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EP2984913
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EP About this file: EP2984913
| EP2984913 - SYSTEM AND METHOD FOR OPTICAL INSPECTION OF ELECTRONIC CIRCUITS [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 15.01.2021 Database last updated on 19.10.2024 | |
| Former | Grant of patent is intended Status updated on 22.04.2020 | ||
| Former | Examination is in progress Status updated on 11.05.2018 | Most recent event Tooltip | 15.01.2021 | Application deemed to be withdrawn | published on 17.02.2021 [2021/07] | Applicant(s) | For all designated states VIT 8 Rue de Rochepleine 38120 Saint-Egreve / FR | [2016/07] | Inventor(s) | 01 /
GERBELOT, Rémi 395, route de Fontagneux 38450 VIF / FR | [2016/10] |
| Former [2016/07] | 01 /
GERBELOT, Rémi c/o VIT 8 Rue de Rochepleine F-38120 Saint-Egreve / FR | Representative(s) | Cabinet Beaumont 4, Place Robert Schuman B.P. 1529 38025 Grenoble Cedex 1 / FR | [N/P] |
| Former [2016/07] | Thibon, Laurent Cabinet Beaumont 1, rue Champollion 38000 Grenoble / FR | Application number, filing date | 14720669.2 | 09.04.2014 | [2016/07] | WO2014FR50853 | Priority number, date | FR20130053275 | 11.04.2013 Original published format: FR 1353275 | [2016/07] | Filing language | FR | Procedural language | FR | Publication | Type: | A1 Application with search report | No.: | WO2014167248 | Date: | 16.10.2014 | Language: | FR | [2014/42] | Type: | A1 Application with search report | No.: | EP2984913 | Date: | 17.02.2016 | Language: | FR | The application published by WIPO in one of the EPO official languages on 16.10.2014 takes the place of the publication of the European patent application. | [2016/07] | Search report(s) | International search report - published on: | EP | 16.10.2014 | Classification | IPC: | H05K13/08, G01N21/956 | [2016/07] | CPC: |
G01N21/95684 (EP,US);
H05K13/0815 (EP,US);
G01N2021/95638 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2016/07] | Title | German: | VORRICHTUNG UND VERFAHREN ZUR OPTISCHEN INSPEKTION VON ELEKTRONISCHEN SCHALTUNGEN | [2016/07] | English: | SYSTEM AND METHOD FOR OPTICAL INSPECTION OF ELECTRONIC CIRCUITS | [2016/07] | French: | SYSTÈME ET PROCÉDÉ D'INSPECTION OPTIQUE DE CIRCUITS ÉLECTRONIQUES | [2020/21] |
| Former [2016/07] | SYSTEME ET PROCEDE D'INSPECTION OPTIQUE DE CIRCUITS ELECTRONIQUES | Entry into regional phase | 06.10.2015 | National basic fee paid | 06.10.2015 | Designation fee(s) paid | 06.10.2015 | Examination fee paid | Examination procedure | 06.10.2015 | Examination requested [2016/07] | 31.05.2016 | Amendment by applicant (claims and/or description) | 11.05.2018 | Despatch of a communication from the examining division (Time limit: M04) | 17.09.2018 | Reply to a communication from the examining division | 22.10.2018 | Despatch of a communication from the examining division (Time limit: M04) | 18.02.2019 | Reply to a communication from the examining division | 05.03.2019 | Despatch of a communication from the examining division (Time limit: M04) | 04.07.2019 | Reply to a communication from the examining division | 15.07.2019 | Despatch of a communication from the examining division (Time limit: M02) | 11.09.2019 | Reply to a communication from the examining division | 23.04.2020 | Communication of intention to grant the patent | 04.09.2020 | Application deemed to be withdrawn, date of legal effect [2021/07] | 24.09.2020 | Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time [2021/07] | Fees paid | Renewal fee | 25.04.2016 | Renewal fee patent year 03 | 24.04.2017 | Renewal fee patent year 04 | 24.04.2018 | Renewal fee patent year 05 | 23.04.2019 | Renewal fee patent year 06 | Penalty fee | Additional fee for renewal fee | 30.04.2020 | 07 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [XYI]JP2004095672 (FUJI MACHINE MFG) [X] 1-5,7 * the whole document * [Y] 6 [I] 8-10; | [XI]US2010027873 (KAKUDA YOSHIHISA [JP]) [X] 1,2,7,8 * the whole document * [I] 3,4,6; | [X]US2003227617 (YOSHIDA MINORU [JP], et al) [X] 1,7 * abstract * * paragraphs [0045] , [0046] *; | [Y]US2006165274 (AKIYAMA YOSHIHIRO [JP], et al) [Y] 6 * abstract * * paragraph [0028] *; | [A]EP2413132 (VIT [FR]) [A] 1,7 * the whole document * | Examination | US2007218737 | JP2001153640 | JP2007311711 | by applicant | FR1353275 |