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Extract from the Register of European Patents

EP About this file: EP3314655

EP3314655 - MUTILAYER STRUCTURE CONTAINING A CRYSTAL MATCHING LAYER FOR INCREASED SEMICONDUCTOR DEVICE PERFORMANCE [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  10.05.2019
Database last updated on 07.10.2024
FormerRequest for examination was made
Status updated on  30.03.2018
FormerThe international publication has been made
Status updated on  30.12.2016
Most recent event   Tooltip10.05.2019Application deemed to be withdrawnpublished on 12.06.2019  [2019/24]
Applicant(s)For all designated states
Tivra Corporation
3343 B Vincent Road
Pleasant Hill, California 94602 / US
[2018/18]
Inventor(s)01 / MACHUCA, Francisco
4159 Midvale Avenue
Oakland, California 94602 / US
02 / WEISS, Robert
455 Diamond Street
San Francisco, California 94114 / US
 [2018/18]
Representative(s)Viering, Jentschura & Partner mbB Patent- und Rechtsanwälte
Am Brauhaus 8
01099 Dresden / DE
[2018/18]
Application number, filing date16815516.627.06.2016
[2018/18]
WO2016US39675
Priority number, dateUS201562184692P25.06.2015         Original published format: US 201562184692 P
US201562233157P25.09.2015         Original published format: US 201562233157 P
[2018/18]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2016210449
Date:29.12.2016
Language:EN
[2016/52]
Type: A1 Application with search report 
No.:EP3314655
Date:02.05.2018
Language:EN
The application published by WIPO in one of the EPO official languages on 29.12.2016 takes the place of the publication of the European patent application.
[2018/18]
Search report(s)International search report - published on:US29.12.2016
ClassificationIPC:H01L29/20
[2018/18]
CPC:
H01L21/02491 (US); H01L21/02609 (KR,US); H01L29/04 (US);
H01L29/1075 (EP,KR,US); H01L29/41758 (EP,KR,US); H01L29/42316 (EP,KR,US);
H01L29/7786 (EP,KR,US); H01L29/7788 (EP,KR,US); H01L29/7789 (EP,KR,US);
H01L33/0075 (EP,KR,US); H01L33/12 (EP,KR,US); H01L33/32 (EP,KR,US);
H01L33/64 (KR); H01L23/36 (EP,US); H01L29/2003 (EP,US);
H01L33/405 (EP,US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2018/18]
Extension statesBA11.01.2018
ME11.01.2018
TitleGerman:MEHRSCHICHTSTRUKTUR MIT EINER KRISTALLANPASSUNGSSCHICHT ZUR ERHÖHUNG DER LEISTUNG EINES HALBLEITERBAUELEMENTS[2018/18]
English:MUTILAYER STRUCTURE CONTAINING A CRYSTAL MATCHING LAYER FOR INCREASED SEMICONDUCTOR DEVICE PERFORMANCE[2018/18]
French:STRUCTURE MULTICOUCHE CONTENANT UNE COUCHE DE MISE EN CORRESPONDANCE DE CRISTAUX POUR DES PERFORMANCES DE SEMI-CONDUCTEURS ACCRUES[2018/18]
Entry into regional phase11.01.2018National basic fee paid 
11.01.2018Search fee paid 
11.01.2018Designation fee(s) paid 
11.01.2018Examination fee paid 
Examination procedure11.01.2018Amendment by applicant (claims and/or description)
11.01.2018Examination requested  [2018/18]
11.01.2018Date on which the examining division has become responsible
03.01.2019Application deemed to be withdrawn, date of legal effect  [2019/24]
29.01.2019Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time  [2019/24]
Fees paidPenalty fee
Additional fee for renewal fee
30.06.201803   M06   Not yet paid
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Cited inInternational search[XYA]US2010176369  (OLIVER MARK [US], et al) [X] 1, 2, 10-12, 19 * , Fig 2, abstract, para [0026], [0027] * [Y] 3, 5-9, 13, 15-18 [A] 4, 14;
 [Y]US2014191249  (BLANCHARD RICHARD AUSTIN [US], et al) [Y] 3, 13 * , Fig 12, abstract, para [0071], [0076], [0107] *;
 [Y]US2013161637  (WERKHOVEN CHRISTIAAN J [US], et al) [Y] 5, 9, 15 * , abstract, para [0043], [0052]-[0055] *;
 [Y]US2012119189  (GASKA REMIGIJUS [US], et al) [Y] 6, 16 * , abstract, para [0046] *;
 [Y]US2014264396  (LOWENTHAL MARK DAVID [US], et al) [Y] 7, 17 * , abstract, para [0027], [0030] *;
 [Y]US2011186874  (SHUM FRANK TIN CHUNG [US]) [Y] 8, 18 * , Fig 1A, abstract, para [0044] *;
 [A]US7247889  (HANSON ALLEN W [US], et al) [A] 4, 14 * , abstract, col 1, In 40-47 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.