EP2846359 - LVTSCR device [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 23.11.2018 Database last updated on 03.09.2024 | |
Former | The patent has been granted Status updated on 15.12.2017 | ||
Former | Grant of patent is intended Status updated on 26.10.2017 | Most recent event Tooltip | 26.06.2020 | Lapse of the patent in a contracting state New state(s): MK | published on 29.07.2020 [2020/31] | Applicant(s) | For all designated states IMEC VZW Kapeldreef 75 3001 Leuven / BE | [2015/11] | Inventor(s) | 01 /
Chen, Shih-Hung IMEC IP department Kapeldreef 75 3001 Leuven / BE | 02 /
Linten, Dimitri IMEC IP department Kapeldreef 75 3001 Leuven / BE | [2015/11] | Representative(s) | Mackett, Margaret, et al Gevers & Vander Haeghen Holidaystraat 5 1831 Diegem / BE | [2018/03] |
Former [2015/11] | Mackett, Margaret Dawn, et al Gevers & Vander Haeghen Holidaystraat 5 1831 Diegem / BE | Application number, filing date | 13183428.5 | 06.09.2013 | [2015/11] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2846359 | Date: | 11.03.2015 | Language: | EN | [2015/11] | Type: | B1 Patent specification | No.: | EP2846359 | Date: | 17.01.2018 | Language: | EN | [2018/03] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 12.12.2013 | Classification | IPC: | H01L29/87, H01L29/06 | [2015/11] | CPC: |
H01L29/87 (EP,US);
H01L29/785 (KR);
H01L23/564 (US);
H01L29/0649 (EP,US);
H01L29/0657 (EP,US);
H01L29/78 (US);
| C-Set: |
H01L2924/0002, H01L2924/00 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2015/43] |
Former [2015/11] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Title | German: | LVTSCR-Anordnung | [2015/11] | English: | LVTSCR device | [2015/11] | French: | Dispositif de type LVTSCR | [2015/11] | Examination procedure | 09.09.2015 | Amendment by applicant (claims and/or description) | 09.09.2015 | Examination requested [2015/43] | 27.10.2017 | Communication of intention to grant the patent | 07.12.2017 | Fee for grant paid | 07.12.2017 | Fee for publishing/printing paid | 07.12.2017 | Receipt of the translation of the claim(s) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 27.10.2017 | Opposition(s) | 18.10.2018 | No opposition filed within time limit [2018/52] | Fees paid | Renewal fee | 28.09.2015 | Renewal fee patent year 03 | 23.09.2016 | Renewal fee patent year 04 | 22.09.2017 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | HU | 06.09.2013 | AL | 17.01.2018 | AT | 17.01.2018 | CY | 17.01.2018 | CZ | 17.01.2018 | DK | 17.01.2018 | EE | 17.01.2018 | ES | 17.01.2018 | FI | 17.01.2018 | HR | 17.01.2018 | IT | 17.01.2018 | LT | 17.01.2018 | LV | 17.01.2018 | MC | 17.01.2018 | MK | 17.01.2018 | NL | 17.01.2018 | PL | 17.01.2018 | PT | 17.01.2018 | RO | 17.01.2018 | RS | 17.01.2018 | SE | 17.01.2018 | SI | 17.01.2018 | SK | 17.01.2018 | SM | 17.01.2018 | TR | 17.01.2018 | BG | 17.04.2018 | NO | 17.04.2018 | GR | 18.04.2018 | IS | 17.05.2018 | GB | 06.09.2018 | IE | 06.09.2018 | LU | 06.09.2018 | MT | 06.09.2018 | BE | 30.09.2018 | CH | 30.09.2018 | LI | 30.09.2018 | [2020/31] |
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BE | 30.09.2018 | ||
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NO | 17.04.2018 | Documents cited: | Search | [A]US5465189 (POLGREEN THOMAS L [US], et al) [A] 1,8 * column 4, line 10 - line 52; figures 2,3 *; | [AD] - GRIFFONI A ET AL, "Next generation bulk FinFET devices and their benefits for ESD robustness", 2009 31ST ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD 2009), ANAHEIM, CA, USA, IEEE, New York, NY, USA, (20090830), ISBN 978-1-58537-176-1, pages 1 - 10, XP031570825 [AD] 1-8 * paragraphs II-III; figures 1, 3 * | by applicant | US2007262386 | US2009309167 | US8455947 | - A. GRIFFONI ET AL., "Next generation bulk FinFET devices and their benefits for ESD robustness", EOS/ESD SYMPOSIUM, (2009), pages 59 - 68 |