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Extract from the Register of European Patents

EP About this file: EP2607939

EP2607939 - Interference filter, optical module, and analyzing device [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  17.03.2017
Database last updated on 11.09.2024
FormerExamination is in progress
Status updated on  13.12.2016
Most recent event   Tooltip17.03.2017Application deemed to be withdrawnpublished on 19.04.2017  [2017/16]
Applicant(s)For all designated states
Seiko Epson Corporation
4-1, Nishi-Shinjuku 2-chome Shinjuku-ku
Tokyo / JP
[2013/26]
Inventor(s)01 / Shinto, Susumu
c/o SEIKO EPSON CORPORATION
3-5, Owa 3-chome
Suwa-shi
Nagano, 392-8502 / JP
02 / Kitahara, Koji
c/o SEIKO EPSON CORPORATION
3-5, Owa 3-chome
Suwa-shi
Nagano, 392-8502 / JP
 [2013/26]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastraße 30
81925 München / DE
[N/P]
Former [2013/26]HOFFMANN EITLE
Patent- und Rechtsanwälte
Arabellastrasse 4
81925 München / DE
Application number, filing date13158748.720.07.2011
[2013/26]
Priority number, dateJP2010016558723.07.2010         Original published format: JP 2010165587
[2013/26]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP2607939
Date:26.06.2013
Language:EN
[2013/26]
Type: A3 Search report 
No.:EP2607939
Date:09.04.2014
Language:EN
[2014/15]
Search report(s)(Supplementary) European search report - dispatched on:EP06.03.2014
ClassificationIPC:G02B26/00, G02B5/28, C22C5/06, C22C5/08
[2013/26]
CPC:
G02B26/001 (EP,US); G02B5/28 (KR); C22C5/06 (EP,US);
C22C5/08 (EP,US); G01J1/0488 (US); G01J3/46 (US);
G02B5/284 (EP,US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2013/26]
TitleGerman:Interferenzfilter, optisches Modul und Analysevorrichtung[2013/26]
English:Interference filter, optical module, and analyzing device[2013/26]
French:Filtre d'interférences, module optique et dispositif d'analyse[2013/26]
Examination procedure24.09.2014Examination requested  [2014/45]
09.10.2014Amendment by applicant (claims and/or description)
25.03.2015Despatch of a communication from the examining division (Time limit: M04)
31.07.2015Reply to a communication from the examining division
07.07.2016Despatch of a communication from the examining division (Time limit: M04)
18.11.2016Application deemed to be withdrawn, date of legal effect  [2017/16]
14.12.2016Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2017/16]
Parent application(s)   TooltipEP11174643.4  / EP2410368
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued (EP20110174643) is  15.10.2012
Fees paidRenewal fee
24.07.2013Renewal fee patent year 03
07.07.2014Renewal fee patent year 04
06.07.2015Renewal fee patent year 05
05.07.2016Renewal fee patent year 06
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Documents cited:Search[Y]US2010142067  (HANAMURA YUKI [JP], et al) [Y] 1,3,4,6-8 * figures 2,11 * * paragraphs [0012] , [0055] , [0056] , [0099] *;
 [Y]JP2009251105  (SEIKO EPSON CORP) [Y] 1,3-5,8 * figure 1 * * paragraphs [0016] , [0031] , [0036] *;
 [Y]US2006134367  (NEE HAN H [US]) [Y] 1,3-8 * paragraphs [0031] , [0081] , [0093] , [0123] *;
 [Y]US2004028912  (TAUCHI YUUKI [JP], et al) [Y] 1,3-8 * paragraphs [0028] , [0032] , [0064] , [0140] *;
 [Y]EP1612784  (KOBE STEEL LTD [JP]) [Y] 1,3-8 * paragraphs [0001] , [0029] , [0032] , [0033] , [0034] *
by applicantJP2009251105
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.