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Extract from the Register of European Patents

EP About this file: EP2779212

EP2779212 - Method of forming a high electron mobility semiconductor device [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  24.03.2017
Database last updated on 30.10.2024
FormerExamination is in progress
Status updated on  10.03.2017
Most recent event   Tooltip24.03.2017Withdrawal of applicationpublished on 26.04.2017  [2017/17]
Applicant(s)For all designated states
Semiconductor Components Industries, LLC
5005 East McDowell Road
Phoenix, AZ 85008 / US
[2014/38]
Inventor(s)01 / Salih, Ali
2953 E Hackamore Street
Mesa, AZ 85213 / US
02 / Parsey, Jr, John
1321 E Desert Flower Lane
Phoenix, AZ 85048 / US
 [2014/38]
Representative(s)Clarke, Geoffrey Howard, et al
Avidity IP
Broers Building
Hauser Forum
21 JJ Thomson Ave
Cambridge CB3 0FA / GB
[N/P]
Former [2014/38]Clarke, Geoffrey Howard, et al
Avidity IP
Kestrel House
Falconry Court
Baker's Lane
Epping, Essex CM16 5DQ / GB
Application number, filing date14159907.614.03.2014
[2014/38]
Priority number, dateUS201361786577P15.03.2013         Original published format: US 201361786577 P
[2014/38]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP2779212
Date:17.09.2014
Language:EN
[2014/38]
Type: A3 Search report 
No.:EP2779212
Date:12.11.2014
Language:EN
[2014/46]
Search report(s)(Supplementary) European search report - dispatched on:EP15.10.2014
ClassificationIPC:H01L21/18, H01L21/02
[2014/38]
CPC:
H01L21/187 (EP,CN,US); H01L29/778 (US); H01L21/02365 (US);
H01L21/6835 (EP,CN,US); H01L29/045 (EP,CN,US); H01L29/0657 (EP,CN,US);
H01L29/66462 (EP,CN,US); H01L29/7786 (EP,CN,US); H01L29/7789 (EP,CN,US);
H01L2221/68368 (EP,CN,US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2015/25]
Former [2014/38]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
TitleGerman:Verfahren zur Herstellung eines Halbleiterbauelements mit hoher Elektronenbeweglichkeit[2014/38]
English:Method of forming a high electron mobility semiconductor device[2014/38]
French:Procédé de formation d'un dispositif semi-conducteur à haute mobilité d'électrons[2014/38]
Examination procedure11.05.2015Amendment by applicant (claims and/or description)
11.05.2015Examination requested  [2015/25]
09.03.2017Despatch of a communication from the examining division (Time limit: M04)
21.03.2017Application withdrawn by applicant  [2017/17]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  09.03.2017
Fees paidRenewal fee
08.03.2016Renewal fee patent year 03
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Documents cited:Search[I]US2006035440  (GHYSELEN BRUNO [FR], et al);
 [X]EP1873817  (SUMITOMO ELECTRIC INDUSTRIES [JP]);
 [I]JP2011077102  (TOYODA GOSEI KK)
ExaminationUS6344375
 WO2004061944
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.