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Extract from the Register of European Patents

EP About this file: EP3187856

EP3187856 - BIREFRINGENCE MEASUREMENT DEVICE AND BIREFRINGENCE MEASUREMENT METHOD [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  25.02.2022
Database last updated on 20.07.2024
FormerThe patent has been granted
Status updated on  19.03.2021
FormerGrant of patent is intended
Status updated on  15.11.2020
FormerRequest for examination was made
Status updated on  02.06.2017
FormerThe international publication has been made
Status updated on  04.03.2017
Most recent event   Tooltip14.06.2024Lapse of the patent in a contracting state
New state(s): TR
published on 17.07.2024  [2024/29]
Applicant(s)For all designated states
The Doshisha
601, Gembu-cho
Karasuma-Higashi-iru
Imadegawa-dori
Kamigyo-ku
Kyoto-shi, Kyoto 602-8580 / JP
For all designated states
National Institute of Advanced Industrial Science and Technology
3-1 Kasumigaseki 1-chome
Chiyoda-ku
Tokyo 100-8921 / JP
[N/P]
Former [2022/01]For all designated states
The Doshisha
601, Gembu-cho
Karasuma-Higashi-iru
Imadegawa-dori
Kamigyo-ku
Kyoto-shi, Kyoto 602-8580 / JP
For all designated states
National Institute Of Advanced Industrial Science and Technology
3-1 Kasumigaseki 1-chome
Chiyoda-ku
Tokyo 100-8921 / JP
Former [2017/27]For all designated states
The Doshisha
601, Genbu-cho Karasuma-Higashi-iru Imadegawa-dori Kamigyo-ku
Kyoto-shi, Kyoto 602-8580 / JP
For all designated states
National Institute Of Advanced Industrial Science
3-1 Kasumigaseki 1-chome
Chiyoda-ku
Tokyo 100-8921 / JP
Inventor(s)01 / EMOTO, Akira
c/o Doshisha University
1-3 Miyakodani, Tatara
Kyotanabe-shi, Kyoto 610-0394 / JP
02 / OTANI, Naoki
c/o Doshisha University
1-3 Miyakodani, Tatara
Kyotanabe-shi, Kyoto 610-0394 / JP
03 / FUKUDA, Takashi
c/o National Institute of Advanced
Industrial Science and Technology
Tsukuba Central 5
1-1 Higashi 1-chome
Tsukuba-shi, Ibaraki 305-8565 / JP
 [2017/51]
Former [2017/27]01 / EMOTO, Akira
c/o Doshisha University
1-3 Miyakodani
Tatara
Kyotanabe-shi Kyoto 610-0394 / JP
02 / OTANI, Naoki
c/o Doshisha University
1-3 Miyakodani
Tatara
Kyotanabe-shi Kyoto 610-0394 / JP
03 / FUKUDA, Takashi
c/o National Institute of Advanced Industrial
Science and Technology
Tsukuba Central 5
1-1 Higashi 1-chome
Tsukuba-shi Ibaraki 305-8565 / JP
Representative(s)Pfenning, Meinig & Partner mbB
Patent- und Rechtsanwälte
Joachimsthaler Straße 10-12
10719 Berlin / DE
[2021/16]
Former [2017/27]Pfenning, Meinig & Partner mbB
Patent- und Rechtsanwälte
Joachimsthaler Straße 12
10719 Berlin / DE
Application number, filing date15835242.711.08.2015
[2017/27]
WO2015JP72783
Priority number, dateJP2014017115926.08.2014         Original published format: JP 2014171159
[2017/27]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2016031567
Date:03.03.2016
Language:JA
[2016/09]
Type: A1 Application with search report 
No.:EP3187856
Date:05.07.2017
Language:EN
[2017/27]
Type: B1 Patent specification 
No.:EP3187856
Date:21.04.2021
Language:EN
[2021/16]
Type: B8 Corrected title page of specification 
No.:EP3187856
Date:12.01.2022
[2022/02]
Search report(s)International search report - published on:JP03.03.2016
(Supplementary) European search report - dispatched on:EP26.03.2018
ClassificationIPC:G01N21/23
[2017/27]
CPC:
G01N21/23 (EP,KR,US); G01N2201/0683 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/27]
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
TitleGerman:DOPPELBRECHUNGSMESSVORRICHTUNG UND DOPPELBRECHUNGSMESSVERFAHREN[2020/48]
English:BIREFRINGENCE MEASUREMENT DEVICE AND BIREFRINGENCE MEASUREMENT METHOD[2017/27]
French:DISPOSITIF DE MESURE DE LA BIRÉFRINGENCE ET PROCÉDÉ DE MESURE DE LA BIRÉFRINGENCE[2017/27]
Former [2017/27]DOPPELBRECHUNGSMESSVORRICHTUNG UND DOPPELBRECHUNGMESSVERFAHREN
Entry into regional phase03.03.2016Translation filed 
03.03.2017National basic fee paid 
03.03.2017Search fee paid 
03.03.2017Designation fee(s) paid 
03.03.2017Examination fee paid 
Examination procedure03.03.2017Examination requested  [2017/27]
03.03.2017Date on which the examining division has become responsible
08.10.2018Amendment by applicant (claims and/or description)
16.11.2020Communication of intention to grant the patent
15.03.2021Fee for grant paid
15.03.2021Fee for publishing/printing paid
15.03.2021Receipt of the translation of the claim(s)
Opposition(s)24.01.2022No opposition filed within time limit [2022/13]
Fees paidRenewal fee
29.08.2017Renewal fee patent year 03
28.08.2018Renewal fee patent year 04
27.08.2019Renewal fee patent year 05
28.08.2020Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU11.08.2015
AL21.04.2021
AT21.04.2021
CY21.04.2021
CZ21.04.2021
DK21.04.2021
EE21.04.2021
ES21.04.2021
FI21.04.2021
HR21.04.2021
IT21.04.2021
LT21.04.2021
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MC21.04.2021
MK21.04.2021
NL21.04.2021
PL21.04.2021
RO21.04.2021
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SE21.04.2021
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SK21.04.2021
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TR21.04.2021
BG21.07.2021
NO21.07.2021
GR22.07.2021
GB11.08.2021
IE11.08.2021
LU11.08.2021
IS21.08.2021
PT23.08.2021
BE31.08.2021
CH31.08.2021
LI31.08.2021
[2024/29]
Former [2024/22]HU11.08.2015
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CZ21.04.2021
DK21.04.2021
EE21.04.2021
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FI21.04.2021
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MC21.04.2021
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SM21.04.2021
BG21.07.2021
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IS21.08.2021
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SE21.04.2021
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SK21.04.2021
SM21.04.2021
BG21.07.2021
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GR22.07.2021
GB11.08.2021
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IS21.08.2021
PT23.08.2021
BE31.08.2021
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EE21.04.2021
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SM21.04.2021
BG21.07.2021
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GB11.08.2021
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PT23.08.2021
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GR22.07.2021
GB11.08.2021
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IS21.08.2021
PT23.08.2021
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SM21.04.2021
BG21.07.2021
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GB11.08.2021
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SI21.04.2021
SK21.04.2021
SM21.04.2021
BG21.07.2021
NO21.07.2021
GR22.07.2021
LU11.08.2021
IS21.08.2021
PT23.08.2021
BE31.08.2021
CH31.08.2021
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MC21.04.2021
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PL21.04.2021
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SE21.04.2021
SI21.04.2021
SK21.04.2021
SM21.04.2021
BG21.07.2021
NO21.07.2021
GR22.07.2021
LU11.08.2021
IS21.08.2021
PT23.08.2021
CH31.08.2021
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MC21.04.2021
NL21.04.2021
PL21.04.2021
RO21.04.2021
RS21.04.2021
SE21.04.2021
SK21.04.2021
SM21.04.2021
BG21.07.2021
NO21.07.2021
GR22.07.2021
LU11.08.2021
IS21.08.2021
PT23.08.2021
CH31.08.2021
LI31.08.2021
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DK21.04.2021
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SM21.04.2021
BG21.07.2021
NO21.07.2021
GR22.07.2021
LU11.08.2021
IS21.08.2021
PT23.08.2021
CH31.08.2021
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Former [2022/21]AT21.04.2021
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SM21.04.2021
BG21.07.2021
NO21.07.2021
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PT23.08.2021
CH31.08.2021
LI31.08.2021
IS22.12.2021
Former [2022/18]AT21.04.2021
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DK21.04.2021
EE21.04.2021
ES21.04.2021
FI21.04.2021
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LT21.04.2021
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MC21.04.2021
NL21.04.2021
PL21.04.2021
RO21.04.2021
RS21.04.2021
SE21.04.2021
SK21.04.2021
SM21.04.2021
BG21.07.2021
NO21.07.2021
GR22.07.2021
PT23.08.2021
IS22.12.2021
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CZ21.04.2021
DK21.04.2021
EE21.04.2021
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LT21.04.2021
LV21.04.2021
NL21.04.2021
PL21.04.2021
RO21.04.2021
RS21.04.2021
SE21.04.2021
SK21.04.2021
SM21.04.2021
BG21.07.2021
NO21.07.2021
GR22.07.2021
PT23.08.2021
IS22.12.2021
Former [2022/09]AT21.04.2021
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Documents cited:Search[Y]EP1429128  (CANON KK [JP]) [Y] 1-10 * paragraph [0001] * * paragraphs [0019] - [0020] *;
 [Y]  - YURI GORODETSKI ET AL, "Space-variant polarization manipulation for far-field polarimetry by use of subwavelength dielectric gratings", OPTICS LETTERS, (20050901), vol. 30, no. 17, doi:10.1364/OL.30.002245, ISSN 0146-9592, pages 2245 - 5440, XP055458766 [Y] 1-10 * the whole document *

DOI:   http://dx.doi.org/10.1364/OL.30.002245
 [A]  - GABRIEL BIENER ET AL, "Near-field Fourier transform polarimetry by use of a discrete space-variant subwavelength grating", JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A, US, (20031001), vol. 20, no. 10, doi:10.1364/JOSAA.20.001940, ISSN 1084-7529, pages 1940 - 5440, XP055458768 [A] 1-10 * page 1940 - page 1942 *

DOI:   http://dx.doi.org/10.1364/JOSAA.20.001940
 [A]  - ISMO VARTIAINEN ET AL, "Surface-relief polarization gratings for visible light", OPT. EXPRESS, (20101013), vol. 16, no. 18, pages 22850 - 22858, XP055459113 [A] 1-10 * page 22852, paragraph 2 - page 22853, paragraph 2 *
International search[A]JPS5887445  (UNITIKA LTD) [A] 1-10 * , fig. 3 (Family: none) *;
 [A]JP2005257508  (NOKODAI TLO KK) [A] 1-10* , fig. 1 (Family: none) *;
 [A]  - HIROSHI ONO, "Diffraction Properties in Polarization Holography Written by Elliptical Polarized Light", Japanese Journal of Applied Physics, (20100000), vol. 49, page 032502, XP055409602 [A] 1-10

DOI:   http://dx.doi.org/10.1143/JJAP.49.032502
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.