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EP2860154
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EP About this file: EP2860154
| EP2860154 - METHOD AND SYSTEM FOR CHARACTERIZATION OF NANO- AND MICROMECHANICAL STRUCTURES [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 16.11.2018 Database last updated on 12.07.2024 | Most recent event Tooltip | 27.06.2024 | New entry: Despatch of examination report + time limit | Applicant(s) | For all designated states Consejo Superior De Investigaciones Científicas (CSIC) Serrano 117 28006 Madrid / ES | [N/P] |
| Former [2015/16] | For all designated states Consejo Superior De Investigaciones Científicas (CSIC) Serrano 117 28006 Madrid / ES | Inventor(s) | 01 /
TAMAYO DE MIGUEL, Francisco Javier Instituto de Microelectrónica de Madrid (IMM) Isaac Newton 8 E-28760 Tres Cantos (Madrid) / ES | 02 /
PINI, Valerio Instituto de Microelectrónica de Madrid (IMM) Isaac Newton 8 E-28760 Tres Cantos (Madrid) / ES | 03 /
MONTEIRO KOSAKA, Priscila Instituto de Microelectrónica de Madrid (IMM) Isaac Newton 8 E-28760 Tres Cantos (Madrid) / ES | 04 /
CALLEJA GÓMEZ, Montserrat Instituto de Microelectrónica de Madrid (IMM) Isaac Newton 8 E-28760 Tres Cantos (Madrid) / ES | 05 /
GONZÁLEZ CASTILLA, Sheila Instituto de Microelectrónica de Madrid (IMM) Isaac Newton 8 E-28760 Tres Cantos (Madrid) / ES | [2015/16] | Representative(s) | Carpintero Lopez, Francisco, et al Herrero & Asociados, S.L. Agustín de Foxá, 4-10 28036 Madrid / ES | [N/P] |
| Former [2015/16] | Carpintero Lopez, Francisco, et al Herrero & Asociados, S.L. Alcalá 35 28014 Madrid / ES | Application number, filing date | 13799806.8 | 23.05.2013 | WO2013ES70331 | Priority number, date | ES20120030884 | 07.06.2012 Original published format: ES 201230884 | [2015/16] | Filing language | ES | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2013182721 | Date: | 12.12.2013 | Language: | ES | [2013/50] | Type: | A1 Application with search report | No.: | EP2860154 | Date: | 15.04.2015 | Language: | EN | [2015/16] | Search report(s) | International search report - published on: | ES | 12.12.2013 | (Supplementary) European search report - dispatched on: | EP | 17.12.2015 | Classification | IPC: | B82Y35/00, B81C99/00 | [2015/16] | CPC: |
B82B3/0085 (EP,US);
G01N21/1702 (US);
B81C99/003 (EP,US);
G01B21/20 (US);
G01Q10/06 (US);
G01Q20/02 (US);
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2015/16] | Title | German: | VERFAHREN UND SYSTEM ZUR CHARAKTERISIERUNG VON NANO- UND MIKROMECHANISCHEN STRUKTUREN | [2015/16] | English: | METHOD AND SYSTEM FOR CHARACTERIZATION OF NANO- AND MICROMECHANICAL STRUCTURES | [2015/16] | French: | PROCÉDÉ ET SYSTÈME DE CARACTÉRISATION DE STRUCTURES NANO ET MICRO MÉCANIQUES | [2015/16] | Entry into regional phase | 26.12.2014 | Translation filed | 26.12.2014 | National basic fee paid | 26.12.2014 | Search fee paid | 26.12.2014 | Designation fee(s) paid | 26.12.2014 | Examination fee paid | Examination procedure | 26.12.2014 | Examination requested [2015/16] | 07.07.2016 | Amendment by applicant (claims and/or description) | 16.11.2018 | Despatch of a communication from the examining division (Time limit: M06) | 08.05.2019 | Reply to a communication from the examining division | 12.01.2021 | Despatch of a communication from the examining division (Time limit: M04) | 29.01.2021 | Reply to a communication from the examining division | 23.08.2022 | Despatch of a communication from the examining division (Time limit: M04) | 04.10.2022 | Reply to a communication from the examining division | 26.06.2024 | Despatch of a communication from the examining division (Time limit: M04) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 16.11.2018 | Fees paid | Renewal fee | 21.05.2015 | Renewal fee patent year 03 | 29.02.2016 | Renewal fee patent year 04 | 09.05.2017 | Renewal fee patent year 05 | 11.05.2018 | Renewal fee patent year 06 | 09.05.2019 | Renewal fee patent year 07 | 11.03.2020 | Renewal fee patent year 08 | 24.05.2021 | Renewal fee patent year 09 | 25.03.2022 | Renewal fee patent year 10 | 24.03.2023 | Renewal fee patent year 11 | 18.03.2024 | Renewal fee patent year 12 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [X] - KOSAKA P ET AL., "Simultaneous imaging of the topography and dynamic properties of nanomechanical systems by optical beam deflection microscopy.", JOURNAL OF APPLIED PHYSICS, (20110324), vol. 109, no. 6, pages 64315 A 64315 - 5, XP012147833 DOI: http://dx.doi.org/10.1063/1.3561812 | [Y] - RAMOS D ET AL., "Photothermal excitation of microcantilevers in liquids.", JOURNAL OF APPLIED PHYSICS, (20060621), vol. 99, no. 12, pages 124904 - 124904-8, XP012083555 | [A] - SI, D. ET AL., "Research of Auto-Tracking System based on PSD1.", COMPUTER SCIENCE APPLICATIONS AND EDUCATION, vol. 1, no. 2, (201110), URL: http://isctae.org/paper-isctae/English/vln2/2q201203.pdf, (20131024), XP055179885 | [X] - BURDESS, JS ET AL., "A System for the Dynamic Characterization of Microstructures.", JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, (19970112), vol. 6, no. 4, pages 322 - 328, XP000779958 DOI: http://dx.doi.org/10.1109/84.650129 | [Y] - MURALI KRISHNA GHATKESAR ET AL., "Higher modes of vibration increase mass sensitivity in nanomechanical microcantilevers.", NANOTECHNOLOGY, (20070711), vol. 18, no. 44, page 445502, XP020129430 |