciaux, Edmond
Alcatel-Lucent International
32, avenue Kléber
92700 Colombes / FR
Application number, filing date11773098.615.09.2011
WO2011FR52126
Priority number, dateFR2010000372720.09.2010         Original published format: FR 1003727
[2013/31]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report
No.:WO2012038644
Date:29.03.2012
Language:FR
[2012/13]
Type: A1 Application with search report 
No.:EP2619936
Date:31.07.2013
Language:FR
The application published by WIPO in one of the EPO official languages on 29.03.2012 takes the place of the publication of the European patent application.
[2013/31]
Search report(s)International search report - published on:EP29.03.2012
ClassificationIPC:H04J3/06
[2013/31]
CPC:
H04J3/0667 (EP,US); H04J3/06 (KR); H04J3/0635 (US);
H04J14/0226 (EP,US); H04J3/0673 (EP,US); H04L43/0852 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2013/31]
TitleGerman:VERFAHREN ZUR KORREKTUR EINER VERZÖGERUNGSASYMMETRIE[2013/31]
English:METHOD FOR CORRECTING AN ASYMMETRY IN A DELAY[2013/31]
French:PROCEDE DE CORRECTION D'UNE ASYMETRIE DE DELAI[2013/31]
Entry into regional phase22.04.2013National basic fee paid 
22.04.2013Designation fee(s) paid 
22.04.2013Examination fee paid 
Examination procedure22.04.2013Examination requested  [2013/31]
10.10.2013Amendment by applicant (claims and/or description)
25.08.2016Despatch of a communication from the examining division (Time limit: M04)
05.01.2017Application deemed to be withdrawn, date of legal effect  [2017/24]
31.01.2017Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2017/24]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  25.08.2016
Fees paidRenewal fee
20.09.2013Renewal fee patent year 03
26.09.2014Renewal fee patent year 04
25.09.2015Renewal fee patent year 05
22.09.2016Renewal fee patent year 06
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Rights in Rem or Legal Means of Executiondeleted
[2014/47]
Former [2013/40]ID:01
For:AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Date:30.04.2013
[2014/47]
Cited inInternational search[X]  - HAN LI, CHINA MOBILE COMMUNICATIONS CORPORATION ET AL, "Proposal of research on link asymmetry compensation for PTP;C 1064", ITU-T DRAFTS ; STUDY PERIOD 2009-2012, INTERNATIONAL TELECOMMUNICATION UNION, GENEVA ; CH, (20100521), vol. Study Group 15 ; 13/15, pages 1 - 7, XP017447759 [X] 1-16 * the whole document *
 [A]  - IEEE Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control Systems; IEEE Std 1588-2008 (Revision of IEEE Std 1588-2002), IEEE STANDARD; [IEEE STANDARD], IEEE, PISCATAWAY, NJ, USA, PAGES 1, 46, 47, 120-122, (20080724), ISBN 978-0-7381-5400-8, XP002635698 [A] 1-16 * the whole document *
ExaminationEP1802014
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.