-
EP2715277
European procedure
- EP About this file
- EP Legal status
- EP Federated register
- EP Event history
- EP Citations
- EP Patent family
- EP All documents
Extract from the Register of European Patents
EP About this file: EP2715277
| EP2715277 - INTERFEROMETERY ON A PLANAR SUBSTRATE [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 06.04.2018 Database last updated on 03.09.2024 | |
| Former | Request for examination was made Status updated on 03.01.2018 | Most recent event Tooltip | 06.04.2018 | Application deemed to be withdrawn | published on 09.05.2018 [2018/19] | Applicant(s) | For all designated states Tornado Spectral Systems, Inc. Suite 705 555 Richmond Street West Toronto, ON M5V 3B1 / CA | [N/P] |
| Former [2015/04] | For all designated states Tornado Spectral Systems Inc. Suite 705 555 Richmond Street West Toronto, ON M5V 3B1 / CA | ||
| Former [2014/15] | For all designated states Tornado Medical Systems, Inc . 555 Richmond Street West Suite 705 Box 218 Toronto, Ontario M5V 3B1 / CA | Inventor(s) | 01 /
NITKOWSKI, Arthur 7 Autumn Ridge Cir Ithaca, New York 14850 / US | 02 /
HAJIAN, Arsen 3 Beaucourt Road Toronto, Ontario M8Y 3G2 / CA | [2014/15] | Representative(s) | Gill Jennings & Every LLP The Broadgate Tower 20 Primrose Street London EC2A 2ES / GB | [N/P] |
| Former [2014/15] | Haley, Stephen Gill Jennings & Every LLP The Broadgate Tower 20 Primrose Street London EC2A 2ES / GB | Application number, filing date | 12793645.8 | 30.05.2012 | WO2012CA00525 | Priority number, date | US201161491620P | 31.05.2011 Original published format: US 201161491620 P | [2014/15] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2012162809 | Date: | 06.12.2012 | Language: | EN | [2012/49] | Type: | A1 Application with search report | No.: | EP2715277 | Date: | 09.04.2014 | Language: | EN | The application published by WIPO in one of the EPO official languages on 06.12.2012 takes the place of the publication of the European patent application. | [2014/15] | Search report(s) | International search report - published on: | CA | 06.12.2012 | (Supplementary) European search report - dispatched on: | EP | 12.01.2015 | Classification | IPC: | G01B9/02, G01J3/45 | [2014/15] | CPC: |
G01B9/02051 (EP,US);
G01J9/02 (US);
A61B5/0066 (EP,US);
G01B9/02004 (EP,US);
G01B9/02044 (EP,US);
G01B9/02091 (EP,US);
G01J3/0218 (EP,US);
G01J3/0259 (EP,US);
G01J3/0291 (EP,US);
G01J3/4531 (EP,US);
G01J3/4532 (EP,US);
G01B2290/40 (EP,US);
G01J2003/451 (EP,US)
(-)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2014/15] | Title | German: | INTERFEROMETRIE AUF EINEM EBENEN SUBSTRAT | [2014/15] | English: | INTERFEROMETERY ON A PLANAR SUBSTRATE | [2014/15] | French: | INTERFÉROMÉTRIE SUR UN SUBSTRAT PLAT | [2014/15] | Entry into regional phase | 23.12.2013 | National basic fee paid | 23.12.2013 | Search fee paid | 23.12.2013 | Designation fee(s) paid | 23.12.2013 | Examination fee paid | Examination procedure | 23.12.2013 | Examination requested [2014/15] | 27.07.2015 | Amendment by applicant (claims and/or description) | 01.12.2017 | Application deemed to be withdrawn, date of legal effect [2018/19] | 04.01.2018 | Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [2018/19] | Fees paid | Renewal fee | 29.05.2014 | Renewal fee patent year 03 | 26.05.2015 | Renewal fee patent year 04 | 26.05.2016 | Renewal fee patent year 05 | Penalty fee | Additional fee for renewal fee | 31.05.2017 | 06 M06 Not yet paid |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US2002015155 (PECHSTEDT RALF-DIETER [GB], et al) [A] 1-20* the whole document *; | [XY]US2007055117 (ALPHONSE GERARD A [US]) [X] 1-6,8,10,11,13-16,18 * abstract * * paragraph [0052] - paragraph [0120] * [Y] 7; | [Y]US2009022443 (CHEN WEI [US], et al) [Y] 7 * abstract * * paragraphs [0007] , [0 26] - paragraph [0043] *; | [XY] - DANIEL HOFSTETTER ET AL, "Optical Displacement Measurement with GaAs/AlGaAs-Based Monolithically Integrated Michelson Interferometers", JOURNAL OF LIGHTWAVE TECHNOLOGY, IEEE SERVICE CENTER, NEW YORK, NY, US, (19970401), vol. 15, no. 4, ISSN 0733-8724, XP011028806 [X] 1-5,10,11,13,14,16-19 * the whole document * [Y] 7 | [X] - GUNAY YURTSEVER, ROEL BAETS, "Towards Integrated Optical Coherence Tomography System on Silicon on Insulator", PROCEEDINGS SYMPOSIUM IEEE/LEOS BENELUX CHAPTER, (20081127), XP002733484 [X] 1,5,9-16,18,20 * the whole document * | International search | [X]CA2396895 (IMALUX CORP [US]); | [X]CA2553761 (OPTOVUE INC [US]); | [X]US2008204762 (IZATT JOSEPH A [US], et al); | [X]CA2476174 (KNUTTEL ALEXANDER) | by applicant | US2007055117 | US2009022443 | - "Optical Displacement Measurement with GaAs/AIGaAs-Based Monolithically Integrated Michelson Interferometers", DANIEL HOFSTETTER ET AL., JOURNAL OF LIGHTWAVE TECHNOLOGY, IEEE SERVICE CENTER, (19970401), vol. 15 |