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Extract from the Register of European Patents

EP About this file: EP2902759

EP2902759 - Sensor device, manufacturing method for a sensor device and method for determining an item of information relating to a temperature and/or relating to radiation [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  22.10.2018
Database last updated on 11.09.2024
FormerExamination is in progress
Status updated on  06.07.2018
Most recent event   Tooltip08.02.2019Refusal of applicationpublished on 13.03.2019  [2019/11]
Applicant(s)For all designated states
ROBERT BOSCH GMBH
Postfach 30 02 20
70442 Stuttgart / DE
[2015/32]
Inventor(s)01 / Utermoehlen, Fabian
Vogelsangstrasse 145b
70197 Stuttgart / DE
 [2015/32]
Application number, filing date14195330.728.11.2014
[2015/32]
Priority number, dateDE20141020162030.01.2014         Original published format: DE102014201620
[2015/32]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP2902759
Date:05.08.2015
Language:DE
[2015/32]
Search report(s)(Supplementary) European search report - dispatched on:EP26.06.2015
ClassificationIPC:G01J5/04, G01J5/20
[2015/32]
CPC:
G01J5/20 (EP); G01J5/046 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2016/11]
Former [2015/32]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
TitleGerman:Sensorvorrichtung, Herstellungsverfahren für eine Sensorvorrichtung und Verfahren zum Ermitteln einer Information bezüglich einer Temperatur und/oder bezüglich einer Strahlung[2015/32]
English:Sensor device, manufacturing method for a sensor device and method for determining an item of information relating to a temperature and/or relating to radiation[2015/32]
French:Dispositif de capteur, procédé de fabrication pour un dispositif de capteur et procédé de détermination d'une information concernant une température et/ou un rayonnement[2015/32]
Examination procedure09.12.2015Amendment by applicant (claims and/or description)
05.02.2016Examination requested  [2016/11]
04.07.2018Despatch of a communication from the examining division (Time limit: M04)
19.09.2018Reply to a communication from the examining division
23.10.2018Despatch of communication that the application is refused, reason: substantive examination [2019/11]
02.11.2018Application refused, date of legal effect [2019/11]
Fees paidRenewal fee
30.11.2016Renewal fee patent year 03
30.11.2017Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
30.11.201805   M06   Not yet paid
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Documents cited:Search[XYI]US2009321641  (PARK KUN SIK [KR], et al) [X] 1-3,10-13 * paragraphs [0003] , [0019] , [0020] , [0044] - [0048] - [0081] - [0084] * * figures 2,8A,8B * [Y] 6-8 [I] 4-7,14,15;
 [XI]JP2007225398  (MITSUBISHI ELECTRIC CORP) [X] 1,2,8-10 * paragraphs [0036] - [0040] * * figure 3 * [I] 4;
 [XI]EP2573530  (FRAUNHOFER GES FORSCHUNG [DE]) [X] 1,2,10 * paragraphs [0034] - [0036] * * figure 4 * [I] 4;
 [Y]US2012091342  (BERGER ISRAEL [IL], et al) [Y] 8 * paragraph [0049] * * figure 8 *
 [Y]  - CRESSLER J, "Re-engineering silicon: Si-Ge heterojunction bipolar technology", IEEE SPECTRUM, IEEE INC. NEW YORK, US, vol. 32, no. 3, doi:10.1109/6.367973, ISSN 0018-9235, (19950501), pages 49 - 55, (20020806), XP007923146 [Y] 6,7 * page 49, column l, paragraph 2 * * page 55, column l, paragraph 4 *

DOI:   http://dx.doi.org/10.1109/6.367973
by applicantDE102006028435
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.