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Extract from the Register of European Patents

EP About this file: EP2546599

EP2546599 - Deflectometric assembly for surface inspection [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  13.12.2013
Database last updated on 01.10.2024
Most recent event   Tooltip13.12.2013Application deemed to be withdrawnpublished on 15.01.2014  [2014/03]
Applicant(s)For all designated states
Göpel electronic GmbH
Göschwitzer Strasse 58/60
07745 Jena / DE
[2013/03]
Inventor(s)01 / Schambach, Jörg
Wiesenweg 52
07639 Bad Klosterlausnitz / DE
02 / Türk, Andreas
Schleidenstrasse 4
07745 Jena / DE
03 / Hieronymus, Robert
Fritz-Ritter-Strasse 16
07747 Jena / DE
 [2013/03]
Representative(s)Schaller, Renate, et al
Gleim Petri Oehmke
Patent- und Rechtsanwaltspartnerschaft mbB
Neugasse 13
07743 Jena / DE
[N/P]
Former [2013/03]Schaller, Renate, et al
Patentanwälte Oehmke & Kollegen Neugasse 13
07743 Jena / DE
Application number, filing date12174033.628.06.2012
[2013/03]
Priority number, dateDE2011105178112.07.2011         Original published format: DE102011051781
[2013/03]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP2546599
Date:16.01.2013
Language:DE
[2013/03]
Search report(s)(Supplementary) European search report - dispatched on:EP22.10.2012
ClassificationIPC:G01B11/25, G01M11/02, G01N21/55
[2013/03]
CPC:
G01B11/2513 (EP); G01M11/005 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2013/03]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:Deflektometrische Anordnung zur Oberflächeninspektion[2013/03]
English:Deflectometric assembly for surface inspection[2013/03]
French:Système déflectométrique destiné à lýinspection de surfaces[2013/03]
Examination procedure17.07.2013Application deemed to be withdrawn, date of legal effect  [2014/03]
28.08.2013Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2014/03]
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Documents cited:Search[XI]DE102006006876  (DEUTSCH ZENTR LUFT & RAUMFAHRT [DE]) [X] 1,2 * paragraph [0014] - paragraph [0028]; figures 1-3 * [I] 4;
 [XI]DE19545367  (FRAUNHOFER GES FORSCHUNG [DE]) [X] 1,2 * column 8, line 17 - line 41; figure 1a * * column 9, line 47 - column 10, line 17; figure 3 * [I] 4;
 [XI]US2003231793  (CRAMPTON STEPHEN JAMES [GB]) [X] 1,2 * paragraph [0085] - paragraph [0088]; figures 3a,29b * [I] 4
 [XI]  - FORREST A K ET AL, "Single-grid moiré interferometer; Single-grid moiré interferometer", JOURNAL OF OPTICS. A, PURE AND APPLIED OPTICS, INSTITUTE OF PHYSICS PUBLISHING, BRISTOL, GB, (20010901), vol. 3, no. 5, doi:10.1088/1464-4258/3/5/303, ISSN 1464-4258, pages 326 - 332, XP020080781 [X] 1-3 * Abschnitte 1 und 2;;; figures 1,2 * [I] 4

DOI:   http://dx.doi.org/10.1088/1464-4258/3/5/303
by applicantDE10345586
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.