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EP2559993
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| EP2559993 - X-ray diffraction instrument for measuring an object larger than the x-ray detector [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 22.05.2015 Database last updated on 26.07.2024 | Most recent event Tooltip | 22.05.2015 | Withdrawal of application | published on 24.06.2015 [2015/26] | Applicant(s) | For all designated states Hitachi, Ltd. 6-6 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 / JP | [N/P] |
| Former [2013/08] | For all designated states Hitachi Ltd. 6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo 100-8280 / JP | Inventor(s) | 01 /
Wang, Yun c/o Hitachi, Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building 6-1, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP | 02 /
Hatou, Hisamitu c/o Hitachi, Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building 6-1, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP | 03 /
Kikuchi, Toshikazu c/o Hitachi-GE Nuclear Energy, Ltd. 1-1, Saiwai-cho 3-chome Hitachi-shi Ibaraki 317-0073 / JP | [2013/14] |
| Former [2013/08] | 01 /
Wang, Yun c/o Hitachi, Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building 6-1, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP | ||
| 02 /
Hatou, Hisamitu c/o Hitachi, Ltd., Intellectual Property Group 12th Floor, Marunouchi Center Building 6-1, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8220 / JP | |||
| 03 /
Kikuhi, Toshikazu c/o Hitachi-GE Nuclear Energy, Ltd. 1-1, Saiwai-cho 3-chome Hitachi-shi Ibaraki 317-0073 / JP | Representative(s) | MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB Paul-Heyse-Strasse 29 80336 München / DE | [N/P] |
| Former [2013/08] | MERH-IP Matias Erny Reichl Hoffmann Paul-Heyse-Strasse 29 80336 München / DE | Application number, filing date | 12179985.2 | 10.08.2012 | [2013/08] | Priority number, date | JP20110178976 | 18.08.2011 Original published format: JP 2011178976 | [2013/08] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP2559993 | Date: | 20.02.2013 | Language: | EN | [2013/08] | Type: | A3 Search report | No.: | EP2559993 | Date: | 23.10.2013 | Language: | EN | [2013/43] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 20.09.2013 | Classification | IPC: | G01N23/20, G01L1/25 | [2013/27] | CPC: |
G01L1/25 (EP,US);
G01L5/0047 (EP,US);
G01N23/20008 (EP,US);
G01N2223/62 (EP,US)
|
| Former IPC [2013/08] | G01N23/20 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2013/08] | Extension states | BA | Not yet paid | ME | Not yet paid | Title | German: | Röntgenstrahldiffraktionsgerät | [2013/08] | English: | X-ray diffraction instrument for measuring an object larger than the x-ray detector | [2013/08] | French: | Instrument de diffraction à rayons X | [2013/08] | Examination procedure | 09.11.2012 | Examination requested [2013/08] | 17.04.2014 | Amendment by applicant (claims and/or description) | 20.05.2015 | Application withdrawn by applicant [2015/26] | Fees paid | Renewal fee | 01.09.2014 | Renewal fee patent year 03 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XD]JP2005241308 (RAILWAY TECHNICAL RES INST, et al) [XD] 1,5,7,10,11 * the whole document *; | [Y]US6353656 (LEVERT FRANCIS E [US], et al) [Y] 1 * figures 5a,b *; | [Y]US2462374 (GEORGE FIRTH FRANCIS) [Y] 1 * column 2, line 35 - line 43 *; | [Y]US4042825 (RUUD CLAYTON O) [Y] 1 * column 3, line 1 - line 6 *; | [Y]US2259708 (ERNST SCHIEBOLD) [Y] 1 * page 3, column 1, line 58 - line 61 *; | [A]US5741707 (HERRON MICHAEL M [US], et al) [A] 2 * column 5, line 4 - line 43 *; | [AP]US2012140888 (WANG YUN [JP]) [AP] 1,2,5-11 * the whole document * | by applicant | JP2000146871 | JP2005351780 | JPH06317484 | JP2005241308 |