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Extract from the Register of European Patents

EP About this file: EP3203216

EP3203216 - LUMINESCENCE MEASURING DEVICE AND AUTOMATIC ANALYSIS DEVICE [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  07.06.2019
Database last updated on 15.06.2024
FormerRequest for examination was made
Status updated on  07.07.2017
FormerThe international publication has been made
Status updated on  01.02.2017
Most recent event   Tooltip07.06.2019Withdrawal of applicationpublished on 10.07.2019  [2019/28]
Applicant(s)For all designated states
Jeol Ltd.
1-2, Musashino 3-chome
Akishima-shi
Tokyo 196-8558 / JP
[2017/32]
Inventor(s)01 / Nakamura Mizuki
c/o JEOL Ltd.
3-1-2 Musashino
Akishima-shi Tokyo 196-8558 / JP
02 / Takasu Shinichi
c/o JEOL Ltd.
3-1-2 Musashino
Akishima-shi Tokyo 196-8558 / JP
 [2017/32]
Representative(s)Boult Wade Tennant LLP
Salisbury Square House
8 Salisbury Square
London EC4Y 8AP / GB
[N/P]
Former [2017/32]Boult Wade Tennant
Verulam Gardens
70 Gray's Inn Road
London WC1X 8BT / GB
Application number, filing date15847476.701.10.2015
[2017/32]
WO2015JP77964
Priority number, dateJP2014020365602.10.2014         Original published format: JP 2014203656
[2017/32]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2016052704
Date:07.04.2016
Language:JA
[2016/14]
Type: A1 Application with search report 
No.:EP3203216
Date:09.08.2017
Language:EN
[2017/32]
Search report(s)International search report - published on:JP07.04.2016
(Supplementary) European search report - dispatched on:EP26.03.2018
ClassificationIPC:G01N21/76, G01N35/02, G01N35/04
[2017/32]
CPC:
G01N21/76 (EP,US); G01N21/01 (US); G01N35/02 (EP,US);
G01N35/04 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/32]
TitleGerman:LUMINESZENZMESSVORRICHTUNG UND AUTOMATISCHE ANALYSEVORRICHTUNG[2017/32]
English:LUMINESCENCE MEASURING DEVICE AND AUTOMATIC ANALYSIS DEVICE[2017/32]
French:DISPOSITIF DE MESURE DE LUMINESCENCE ET DISPOSITIF D'ANALYSE AUTOMATIQUE[2017/32]
Entry into regional phase29.03.2017Translation filed 
29.03.2017National basic fee paid 
29.03.2017Search fee paid 
29.03.2017Designation fee(s) paid 
29.03.2017Examination fee paid 
Examination procedure29.03.2017Examination requested  [2017/32]
29.03.2017Date on which the examining division has become responsible
18.10.2018Amendment by applicant (claims and/or description)
31.05.2019Application withdrawn by applicant  [2019/28]
Fees paidRenewal fee
25.10.2017Renewal fee patent year 03
24.10.2018Renewal fee patent year 04
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Documents cited:Search[XAI]US4213703  (GREENE MALBONE W [US], et al) [X] 1 * column 2, line 66 - column 4, line 7 * * column 4, line 63 - column 6, line 3 * * column 7, lines 24-27 * * figures 2-5 * [A] 2-4,6-10 [I] 5;
 [XA]US2003148536  (LIANG CHI-WANG [TW], et al) [X] 1 * paragraphs [0024] - [0026] - [0 30] - [0034] - [0 42] - [0044] * * figures 1, 4, 6 * [A] 2-10;
 [XA]JP2012002733  (TOSOH CORP) [X] 1,2 * paragraphs [0028] - [0031] * * figures 1-5 *[A] 3-10
International search[XA]JP2000146825  (MEIDENSHA ELECTRIC MFG CO LTD) [X] 1 * , claims 1, 2; paragraphs [0023] to [0029]; fig. 2 (Family: none) * [A] 2-10;
 [Y]WO2004083857  (SHIZUOKA PREFECTURE [JP], et al) [Y] 3-5, 7-10 * , claim 8; paragraphs [0059] to [0078]; fig. 1, 2 & JP 2004-279276 A *;
 [XY]JP2012002733  (TOSOH CORP) [X] 1, 2, 6 * , claims 1 to 3, 6; paragraphs [0029] to [0031]; fig. 1 to 5 (Family: none) * [Y] 3-5, 7-10;
 [A]JP2012211785  (HITACHI PLANT TECHNOLOGIES LTD) [A] 1-10* , & US 2012/0250024 A1 & EP 2505990 A1 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.