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Extract from the Register of European Patents

EP About this file: EP2896995

EP2896995 - A radiation source [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  24.06.2016
Database last updated on 24.08.2024
Most recent event   Tooltip24.06.2016Application deemed to be withdrawnpublished on 27.07.2016  [2016/30]
Applicant(s)For all designated states
ASML Netherlands B.V.
P.O. Box 324
5500 AH Veldhoven / NL
[2015/30]
Inventor(s)01 / Nikipelov, Andrey, Alexandrovich
P.O.Box 324
5500 AH Veldhoven / NL
02 / De Vries, Gosse, Charles
P.O.Box 324
5500 AH Veldhoven / NL
03 / Engelen, Wouter, Joep
P.O.Box 324
5500 AH Veldhoven / NL
04 / Frijns, Olav, Waldemar, Vladimir
P.O.Box 324
5500 AH Veldhoven / NL
05 / Grimminck, Leonardus, Adrianus, Gerardus
P.O.Box 324
5500 AH Veldhoven / NL
06 / Loopstra, Erik, Roelof
P.O.Box 324
5500 AH Veldhoven / NL
 [2015/30]
Representative(s)Siem, Max Yoe Shé
ASML Netherlands B.V.
Corporate Intellectual Property
P.O. Box 324
5500 AH Veldhoven / NL
[2015/30]
Application number, filing date14151497.616.01.2014
[2015/30]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP2896995
Date:22.07.2015
Language:EN
[2015/30]
Search report(s)(Supplementary) European search report - dispatched on:EP12.12.2014
ClassificationIPC:G03F7/20, H01S3/09, H05H7/04
[2015/30]
CPC:
G03F7/70008 (EP); G03F7/7055 (EP); G03F7/7085 (EP);
H01S3/0903 (EP); H05H7/04 (EP); H05H2007/041 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2015/30]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:Strahlungsquelle[2015/30]
English:A radiation source[2015/30]
French:Source de radiation[2015/30]
Examination procedure05.06.2014Loss of particular rights, legal effect: Claims
11.07.2014Despatch of communication of loss of particular rights: Claims {1}
23.01.2016Application deemed to be withdrawn, date of legal effect  [2016/30]
04.03.2016Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2016/30]
Fees paidPenalty fee
Additional fee for renewal fee
31.01.201603   M06   Not yet paid
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Documents cited:Search[Y]US2007152171  (GOLDSTEIN MICHAEL [US], et al) [Y] 20,21,24 * paragraph [0019] - paragraph [0031]; figures 1,4 *;
 [Y]US2002018189  (MULKENS JOHANNES CATHARINUS HU [NL], et al) [Y] 22 * paragraph [0034] * * paragraph [0050] - paragraph [0052]; figure 1 * * paragraph [0061] - paragraph [0063]; figure 3 *;
 [XAY]  - DI MITRI S ET AL, "FERMI@Elettra, a seeded free electron laser source for a broad scientific user program", ADVANCES IN X-RAY FREE-ELECTRON LASERS: RADIATION SCHEMES, X-RAY OPTICS, AND INSTRUMENTATION, SPIE, 1000 20TH ST. BELLINGHAM WA 98225-6705 USA, (20110505), vol. 8078, no. 1, doi:10.1117/12.886491, pages 1 - 13, XP060013781 [X] 1-10,18,19,25 * paragraph [0001] * * paragraph [02.2]; figure 3.2 * [A] 11-17 [Y] 20-24

DOI:   http://dx.doi.org/10.1117/12.886491
 [XY]  - YU L-H ET AL, "The DUV-FEL development program", PROCEEDINGS OF THE 2001 PARTICLE ACCELERATOR CONFERENCE : CHICAGO, ILLINOIS, U.S.A., JUNE 18 - 22, 2001, IEEE OPERATIONS CENTER, PISCATAWAY, NJ, (20010618), vol. 4, doi:10.1109/PAC.2001.987925, ISBN 978-0-7803-7191-0, pages 2830 - 2832, XP010581749 [X] 1-10,18,19,25 * paragraph [0002] * [Y] 20-24

DOI:   http://dx.doi.org/10.1109/PAC.2001.987925
 [Y]  - GIOVANNI CIRMI ET AL, "Paper;Cut-off scaling of high-harmonic generation driven by a femtosecond visible optical parametric amplifier;Cut-off scaling of high-harmonic generation driven by a femtosecond visible optical parametric amplifier", JOURNAL OF PHYSICS B, ATOMIC MOLECULAR AND OPTICAL PHYSICS, INSTITUTE OF PHYSICS PUBLISHING, BRISTOL, GB, (20120912), vol. 45, no. 20, doi:10.1088/0953-4075/45/20/205601, ISSN 0953-4075, page 205601, XP020229911 [Y] 23 * page 8, paragraph 1 *

DOI:   http://dx.doi.org/10.1088/0953-4075/45/20/205601
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