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Extract from the Register of European Patents

EP About this file: EP2612366

EP2612366 - FINE LINE METALLIZATION OF PHOTOVOLTAIC DEVICES BY PARTIAL LIFT-OFF OF OPTICAL COATINGS [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  26.10.2018
Database last updated on 26.06.2024
FormerRequest for examination was made
Status updated on  26.06.2018
Most recent event   Tooltip26.10.2018Application deemed to be withdrawnpublished on 28.11.2018  [2018/48]
Applicant(s)For all designated states
Tetrasun, Inc.
20640 Third Street Suite 250A
Saratoga, California 95070 / US
[2013/28]
Inventor(s)01 / SCHULTZ-WITTMANN, Olivier
970 Corte Madera Avenue, Apt. 401
Sunnyvale, California 94085 / US
02 / CRAFTS, Douglas
18760 Blythswood Drive
Los Gatos, California 95030 / US
03 / DECEUSTER, Denis
12 SkyLonda Drive
Woodside, California 94062 / US
04 / TURNER, Adrian
4206E Rickeys Way
Palo Alto, California 94306 / US
 [2013/28]
Representative(s)Friese Goeden Patentanwälte PartGmbB
Widenmayerstraße 49
80538 München / DE
[N/P]
Former [2014/24]Andrae Westendorp
Uhlandstrasse 2
80336 München / DE
Former [2013/28]Friese, Martin, et al
Patentanwälte Andrae Flach Haug Balanstrasse 55
81541 München / DE
Application number, filing date11799603.315.02.2011
WO2011US24857
Priority number, dateUS20100379810P03.09.2010         Original published format: US 379810 P
[2013/28]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2012030407
Date:08.03.2012
Language:EN
[2012/10]
Type: A1 Application with search report 
No.:EP2612366
Date:10.07.2013
Language:EN
The application published by WIPO in one of the EPO official languages on 08.03.2012 takes the place of the publication of the European patent application.
[2013/28]
Search report(s)International search report - published on:KR08.03.2012
(Supplementary) European search report - dispatched on:EP25.10.2017
ClassificationIPC:H01L31/0248, H01L31/18, H01L31/0216, H01L31/0224
[2017/33]
CPC:
H01L31/022425 (EP,CN,KR,US); H01L31/18 (CN); H01L31/02168 (EP,KR,US);
H01L31/022433 (CN); H01L31/022441 (KR); H01L31/02366 (KR);
H01L31/0392 (KR); Y02E10/50 (KR,US); Y02E10/547 (EP) (-)
Former IPC [2013/28]H01L31/0248, H01L31/18
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2013/28]
TitleGerman:FEINMETALLISIERUNG VON PHOTOVOLTAIKVORRICHTUNGEN DURCH PARTIELLE ANHEBUNG OPTISCHER BESCHICHTUNGEN[2013/28]
English:FINE LINE METALLIZATION OF PHOTOVOLTAIC DEVICES BY PARTIAL LIFT-OFF OF OPTICAL COATINGS[2013/28]
French:MÉTALLISATION EN LIGNES FINES DE DISPOSITIFS PHOTOVOLTAÏQUES PAR ENLÈVEMENT PARTIEL DE REVÊTEMENTS OPTIQUES[2013/28]
Entry into regional phase05.01.2012National basic fee paid 
05.01.2012Search fee paid 
05.01.2012Designation fee(s) paid 
05.01.2012Examination fee paid 
Examination procedure05.01.2012Examination requested  [2013/28]
23.05.2018Application deemed to be withdrawn, date of legal effect  [2018/48]
27.06.2018Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2018/48]
Fees paidRenewal fee
27.02.2013Renewal fee patent year 03
27.02.2014Renewal fee patent year 04
26.02.2015Renewal fee patent year 05
26.02.2016Renewal fee patent year 06
27.02.2017Renewal fee patent year 07
27.02.2018Renewal fee patent year 08
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Documents cited:Search[XA]US5181968  (NATH PREM [US], et al) [X] 13 * abstract * * column 8, lines 5-21, 35-53 * * column 9, lines 1-7, 55 - column 10 * [A] 1-5,7-12;
 [XA]US2009293268  (CARMI YOASH [IL]) [X] 13 * abstract * * paragraphs [0015] - [0017] - [0 21] - [0025] - [0 27] , [0 34] * [A] 1-5,7-12
International search[A]JPS56164583  (MITSUBISHI ELECTRIC CORP);
 [A]JP2000058885  (SANYO ELECTRIC CO);
 [A]US7375378  (MANIVANNAN VENKATESAN [US], et al)
by applicantWO2010US31869
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.