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Extract from the Register of European Patents

EP About this file: EP3213093

EP3213093 - SYSTEM AND METHOD FOR ANALYSIS OF A MICROWAVE FREQUENCY SIGNAL BY IMAGING [Right-click to bookmark this link]
Former [2017/36]SYSTEM FOR ANALYSIS OF A MICROWAVE FREQUENCY SIGNAL BY IMAGING
[2021/17]
StatusNo opposition filed within time limit
Status updated on  12.08.2022
Database last updated on 03.09.2024
FormerThe patent has been granted
Status updated on  03.09.2021
FormerGrant of patent is intended
Status updated on  28.04.2021
FormerRequest for examination was made
Status updated on  04.08.2017
FormerThe international publication has been made
Status updated on  19.04.2017
Most recent event   Tooltip27.04.2024Lapse of the patent in a contracting state
New state(s): MK		published on 29.05.2024  [2024/22]
Applicant(s)For all designated states
THALES
Tour Carpe Diem
Place des Corolles
Esplanade Nord
92400 Courbevoie / FR
For all designated states
Universität Leipzig
Ritterstrasse 26
04109 Leipzig / DE
[2017/36]
Inventor(s)01 / CHIPAUX, Mayeul
Tammingasingle 15
9951 BM, PAYS-BAS / NL
02 / TORAILLE, Loïc
16 rue Brézin
F-75014 Paris / FR
03 / DEBUISSCHERT, Thierry
11 bis rue de Versailles
F-91400 Orsay / FR
04 / LARAT, Christian
13 Rue de Buci
F-75006 Paris / FR
05 / MORVAN, Loic
1 Rue Guy Moquet
F-91400 Orsay / FR
06 / MEIJER, Jan
Hirschgraben 28
44892 Bochum / DE
07 / PEZZAGNA, Sébastien
Arndtstrasse 30B
04275 Leipzig / DE
 [2017/42]
Former [2017/40]01 / CHIPAUX, Mayeul
Tammingasingle 15
9951 BM, PAYS-BAS / NL
02 / TORAILLE, Loïc
16 rue Brézin
F-75014 Paris / FR
03 / DEBUISSCHERT, Thierry
11 bis rue de Versailles
F-91400 Orsay / FR
04 / LARDAT, Christian
13 Rue de Buci
F-75006 Paris / FR
05 / MORVAN, Loic
1 Rue Guy Moquet
F-91400 Orsay / FR
06 / MEIJER, Jan
Hirschgraben 28
44892 Bochum / DE
07 / PEZZAGNA, Sébastien
Arndtstrasse 30B
04275 Leipzig / DE
Former [2017/36]01 / CHIPAUX, Mayeul
14 Rue Jean Minjoz
F-75014 Paris / FR
02 / TORAILLE, Loïc
10 Rue Xaintrailles
F-75013 Paris / FR
03 / DEBUISSCHERT, Thierry
17 Rue Etienne Bauer
F-91400 Orsay / FR
04 / LARDAT, Christian
13 Rue de Buci
F-75006 Paris / FR
05 / MORVAN, Loic
1 Rue Guy Moquet
F-91400 Orsay / FR
06 / MEIJER, Jan
Hirschgraben 28
44892 Bochum / DE
07 / PEZZAGNA, Sébastien
Arndtstrasse 30B
04275 Leipzig / DE
Representative(s)Atout PI Laplace
Immeuble Up On
25 Boulevard Romain Rolland
CS 40072
75685 Paris Cedex 14 / FR
[N/P]
Former [2021/40]Marks & Clerk France
Immeuble "Visium"
22, avenue Aristide Briand
94117 Arcueil Cedex / FR
Former [2017/36]Joubert, Cécile
Marks & Clerk France
Counseils en Propriete Industrielle
Immeuble "Visium"
22, avenue Aristide Briand
94117 Arcueil Cedex / FR
Application number, filing date15787937.022.10.2015
[2017/36]
WO2015EP74544
Priority number, dateFR2014000242928.10.2014         Original published format: FR 1402429
[2017/36]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report
No.:WO2016066532
Date:06.05.2016
Language:FR
[2016/18]
Type: A1 Application with search report 
No.:EP3213093
Date:06.09.2017
Language:FR
The application published by WIPO in one of the EPO official languages on 06.05.2016 takes the place of the publication of the European patent application.
[2017/36]
Type: B1 Patent specification 
No.:EP3213093
Date:06.10.2021
Language:FR
[2021/40]
Search report(s)International search report - published on:EP06.05.2016
ClassificationIPC:G01R23/17, G01R23/163
[2017/36]
CPC:
G01R23/163 (EP,US); G01R23/17 (EP,US); G01R29/0878 (US);
G01R33/32 (US); G01R33/60 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/36]
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
TitleGerman:SYSTEM UND VERFAHREN ZUR ANALYSE EINES MIKROWELLENFREQUENZSIGNALS DURCH ABBILDUNG[2021/17]
English:SYSTEM AND METHOD FOR ANALYSIS OF A MICROWAVE FREQUENCY SIGNAL BY IMAGING[2021/17]
French:SYSTÈME ET PROCÉDÉ D'ANALYSE D'UN SIGNAL HYPERFRÉQUENCE PAR IMAGERIE[2021/17]
Former [2017/36]SYSTEM ZUR ANALYSE EINES MIKROWELLENFREQUENZSIGNALS DURCH ABBILDUNG
Former [2017/36]SYSTEM FOR ANALYSIS OF A MICROWAVE FREQUENCY SIGNAL BY IMAGING
Former [2017/36]SYSTÈME D'ANALYSE D'UN SIGNAL HYPERFRÉQUENCE PAR IMAGERIE
Entry into regional phase19.04.2017National basic fee paid 
19.04.2017Designation fee(s) paid 
19.04.2017Examination fee paid 
Examination procedure19.04.2017Examination requested  [2017/36]
19.04.2017Date on which the examining division has become responsible
25.09.2017Amendment by applicant (claims and/or description)
29.04.2021Communication of intention to grant the patent
27.08.2021Fee for grant paid
27.08.2021Fee for publishing/printing paid
27.08.2021Receipt of the translation of the claim(s)
Opposition(s)07.07.2022No opposition filed within time limit [2022/37]
Fees paidRenewal fee
11.10.2017Renewal fee patent year 03
11.10.2018Renewal fee patent year 04
15.10.2019Renewal fee patent year 05
14.10.2020Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU22.10.2015
AL06.10.2021
AT06.10.2021
CY06.10.2021
CZ06.10.2021
DK06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
MK06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SI06.10.2021
SK06.10.2021
SM06.10.2021
IE22.10.2021
LU22.10.2021
BE31.10.2021
CH31.10.2021
LI31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
[2024/22]
Former [2023/30]HU22.10.2015
AL06.10.2021
AT06.10.2021
CY06.10.2021
CZ06.10.2021
DK06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SI06.10.2021
SK06.10.2021
SM06.10.2021
IE22.10.2021
LU22.10.2021
BE31.10.2021
CH31.10.2021
LI31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2023/29]HU22.10.2015
AL06.10.2021
AT06.10.2021
CZ06.10.2021
DK06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SI06.10.2021
SK06.10.2021
SM06.10.2021
IE22.10.2021
LU22.10.2021
BE31.10.2021
CH31.10.2021
LI31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2023/01]AL06.10.2021
AT06.10.2021
CZ06.10.2021
DK06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SI06.10.2021
SK06.10.2021
SM06.10.2021
IE22.10.2021
LU22.10.2021
BE31.10.2021
CH31.10.2021
LI31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/49]AL06.10.2021
AT06.10.2021
CZ06.10.2021
DK06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SK06.10.2021
SM06.10.2021
IE22.10.2021
LU22.10.2021
BE31.10.2021
CH31.10.2021
LI31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/48]AT06.10.2021
CZ06.10.2021
DK06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SK06.10.2021
SM06.10.2021
IE22.10.2021
LU22.10.2021
BE31.10.2021
CH31.10.2021
LI31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/37]AT06.10.2021
CZ06.10.2021
DK06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SK06.10.2021
SM06.10.2021
LU22.10.2021
BE31.10.2021
CH31.10.2021
LI31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/35]AT06.10.2021
CZ06.10.2021
DK06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SK06.10.2021
SM06.10.2021
LU22.10.2021
BE31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/34]AT06.10.2021
EE06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RO06.10.2021
RS06.10.2021
SE06.10.2021
SM06.10.2021
BE31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/33]AT06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
MC06.10.2021
NL06.10.2021
PL06.10.2021
RS06.10.2021
SE06.10.2021
SM06.10.2021
BE31.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/25]AT06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
NL06.10.2021
PL06.10.2021
RS06.10.2021
SE06.10.2021
BG06.01.2022
NO06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/24]AT06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
NL06.10.2021
PL06.10.2021
RS06.10.2021
SE06.10.2021
BG06.01.2022
GR07.01.2022
IS06.02.2022
PT07.02.2022
Former [2022/23]AT06.10.2021
ES06.10.2021
FI06.10.2021
HR06.10.2021
LT06.10.2021
LV06.10.2021
PL06.10.2021
RS06.10.2021
BG06.01.2022
PT07.02.2022
Former [2022/22]AT06.10.2021
FI06.10.2021
LT06.10.2021
RS06.10.2021
BG06.01.2022
Former [2022/21]AT06.10.2021
RS06.10.2021
BG06.01.2022
Former [2022/19]BG06.01.2022
Cited inInternational search[A]WO2013188732  (UNIV COLUMBIA [US]) [A] 1-19 * page 3, line 15 - line 21 * * page 5, line 9 - page 11 * * page 9, line 9 - page 16, line 12; figures 1-6 *;
 [XP]  - CHIPAUX MAYEUL ET AL, "Nitrogen vacancies (NV) centers in diamond for magnetic sensors and quantum sensing", PROCEEDINGS OF SPIE, S P I E - INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, US, (20150115), vol. 9370, doi:10.1117/12.2084082, ISSN 0277-786X, ISBN 978-1-62841-730-2, pages 93701V - 93701V, XP060044828 [XP] 1-19 * the whole document *

DOI:   http://dx.doi.org/10.1117/12.2084082
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.