EP3167298 - METHOD FOR TESTING A HIGH-POWER SEMICONDUCTOR ELEMENT [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 01.03.2024 Database last updated on 24.08.2024 | |
Former | The patent has been granted Status updated on 24.03.2023 | ||
Former | Grant of patent is intended Status updated on 17.11.2022 | ||
Former | Examination is in progress Status updated on 30.03.2020 | ||
Former | Request for examination was made Status updated on 14.04.2017 | ||
Former | The international publication has been made Status updated on 27.01.2017 | Most recent event Tooltip | 02.08.2024 | Lapse of the patent in a contracting state New state(s): BE | published on 04.09.2024 [2024/36] | Applicant(s) | For all designated states Siemens Energy Global GmbH & Co. KG Otto-Hahn-Ring 6 81739 München / DE | [2021/04] |
Former [2017/35] | For all designated states Siemens Aktiengesellschaft Werner-von-Siemens-Straße 1 80333 München / DE | ||
Former [2017/20] | For all designated states Siemens Aktiengesellschaft Wittelsbacherplatz 2 80333 München / DE | Inventor(s) | 01 /
HAHN, Christoph Haus-Geiger-Strasse 3 91052 Erlangen / DE | 02 /
NEUBERT, Rolf Ludwigstrasse 70a 90736 Fürth / DE | 03 /
WEINDL, Christian Kanonenweg 40A 96450 Coburg / DE | 04 /
WENDLER, Thomas Akazienweg 3 97500 Ebelsbach-Gleisenau / DE | 05 /
LUTHER, Matthias Anna-Pirson-Weg 1C 91052 Erlangen / DE | 06 /
SEMEROW, Anatoli Friedrich-Bauer-Str. 4 b Stockwerk 8 91058 Erlangen / DE | [2023/17] |
Former [2017/20] | 01 /
HAHN, Christoph Haus-Geiger-Strasse 3 91052 Erlangen / DE | ||
02 /
NEUBERT, Rolf Ludwigstrasse 70a 90736 Fürth / DE | |||
03 /
WEINDL, Christian Kanonenweg 40A 96450 Coburg / DE | |||
04 /
WENDLER, Thomas Akazienweg 3 97500 Ebelsbach-Gleisenau / DE | |||
05 /
LUTHER, Matthias Anna-Pirson-Weg 1C 91052 Erlangen / DE | |||
06 /
SEMEROW, Anatoli Herrnbergstrasse 58 91077 Nürnberg / DE | Application number, filing date | 14758950.1 | 04.09.2014 | [2017/20] | WO2014EP68821 | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | WO2016034233 | Date: | 10.03.2016 | Language: | DE | [2016/10] | Type: | A1 Application with search report | No.: | EP3167298 | Date: | 17.05.2017 | Language: | DE | The application published by WIPO in one of the EPO official languages on 10.03.2016 takes the place of the publication of the European patent application. | [2017/20] | Type: | B1 Patent specification | No.: | EP3167298 | Date: | 26.04.2023 | Language: | DE | [2023/17] | Search report(s) | International search report - published on: | EP | 10.03.2016 | Classification | IPC: | G01R31/333, G01R31/26 | [2017/20] | CPC: |
G01R31/263 (EP,US);
G01R31/2608 (CN);
G01R31/3336 (EP);
H02M7/4835 (EP,CN,US);
H02M7/7575 (EP,CN);
Y02E60/60 (EP)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2017/20] | Extension states | BA | Not yet paid | ME | Not yet paid | Title | German: | VERFAHREN ZUM PRÜFEN EINES HOCHLEISTUNGS-HALBLEITERELEMENTS | [2017/20] | English: | METHOD FOR TESTING A HIGH-POWER SEMICONDUCTOR ELEMENT | [2017/20] | French: | PROCÉDÉ DE CONTRÔLE D'UN ÉLÉMENT SEMI-CONDUCTEUR HAUTE PUISSANCE | [2017/20] | Entry into regional phase | 07.02.2017 | National basic fee paid | 07.02.2017 | Designation fee(s) paid | 07.02.2017 | Examination fee paid | Examination procedure | 06.02.2017 | Date on which the examining division has become responsible | 07.02.2017 | Examination requested [2017/20] | 29.08.2017 | Amendment by applicant (claims and/or description) | 02.04.2020 | Despatch of a communication from the examining division (Time limit: M04) | 10.08.2020 | Reply to a communication from the examining division | 18.11.2022 | Communication of intention to grant the patent | 13.03.2023 | Fee for grant paid | 13.03.2023 | Fee for publishing/printing paid | 13.03.2023 | Receipt of the translation of the claim(s) | Opposition(s) | 29.01.2024 | No opposition filed within time limit [2024/14] | Fees paid | Renewal fee | 09.02.2017 | Renewal fee patent year 03 | 19.09.2017 | Renewal fee patent year 04 | 20.09.2018 | Renewal fee patent year 05 | 19.09.2019 | Renewal fee patent year 06 | 18.09.2020 | Renewal fee patent year 07 | 17.09.2021 | Renewal fee patent year 08 | 19.09.2022 | Renewal fee patent year 09 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | CZ | 26.04.2023 | DK | 26.04.2023 | EE | 26.04.2023 | ES | 26.04.2023 | FI | 26.04.2023 | HR | 26.04.2023 | IT | 26.04.2023 | LT | 26.04.2023 | LV | 26.04.2023 | MC | 26.04.2023 | PL | 26.04.2023 | RO | 26.04.2023 | RS | 26.04.2023 | SI | 26.04.2023 | SK | 26.04.2023 | SM | 26.04.2023 | NO | 26.07.2023 | GR | 27.07.2023 | IS | 26.08.2023 | PT | 28.08.2023 | IE | 04.09.2023 | LU | 04.09.2023 | BE | 30.09.2023 | CH | 30.09.2023 | [2024/36] |
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PT | 28.08.2023 | Cited in | International search | [A]EP2443468 (ABB TECHNOLOGY AG [CH]) [A] 1-11* figures 1-5 *; | [X]EP2458725 (ABB RESEARCH LTD [CH]) [X] 1,11 * paragraphs [0054] , [0055] , [0074] * * figures 2,5 *; | [XI]WO2014056540 (SIEMENS AG [DE]) [X] 1,2,4-7,9-11 * page 9, line 6 - line 14 * * page 12, line 19 - line 25 * * page 14, line 4 - page 15, line 31 * * figures 2,11 * [I] 3,8 |