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EP2801824
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| EP2801824 - Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 04.11.2016 Database last updated on 26.06.2024 | Most recent event Tooltip | 04.11.2016 | Application deemed to be withdrawn | published on 07.12.2016 [2016/49] | Applicant(s) | For all designated states Kabushiki Kaisha Toshiba 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | [2014/46] | Inventor(s) | 01 /
Tono, Ichiro c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 02 /
Nitta, Isamu c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 03 /
Kasai, Shingo c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 04 /
Wada, Takaaki c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 05 /
Nawata, Isao c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 06 /
Hirakawa, Masaaki c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 07 /
Takase, Tomohiro c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 08 /
Oomiya, Kayoko c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 09 /
Yamauchi, Takeshi c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | 10 /
Nakayama, Tadahiro c/o Intellectual Property Division Toshiba Corporation 1-1, Shibaura 1-chome Minato-ku Tokyo / JP | [2014/46] | Representative(s) | Hoffmann Eitle Patent- und Rechtsanwälte PartmbB Arabellastraße 30 81925 München / DE | [2014/46] | Application number, filing date | 14179650.8 | 30.03.2012 | [2014/46] | Priority number, date | JP20110076412 | 30.03.2011 Original published format: JP 2011076412 | JP20110201221 | 14.09.2011 Original published format: JP 2011201221 | JP20120011456 | 23.01.2012 Original published format: JP 2012011456 | [2014/46] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP2801824 | Date: | 12.11.2014 | Language: | EN | [2014/46] | Type: | A3 Search report | No.: | EP2801824 | Date: | 25.02.2015 | Language: | EN | [2015/09] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 26.01.2015 | Classification | IPC: | G01N33/543 | [2014/46] | CPC: |
G01N33/54326 (EP,US);
G01N15/0656 (US);
G01N33/5434 (US);
G01N33/54373 (EP,US);
G01N33/585 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2014/46] | Title | German: | Messsystem mit optischem Wellenleiter, Messvorrichtung, Messverfahren, optischer Wellenleitersensorchip und magnetische Feinpartikel | [2014/46] | English: | Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle | [2014/46] | French: | Système de mesure utilisant un guide d'ondes optique, dispositif de mesure, procédé de mesure, puce de capteur de type à guide d'ondes optique et fines particules magnétiques | [2014/46] | Examination procedure | 04.08.2014 | Examination requested [2014/46] | 24.08.2015 | Amendment by applicant (claims and/or description) | 29.09.2015 | Despatch of a communication from the examining division (Time limit: M04) | 09.02.2016 | Reply to a communication from the examining division | 23.02.2016 | Despatch of a communication from the examining division (Time limit: M04) | 05.07.2016 | Application deemed to be withdrawn, date of legal effect [2016/49] | 02.08.2016 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2016/49] | Parent application(s) Tooltip | EP12162500.8 / EP2506014 | Fees paid | Renewal fee | 04.08.2014 | Renewal fee patent year 03 | 23.03.2015 | Renewal fee patent year 04 | 10.03.2016 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]WO2011026030 (MBIO DIAGNOSTICS CORP [US], et al) [X] 1-3,6,7,19,20 * paragraph [0070]; figures 10,20; example III *; | [A]US2009124024 (KASAI SHINGO [JP], et al) [A] 1-3,6,7,19,20 * figures 1-7 * |