blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Release notes
European Patent Register Assistant
European Patent Register Resource Book
European Patent Register – pocket guide
FAQ - European Patent Register
Federated Register (Flyer)
Global Dossier (Flyer)
Register events
Deep link coverage
Federated Register content
The Patent Information Tour
Fair use charter

Extract from the Register of European Patents

EP About this file: EP3014330

EP3014330 - SAMPLE PROCESSING IMPROVEMENTS FOR MICROSCOPY [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  01.12.2023
Database last updated on 30.09.2024
FormerGrant of patent is intended
Status updated on  13.03.2023
FormerExamination is in progress
Status updated on  27.10.2017
Most recent event   Tooltip08.08.2024Lapse of the patent in a contracting state
New state(s): SE		published on 11.09.2024  [2024/37]
Applicant(s)For all designated states
Alentic Microscience Inc.
1344 Summer Street
Halifax, Nova Scotia B3H 0A8 / CA
[2016/18]
Inventor(s)01 / FINE, Alan Marc
57 Bayview Crescent
Prospect, Nova Scotia B3T 2C9 / CA
02 / MACAULAY, Hershel
135 Eaglewood Drive
Bedford, Nova Scotia B4A 3B6 / CA
03 / HYMES-VANDERMEULEN, Noah
128 Glenforest Drive
Halifax, Nova Scotia B3M 1J1 / CA
 [2016/18]
Representative(s)Fish & Richardson P.C.
Highlight Business Towers
Mies-van-der-Rohe-Straße 8
80807 München / DE
[2024/01]
Former [2016/18]Conroy, John
Fish & Richardson P.C.
Highlight Business Towers
Mies-van-der-Rohe-Straße 8
80807 München / DE
Application number, filing date14817587.025.06.2014
[2016/18]
WO2014CA50610
Priority number, dateUS201361839735P26.06.2013         Original published format: US 201361839735 P
[2016/18]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2014205576
Date:31.12.2014
Language:EN
[2014/53]
Type: A1 Application with search report 
No.:EP3014330
Date:04.05.2016
Language:EN
The application published by WIPO in one of the EPO official languages on 31.12.2014 takes the place of the publication of the European patent application.
[2016/18]
Type: B1 Patent specification 
No.:EP3014330
Date:03.01.2024
Language:EN
[2024/01]
Search report(s)International search report - published on:CA31.12.2014
(Supplementary) European search report - dispatched on:EP26.01.2017
ClassificationIPC:G02B21/34, G01N21/59, G01N15/14, G01N1/40, G01N33/49, G01N15/00, G01N35/00, G01N15/06
[2023/09]
CPC:
G02B21/34 (EP,US); G01N1/28 (US); G01N1/4077 (EP,US);
G01N15/0612 (EP,US); G01N15/1468 (EP,US); G01N21/59 (EP,US);
G01N33/49 (EP,US); G01N15/0606 (US); G01N2015/016 (EP,US);
G01N2015/1029 (US); G01N2015/1486 (EP,US); G01N35/00029 (EP,US) (-)
Former IPC [2017/09]G02B21/26, G01N1/28, G01N15/00, G01N15/02, G01N15/06, G01N21/59, G01N33/483, G01N1/14, B01L3/00, G01N35/00, G01N1/31
Former IPC [2016/18]G02B21/26, G01N1/28, G01N15/00, G01N15/02, G01N15/06, G01N21/59, G01N33/483, G01N1/14
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2016/18]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:VERBESSERUNGEN ZUR PROBENVERARBEITUNG FÜR MIKROSKOPIE[2016/18]
English:SAMPLE PROCESSING IMPROVEMENTS FOR MICROSCOPY[2016/18]
French:AMÉLIORATIONS DE TRAITEMENT D'ÉCHANTILLON DESTINÉES À LA MICROSCOPIE[2016/18]
Entry into regional phase26.01.2016National basic fee paid 
26.01.2016Search fee paid 
26.01.2016Designation fee(s) paid 
26.01.2016Examination fee paid 
Examination procedure26.01.2016Examination requested  [2016/18]
18.08.2017Amendment by applicant (claims and/or description)
26.10.2017Despatch of a communication from the examining division (Time limit: M06)
30.04.2018Reply to a communication from the examining division
29.04.2020Despatch of a communication from the examining division (Time limit: M04)
31.08.2020Reply to a communication from the examining division
02.05.2022Despatch of a communication from the examining division (Time limit: M04)
29.08.2022Reply to a communication from the examining division
14.03.2023Communication of intention to grant the patent
24.07.2023Fee for grant paid
24.07.2023Fee for publishing/printing paid
24.07.2023Receipt of the translation of the claim(s)
Fees paidRenewal fee
27.06.2016Renewal fee patent year 03
27.06.2017Renewal fee patent year 04
27.06.2018Renewal fee patent year 05
27.06.2019Renewal fee patent year 06
29.06.2020Renewal fee patent year 07
28.06.2021Renewal fee patent year 08
28.11.2022Renewal fee patent year 09
27.11.2023Renewal fee patent year 10
Penalty fee
Additional fee for renewal fee
30.06.202209   M06   Fee paid on   28.11.2022
30.06.202310   M06   Fee paid on   27.11.2023
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT03.01.2024
BG03.01.2024
CZ03.01.2024
ES03.01.2024
HR03.01.2024
LT03.01.2024
LV03.01.2024
NL03.01.2024
PL03.01.2024
SE03.01.2024
NO03.04.2024
RS03.04.2024
GR04.04.2024
IS03.05.2024
PT03.05.2024
[2024/37]
Former [2024/36]AT03.01.2024
BG03.01.2024
CZ03.01.2024
ES03.01.2024
HR03.01.2024
LT03.01.2024
LV03.01.2024
NL03.01.2024
PL03.01.2024
NO03.04.2024
RS03.04.2024
GR04.04.2024
IS03.05.2024
PT03.05.2024
Former [2024/35]AT03.01.2024
BG03.01.2024
CZ03.01.2024
ES03.01.2024
HR03.01.2024
LT03.01.2024
NL03.01.2024
NO03.04.2024
RS03.04.2024
GR04.04.2024
IS03.05.2024
Former [2024/34]BG03.01.2024
ES03.01.2024
HR03.01.2024
LT03.01.2024
NL03.01.2024
NO03.04.2024
RS03.04.2024
GR04.04.2024
IS03.05.2024
Former [2024/33]ES03.01.2024
LT03.01.2024
NL03.01.2024
NO03.04.2024
IS03.05.2024
Former [2024/32]ES03.01.2024
NL03.01.2024
IS03.05.2024
Former [2024/31]ES03.01.2024
NL03.01.2024
Former [2024/24]ES03.01.2024
Documents cited:Search[XI]US3447863  (PATTERSON JAMES A) [X] 1,6 * figures 1,2 * [I] 2-5;
 [XI]US4950455  (SMITH KENDALL O [US]) [X] 1,6 * figures 4-6 * [I] 2-5;
 [I]US6180314  (BERNDT KLAUS W [US]) [I] 1-13 * figures 2, 3 *;
 [X]US6302985  (TAKAHASHI KENJI [JP], et al) [X] 1-6 * figures 1-5 *;
 [I]US2013052331  (KRAM BRIAN HOWARD [US], et al) [I] 1-13 * figures 1-7 *;
 [A]  - AYDOGAN OZCAN ET AL, "Ultra wide-field lens-free monitoring of cells on-chip", LAB ON A CHIP, (20080101), vol. 8, no. 1, doi:10.1039/b713695a, ISSN 1473-0197, page 98, XP055051174 [A] 1-13 * figure 1a *

DOI:   http://dx.doi.org/10.1039/B713695A
International search[A]US6723290  (WARDLAW STEPHEN C [US]);
 [A]US2007087442  (WARDLAW STEPHEN C [US]);
 [A]US2007243117  (WARDLAW STEPHEN C [US]);
 [X]EP2330215  (CLONDIAG GMBH [DE]);
 [A]EP2554987  (ABBOTT POINT OF CARE INC [US])
ExaminationUS2008213804
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.