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Extract from the Register of European Patents

EP About this file: EP3230684

EP3230684 - DEPTH-SCANNING MICROSCOPE AND METHOD FOR OPERATING A DEPTH-SCANNING MICROSCOPE [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.10.2021
Database last updated on 03.09.2024
FormerThe patent has been granted
Status updated on  23.10.2020
FormerGrant of patent is intended
Status updated on  14.10.2020
FormerExamination is in progress
Status updated on  08.09.2020
FormerGrant of patent is intended
Status updated on  11.05.2020
FormerExamination is in progress
Status updated on  16.11.2018
FormerRequest for examination was made
Status updated on  15.09.2017
FormerThe international publication has been made
Status updated on  21.06.2017
Most recent event   Tooltip22.07.2022Lapse of the patent in a contracting state
New state(s): BE		published on 24.08.2022  [2022/34]
Applicant(s)For all designated states
Universität Kassel
Mönchebergstrasse 19
34125 Kassel / DE
[2017/42]
Inventor(s)01 / LEHMANN, Peter
Steinbreite 11c
37085 Göttingen / DE
02 / TERESCHENKO, Stanislav
Im Ährenfeld 2
34134 Kassel / DE
 [2017/42]
Representative(s)Kleine, Hubertus, et al
Loesenbeck - Specht - Dantz
Patent- und Rechtsanwälte
Am Zwinger 2
33602 Bielefeld / DE
[2017/42]
Application number, filing date15804828.007.12.2015
[2017/42]
WO2015EP78778
Priority number, dateDE20141011815108.12.2014         Original published format: DE102014118151
[2017/42]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO2016091783
Date:16.06.2016
Language:DE
[2016/24]
Type: A1 Application with search report 
No.:EP3230684
Date:18.10.2017
Language:DE
The application published by WIPO in one of the EPO official languages on 16.06.2016 takes the place of the publication of the European patent application.
[2017/42]
Type: B1 Patent specification 
No.:EP3230684
Date:25.11.2020
Language:DE
[2020/48]
Search report(s)International search report - published on:EP16.06.2016
ClassificationIPC:G01B9/02, G01B11/24, G02B21/00, G02B21/24
[2017/42]
CPC:
G02B21/245 (EP); G01B11/2441 (EP); G01B9/02027 (EP);
G01B9/02076 (EP); G01B9/0209 (EP); G02B21/0004 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/42]
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
MDNot yet paid
TitleGerman:TIEFENSCANNENDES MIKROSKOP UND VERFAHREN ZUM BETREIBEN EINES TIEFENSCANNENDEN MIKROSKOPS[2017/42]
English:DEPTH-SCANNING MICROSCOPE AND METHOD FOR OPERATING A DEPTH-SCANNING MICROSCOPE[2017/42]
French:MICROSCOPE À BALAYAGE EN PROFONDEUR ET PROCÉDÉ POUR FAIRE FONCTIONNER UN MICROSCOPE À BALAYAGE EN PROFONDEUR[2017/42]
Entry into regional phase20.06.2017National basic fee paid 
20.06.2017Designation fee(s) paid 
20.06.2017Examination fee paid 
Examination procedure20.06.2017Examination requested  [2017/42]
20.06.2017Date on which the examining division has become responsible
24.01.2018Amendment by applicant (claims and/or description)
14.11.2018Despatch of a communication from the examining division (Time limit: M06)
22.05.2019Reply to a communication from the examining division
12.05.2020Communication of intention to grant the patent
07.09.2020Disapproval of the communication of intention to grant the patent by the applicant or resumption of examination proceedings by the EPO
07.09.2020Fee for grant paid
07.09.2020Fee for publishing/printing paid
14.10.2020Information about intention to grant a patent
14.10.2020Receipt of the translation of the claim(s)
Opposition(s)26.08.2021No opposition filed within time limit [2021/44]
Fees paidRenewal fee
07.12.2017Renewal fee patent year 03
11.12.2018Renewal fee patent year 04
11.12.2019Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU07.12.2015
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Cited inInternational search[A]US2002196450  (OLSZAK ARTUR [US], et al) [A] 1-6,9-12 * figures 2,7 *;
 [X]US2010128276  (DE GROOT PETER [US], et al) [X] 1,10 * paragraph [0177] - paragraph [0178]; figure 1 * * paragraph [0201]; figure 9 *;
 [A]US2011128551  (FLEISCHER MATTHIAS [DE], et al) [A] 7,8,13-15* paragraph [0003]; figure 1 *;
 [I]US2013265585  (FANG-YEN CHRISTOPHER [US], et al) [I] 1-6,9-12 * paragraph [0263]; figures 16,14b * * paragraph [0202] * * paragraph [0158] - paragraph [0159] * * paragraphs [0172] , [ 174] * * paragraphs [0283] , [0289] * * paragraph [0140]; figure 8a * * paragraphs [0003] , [0004] , [0066] , [0252]; figure 38 * * paragraph [0115]; figure 1 *;
 [I]  - OSAMI SASKI ET AL, "Sinusoidal phase modulating interferometry for surface profile measurement", APPLIED OPTICS, (19860915), vol. 25, no. 18, pages 3137 - 3140, XP055081322 [I] 1,10 * title;; figure 1 *

DOI:   http://dx.doi.org/10.1364/AO.25.003137
 [A]  - JOANNA SCHMIT, "High-stability white-light interferometry with reference signal for real-time correction of scanning errors", OPTICAL ENGINEERING, (20030101), vol. 42, no. 1, doi:10.1117/1.1523942, ISSN 0091-3286, page 54, XP055049348 [A] 7,8,13-15 * page 58, paragraph 2; figure 2 *

DOI:   http://dx.doi.org/10.1117/1.1523942
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