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Extract from the Register of European Patents

EP About this file: EP3243166

EP3243166 - STRUCTURAL MASKING FOR PROGRESSIVE HEALTH MONITORING [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  14.05.2021
Database last updated on 12.07.2024
FormerThe patent has been granted
Status updated on  05.06.2020
FormerGrant of patent is intended
Status updated on  28.01.2020
FormerExamination is in progress
Status updated on  05.08.2019
FormerRequest for examination was made
Status updated on  13.10.2017
FormerThe international publication has been made
Status updated on  02.08.2017
Most recent event   Tooltip27.04.2024Lapse of the patent in a contracting state
New state(s): MK		published on 29.05.2024  [2024/22]
Applicant(s)For all designated states
Sikorsky Aircraft Corporation
6900 Main Street P.O. Box 9729
Stratford, CT 06615 / US
[2017/46]
Inventor(s)01 / WANG, Hongcheng
4 Glenmore Drive
Farmington, Connecticut 06032 / US
02 / ATTRIDGE, Paul
100 Kennedy Drive
Colchester, Connecticut 06415 / US
03 / XIONG, Ziyou
335 Two Rod Highway
Wethersfield, Connecticut 06109 / US
04 / FINN, Alan Matthew
19 Cedar Ridge Drive
Hebron, Connecticut 06248 / US
05 / CHAUDHRY, Zaffir A.
118 S. Mill Drive
South Glastonbury, Connecticut 06073 / US
 [2017/46]
Representative(s)Schmitt-Nilson Schraud Waibel Wohlfrom Patentanwälte Partnerschaft mbB
Pelkovenstraße 143
80992 München / DE
[2020/28]
Former [2017/46]Schmitt-Nilson Schraud Waibel Wohlfrom Patentanwälte Partnerschaft mbB
Destouchesstraße 68
80796 München / DE
Application number, filing date16735303.605.01.2016
[2017/46]
WO2016US12196
Priority number, dateUS201562100243P06.01.2015         Original published format: US 201562100243 P
[2017/46]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2016112018
Date:14.07.2016
Language:EN
[2016/28]
Type: A1 Application with search report 
No.:EP3243166
Date:15.11.2017
Language:EN
The application published by WIPO in one of the EPO official languages on 14.07.2016 takes the place of the publication of the European patent application.
[2017/46]
Type: B1 Patent specification 
No.:EP3243166
Date:08.07.2020
Language:EN
[2020/28]
Search report(s)International search report - published on:US14.07.2016
(Supplementary) European search report - dispatched on:EP05.10.2018
ClassificationIPC:G06T7/00
[2018/25]
CPC:
G06T7/001 (EP,US); G06T3/147 (US); G06T7/11 (US);
G06V10/993 (EP,US); G06T2207/20212 (US); G06T2207/20224 (EP,US);
G06T2207/30164 (EP,US); G06T2207/30168 (US) (-)
Former IPC [2017/46]G06K9/64, G06K9/72, G06K9/74, G06T1/00
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/46]
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
MDNot yet paid
TitleGerman:STRUKTURELLE MASKIERUNG FÜR PROGRESSIVE GESUNDHEITSÜBERWACHUNG[2017/46]
English:STRUCTURAL MASKING FOR PROGRESSIVE HEALTH MONITORING[2017/46]
French:MASQUAGE STRUCTURAL POUR UNE SURVEILLANCE DE SANTÉ PROGRESSIVE[2017/46]
Entry into regional phase02.08.2017National basic fee paid 
02.08.2017Search fee paid 
02.08.2017Designation fee(s) paid 
02.08.2017Examination fee paid 
Examination procedure02.08.2017Examination requested  [2017/46]
02.08.2017Date on which the examining division has become responsible
18.04.2019Amendment by applicant (claims and/or description)
08.08.2019Despatch of a communication from the examining division (Time limit: M04)
10.12.2019Reply to a communication from the examining division
29.01.2020Communication of intention to grant the patent
28.05.2020Fee for grant paid
28.05.2020Fee for publishing/printing paid
28.05.2020Receipt of the translation of the claim(s)
Opposition(s)09.04.2021No opposition filed within time limit [2021/24]
Fees paidRenewal fee
29.01.2018Renewal fee patent year 03
28.01.2019Renewal fee patent year 04
27.01.2020Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU05.01.2016
AL08.07.2020
AT08.07.2020
CY08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
MK08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
GB05.01.2021
IE05.01.2021
LU05.01.2021
BE31.01.2021
CH31.01.2021
FR31.01.2021
LI31.01.2021
[2024/22]
Former [2023/30]HU05.01.2016
AL08.07.2020
AT08.07.2020
CY08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
GB05.01.2021
IE05.01.2021
LU05.01.2021
BE31.01.2021
CH31.01.2021
FR31.01.2021
LI31.01.2021
Former [2023/27]HU05.01.2016
AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
GB05.01.2021
IE05.01.2021
LU05.01.2021
BE31.01.2021
CH31.01.2021
FR31.01.2021
LI31.01.2021
Former [2022/33]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
GB05.01.2021
IE05.01.2021
LU05.01.2021
BE31.01.2021
CH31.01.2021
FR31.01.2021
LI31.01.2021
Former [2022/23]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
GB05.01.2021
IE05.01.2021
LU05.01.2021
CH31.01.2021
FR31.01.2021
LI31.01.2021
Former [2022/10]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
PT09.11.2020
GB05.01.2021
IE05.01.2021
LU05.01.2021
CH31.01.2021
FR31.01.2021
LI31.01.2021
Former [2022/07]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
GB05.01.2021
IE05.01.2021
LU05.01.2021
CH31.01.2021
FR31.01.2021
LI31.01.2021
Former [2021/52]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
GB05.01.2021
LU05.01.2021
CH31.01.2021
FR31.01.2021
LI31.01.2021
Former [2021/49]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
GB05.01.2021
LU05.01.2021
FR31.01.2021
Former [2021/48]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
LU05.01.2021
FR31.01.2021
Former [2021/43]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
LU05.01.2021
Former [2021/40]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
MC08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
Former [2021/36]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SI08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
Former [2021/28]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SK08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
Former [2021/25]AL08.07.2020
AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
Former [2021/22]AT08.07.2020
CZ08.07.2020
DK08.07.2020
EE08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
NL08.07.2020
PL08.07.2020
RO08.07.2020
RS08.07.2020
SE08.07.2020
SM08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
Former [2021/20]AT08.07.2020
DK08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
IT08.07.2020
LT08.07.2020
LV08.07.2020
NL08.07.2020
PL08.07.2020
RS08.07.2020
SE08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
Former [2021/17]AT08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
LT08.07.2020
LV08.07.2020
NL08.07.2020
PL08.07.2020
RS08.07.2020
SE08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
Former [2021/10]AT08.07.2020
ES08.07.2020
FI08.07.2020
HR08.07.2020
LT08.07.2020
LV08.07.2020
PL08.07.2020
RS08.07.2020
SE08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
IS08.11.2020
PT09.11.2020
Former [2021/09]AT08.07.2020
ES08.07.2020
FI08.07.2020
LT08.07.2020
SE08.07.2020
BG08.10.2020
NO08.10.2020
GR09.10.2020
PT09.11.2020
Former [2021/08]ES08.07.2020
FI08.07.2020
LT08.07.2020
SE08.07.2020
BG08.10.2020
NO08.10.2020
PT09.11.2020
Former [2021/07]FI08.07.2020
LT08.07.2020
NO08.10.2020
Documents cited:Search[XAYI]US4477926  (LINGER CLAUDE J A [FR], et al) [X] 1,5,6,9,12,13 * abstract * * column 5 - column 9 * * figures 1, 6, 7, 8 * [A] 2,10 [Y] 3,4,11 [I] 7,8,14,15;
 [A]US2006093205  (BRYLL ROBERT K [US], et al) [A] 2,10 * abstract * * paragraph [0050] - paragraph [0066] * * figures 1, 3A, 3B *;
 [A]US2011280450  (NEPOMNIACHTCHI GRIGORI [US], et al) [A] 2,10 * abstract * * paragraph [0047] * * paragraph [0084] * * paragraph [0091] ** paragraph [0097] *;
 [Y]  - HIROI T ET AL, "Precise visual inspection for LSI wafer patterns using subpixel image alignment", APPLICATIONS OF COMPUTER VISION, 1994., PROCEEDINGS OF THE SECOND IEEE WORKSHOP ON SARASOTA, FL, USA 5-7 DEC, LOS ALAMITOS, CA, USA,IEEE COMPUT. SOC, (19941205), doi:10.1109/ACV.1994.341284, ISBN 978-0-8186-6410-6, pages 26 - 34, XP010100084 [Y] 3,4,11 * abstract * * sections 2, 3 *

DOI:   http://dx.doi.org/10.1109/ACV.1994.341284
 [A]  - AJAY PAL SINGH CHAUHAN ET AL, "Detection of Bare PCB Defects by Image Subtraction Method using Machine Vision", WORLD CONGRESS ON ENGINEERING 2011 VOL II WCE 2011, (20110706), pages 1 - 5, XP055473940 [A] 7,8 * Table I *
International search[Y]US2002110278  (LEE SHIH-JONG J [US], et al) [Y] 1-4, 9-11* , para [0033]-[0221] *;
 [Y]US2005265605  (NAKAMOTO EIJI [JP], et al) [Y] 1-4, 9-11 * , para [0005]-[0141] *;
 [X]US2008049994  (ROGNIN NICOLAS [CH], et al) [X] 1-4, 9-11 * , para [0017], [0028], [0056], [0060]-[0067], [0072], [0076]-[0078], [0088], [0090], [0100]-[0106], [0112], [0113] *;
 [Y]US2009010540  (MULLICK RAKESH [IN], et al) [Y] 1-4, 9-11 * , para [0006]-[0033] *;
 [Y]US2011249872  (MONRO DONALD MARTIN [GB]) [Y] 1-4, 9-11 * , para [0006]-[0057] *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.