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Extract from the Register of European Patents

EP About this file: EP2607327

EP2607327 - A process for providing a semiconductor device using a thick-film composition containing antimony oxide [Right-click to bookmark this link]
Former [2013/26]Thick-film composition containing antimony oxides and their use in the manufacture of semi-conductor devices
[2018/50]
StatusThe application is deemed to be withdrawn
Status updated on  06.09.2019
Database last updated on 02.07.2024
FormerGrant of patent is intended
Status updated on  02.12.2018
FormerExamination is in progress
Status updated on  03.02.2017
Most recent event   Tooltip06.09.2019Application deemed to be withdrawnpublished on 09.10.2019  [2019/41]
Applicant(s)For all designated states
Heraeus Deutschland GmbH & Co. KG
Heraeusstr. 12-14
63450 Hanau / DE
[2015/28]
Former [2013/26]For all designated states
Heraeus Precious Metals GmbH & Co. KG
Heraeusstrasse 12-14
63450 Hanau / DE
Inventor(s)01 / Hörteis, Matthias
Weidenweg 1d
63454 Hanau / DE
02 / Neidert, Michael
Kapellenstrasse 3
63179 Obertshausen / DE
 [2013/26]
Representative(s)Altmann Stößel Dick Patentanwälte PartG mbB
Immermannstrasse 40
40210 Düsseldorf / DE
[N/P]
Former [2013/26]Herzog, Martin
Herzog Fiesser & Partner
Patentanwälte
Immermannstraße 40
40210 Düsseldorf / DE
Application number, filing date12008393.617.12.2012
[2013/26]
Priority number, dateEP2011001019323.12.2011         Original published format: EP 11010193
US201161579818P23.12.2011         Original published format: US 201161579818 P
[2013/26]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP2607327
Date:26.06.2013
Language:EN
[2013/26]
Search report(s)(Supplementary) European search report - dispatched on:EP24.01.2013
ClassificationIPC:C03C8/02, C03C8/04, C03C8/18, C03C8/22, H01L31/0224, H01B1/16, H01B1/22
[2018/50]
CPC:
H01L31/022425 (EP,US); H01L31/042 (KR); C03C8/02 (EP,US);
C03C8/04 (EP,US); C03C8/08 (EP,US); C03C8/16 (EP,US);
C03C8/18 (EP,US); C03C8/22 (EP,US); H01B1/14 (KR);
H01B1/16 (EP,US); H01B1/22 (EP,US); H01L31/0224 (KR);
Y02E10/50 (EP,US); Y02E10/547 (EP) (-)
Former IPC [2013/26]C03C8/02, C03C8/04, C03C8/08, C03C8/18, C03C8/22, C03C8/16
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2013/26]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:Ein Verfahren zum Herstellung einer Halbleiterbauelement unter Verwendung einer Dickfilmzusammensetzung mit Antimonoxid[2018/50]
English:A process for providing a semiconductor device using a thick-film composition containing antimony oxide[2018/50]
French:Procédé de fabrication d'un dispositif semi-conducteur utilisant une composition à film épais contenant de l'oxyde d'antimoine[2018/51]
Former [2013/26]Dickfilmzusammensetzung mit Antimonoxid und ihre Verwendung bei der Herstellung von Halbleiterbauelementen
Former [2013/26]Thick-film composition containing antimony oxides and their use in the manufacture of semi-conductor devices
Former [2013/26]Composition à film épais contenant des oxydes antimoines et leur utilisation pour la fabrication de dispositifs semi-conducteurs
Examination procedure23.12.2013Amendment by applicant (claims and/or description)
23.12.2013Examination requested  [2014/07]
06.02.2017Despatch of a communication from the examining division (Time limit: M06)
16.08.2017Reply to a communication from the examining division
05.11.2018Cancellation of oral proceeding that was planned for 20.11.2018
20.11.2018Date of oral proceedings (cancelled)
03.12.2018Communication of intention to grant the patent
16.04.2019Application deemed to be withdrawn, date of legal effect  [2019/41]
21.05.2019Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2019/41]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  06.02.2017
Fees paidRenewal fee
22.12.2014Renewal fee patent year 03
22.12.2015Renewal fee patent year 04
23.12.2016Renewal fee patent year 05
21.12.2017Renewal fee patent year 06
19.12.2018Renewal fee patent year 07
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Documents cited:Search[XI]US2006001009  (GARREAU-ILES ANGELIQUE GENEVIE [GB], et al) [X] 1-8,10 * paragraphs [0011] , [0016] - [0019] - [0025] , [0030] , [0033] , [0042] , [0043] , [0054] , [0057]; claims 1-9; tables 1,2 * [I] 11-14;
 [XI]US2009189126  (PRUNCHAK ROBERT [US]) [X] 1-3,6-14 * paragraphs [0004] , [0009] , [0010] , [0016] , [0019] , [0021] , [0022] , [0023] - [0005] - [0009] - [0012] - [0042] , [0044] , [0048] , [0050] , [0052] , [0057] , [0060]; claims 1,3,4,8,9,10,19,20 * [I] 4,5;
 [XI]WO2010026952  (NIPPON ELECTRIC GLASS CO [JP], et al) [X] 1-3,5,7,8,10-12 * paragraph [0055]; claims 1,2,5,9-11,13; table - *[I] 4,6,13,14;
 [XI]US2011303883  (ISHIHARA KENTARO [JP]) [X] 1-3,6-8,10-14 * paragraphs [0001] - [0004] - [0014] , [0018] , [0019] , [0 24] , [0030] , [0032] , [0040] , [0042] , [0049] , [0055] , [0056] - [0062] - [0076]; claims 1,2,6,7,12,14; tables 1-3 * [I] 4,5
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.