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EP2984494
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EP About this file: EP2984494
| EP2984494 - METHOD FOR STUDYING THE TEMPERATURE RELIABILITY OF EN ELECTRONIC COMPONENT [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 02.07.2021 Database last updated on 15.06.2024 | |
| Former | Examination is in progress Status updated on 24.03.2017 | Most recent event Tooltip | 02.07.2021 | Withdrawal of application | published on 04.08.2021 [2021/31] | Applicant(s) | For all designated states AIRBUS (SAS) 2, rond-point Emile Dewoitine 31700 Blagnac / FR | [2018/20] |
| Former [2016/07] | For all designated states Airbus Group SAS 37, Boulevard de Montmorency 75016 Paris / FR | Inventor(s) | 01 /
MILLER, Florent 82 rue du 22 Septembre 92400 Courbevoie / FR | 02 /
MORAND, Sébastien 11 rue Henri Martin F-92100 Boulogne Billancourt / FR | 03 /
MOLIERE, Florian 10 boulevard du Général de Gaulle F-92120 Montrouge / FR | 04 /
SANTINI, Thomas 59 boulevard Victor F-75015 Paris / FR | [2016/08] |
| Former [2016/07] | 01 /
MILLER, Florent 82 rue du 22 Septembre F-92400 Montrouge / FR | ||
| 02 /
MORAND, Sébastien 11 rue Henri Martin F-92100 Boulogne Billancourt / FR | |||
| 03 /
MOLIERE, Florian 10 boulevard du Général de Gaulle F-92120 Montrouge / FR | |||
| 04 /
SANTINI, Thomas 59 boulevard Victor F-75015 Paris / FR | Representative(s) | Gicquel, Olivier Yves Gérard, et al Airbus Opérations (S.A.S) XIF - M0101/1 316, route de Bayonne 31060 Toulouse Cedex / FR | [N/P] |
| Former [2016/07] | Ipside 29, rue de Lisbonne 75008 Paris / FR | Application number, filing date | 14712244.4 | 17.03.2014 | [2016/07] | WO2014EP55257 | Priority number, date | FR20130053184 | 09.04.2013 Original published format: FR 1353184 | [2016/07] | Filing language | FR | Procedural language | FR | Publication | Type: | A1 Application with search report | No.: | WO2014166701 | Date: | 16.10.2014 | Language: | FR | [2014/42] | Type: | A1 Application with search report | No.: | EP2984494 | Date: | 17.02.2016 | Language: | FR | The application published by WIPO in one of the EPO official languages on 16.10.2014 takes the place of the publication of the European patent application. | [2016/07] | Search report(s) | International search report - published on: | EP | 16.10.2014 | Classification | IPC: | G01R31/28, G01R31/311 | [2016/07] | CPC: |
G01R31/2858 (EP);
G01R31/2875 (EP);
G01R31/311 (EP)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2016/07] | Title | German: | VERFAHREN ZUR UNTERSUCHUNG DER TEMPERATURZUVERLÄSSIGKEIT EINES ELEKTRONISCHEN BAUELEMENTS | [2016/07] | English: | METHOD FOR STUDYING THE TEMPERATURE RELIABILITY OF EN ELECTRONIC COMPONENT | [2016/07] | French: | PROCEDE D'ETUDE DE LA FIABILITE EN TEMPERATURE D'UN COMPOSANT ELECTRONIQUE | [2016/07] | Entry into regional phase | 20.10.2015 | National basic fee paid | 20.10.2015 | Designation fee(s) paid | 20.10.2015 | Examination fee paid | Examination procedure | 20.10.2015 | Examination requested [2016/07] | 19.05.2016 | Amendment by applicant (claims and/or description) | 23.03.2017 | Despatch of a communication from the examining division (Time limit: M04) | 12.05.2017 | Reply to a communication from the examining division | 29.06.2021 | Application withdrawn by applicant [2021/31] | 30.06.2021 | Cancellation of oral proceeding that was planned for 15.07.2021 | 15.07.2021 | Date of oral proceedings (cancelled) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 23.03.2017 | Fees paid | Renewal fee | 25.03.2016 | Renewal fee patent year 03 | 24.03.2017 | Renewal fee patent year 04 | 23.03.2018 | Renewal fee patent year 05 | 26.03.2019 | Renewal fee patent year 06 | 24.03.2020 | Renewal fee patent year 07 | Penalty fee | Additional fee for renewal fee | 31.03.2021 | 08 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [AD]FR2959018 (EADS EUROP AERONAUTIC DEFENCE [FR], et al) [AD] 1,7-9 * page 10, lines 26-30 * * page 11, line 1 - page 15, line 18; figures 4a, 4b, 5 *; | [A]US6483326 (BRUCE MICHAEL R [US], et al) [A] 1,4,5 * column 1, lines 44-45 * * column 2, line 46 - column 4, line 43; figures 3-5 * | [A] - ZHU D ET AL, "Application of FIB circuit edit combined with TIVA in advanced failure analysis", PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2008. IPFA 2008. 15TH INTERNATIONAL SYMPOSIUM ON THE, IEEE, PISCATAWAY, NJ, USA, (20080707), ISBN 978-1-4244-2039-1, pages 1 - 4, XP031297693 [A] 1,2,8 * page 1, column r; figure 1 * | Examination | US6078183 | - LELLOUCHI D ET AL, "MEMS failure analysis case studies using the IR-OBIRCH method - Short circuit localization in a MEMS pressure sensor", PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2009. IPFA 2009. 16TH IEEE INTERNATIONAL SYMPOSIUM ON THE, IEEE, PISCATAWAY, NJ, USA, (20090706), ISBN 978-1-4244-3911-9, pages 827 - 831, XP031526469 | - GLOWACKI A M ET AL, "Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam", IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, (20070301), vol. 7, no. 1, doi:10.1109/TDMR.2007.900056, ISSN 1530-4388, pages 31 - 49, XP011187285 DOI: http://dx.doi.org/10.1109/TDMR.2007.900056 |