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Extract from the Register of European Patents

EP About this file: EP3223299

EP3223299 - 3D-MODELING DEVICE, 3D-MODELING DEVICE CONTROL METHOD AND 3D-MODELING DEVICE CONTROL PROGRAM [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  05.12.2019
Database last updated on 19.10.2024
FormerExamination is in progress
Status updated on  18.10.2019
FormerRequest for examination was made
Status updated on  25.08.2017
FormerThe international publication has been made
Status updated on  28.07.2017
Formerunknown
Status updated on  31.01.2017
Most recent event   Tooltip05.12.2019Withdrawal of applicationpublished on 01.01.2020  [2020/01]
Applicant(s)For all designated states
Technology Research Association for Future Additive Manufacturing
6F Nihonbashi First Bldg.
2-19, Nihonbashi 1-chome
Chuo-ku
Tokyo 103-0027 / JP
[2017/39]
Inventor(s)01 / GOTO, Kazuya
c/o TECHNOLOGY RESEARCH ASSOCIATION
FOR FUTURE ADDITIVE MANUFACTURING
TRAFAM-JEOL-AKISHIMA SUBOFFICE
1-2 Musashino 3-chome
Akishima-shi, Tokyo 196-8558 / JP
 [2017/39]
Representative(s)TBK
Bavariaring 4-6
80336 München / DE
[2017/39]
Application number, filing date16828909.821.01.2016
[2017/39]
WO2016JP51656
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2017126073
Date:27.07.2017
Language:JA
[2017/30]
Type: A1 Application with search report 
No.:EP3223299
Date:27.09.2017
Language:EN
[2017/39]
Search report(s)International search report - published on:JP27.07.2017
(Supplementary) European search report - dispatched on:EP20.03.2018
ClassificationIPC:B22F3/105, H01J37/30, H01J37/147
[2018/16]
CPC:
H01J37/305 (EP,US); B22F10/28 (EP,US); B22F10/366 (EP,US);
B22F12/44 (EP,US); B22F12/49 (EP,US); B22F3/105 (US);
B33Y40/10 (EP,US); C22B9/228 (US); H01J37/1474 (EP,US);
H01J37/3023 (US); B22F10/362 (EP,US); B22F2003/1051 (US);
B33Y30/00 (EP,US); B33Y50/02 (EP,US); H01J2237/30488 (EP,US);
Y02P10/25 (EP,US) (-)
Former IPC [2017/39]H01J37/30, B22F3/105, B22F3/16, H01J37/305
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/39]
TitleGerman:VORRICHTUNG ZUR 3D-MODELLIERUNG, STEUERUNGSVERFAHREN FÜR VORRICHTUNG ZUR 3D-MODELLIERUNG UND STEUERUNGSPROGRAMM FÜR VORRICHTUNG ZUR 3D-MODELLIERUNG[2017/39]
English:3D-MODELING DEVICE, 3D-MODELING DEVICE CONTROL METHOD AND 3D-MODELING DEVICE CONTROL PROGRAM[2017/39]
French:DISPOSITIF DE MODÉLISATION 3D, PROCÉDÉ DE COMMANDE DE DISPOSITIF DE MODÉLISATION 3D ET PROGRAMME DE COMMANDE DE DISPOSITIF DE MODÉLISATION 3D[2017/39]
Entry into regional phase30.01.2017Translation filed 
30.01.2017National basic fee paid 
30.01.2017Search fee paid 
30.01.2017Designation fee(s) paid 
30.01.2017Examination fee paid 
Examination procedure30.01.2017Examination requested  [2017/39]
30.01.2017Date on which the examining division has become responsible
12.10.2018Amendment by applicant (claims and/or description)
22.10.2019Despatch of a communication from the examining division (Time limit: M04)
27.11.2019Application withdrawn by applicant  [2020/01]
Fees paidRenewal fee
30.01.2018Renewal fee patent year 03
28.01.2019Renewal fee patent year 04
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Documents cited:Search[Y]US2005186538  (UCKELMANN INGO [DE]) [Y] 1-11 * paragraphs [0009] , [0038] - [0051] * * claims 1, 10 * * figures 3-5 *;
 [Y]US2013214172  (TOUYA TAKANAO [JP], et al) [Y] 1-11 * paragraphs [0055] - [0058] - [0092] , [0 94] * * figures 1, 2 *;
 [A]  - R Murali, "section 3.3.1 Electron Optics", BioNanoFluidic MEMS, Springer, (20081201), pages 42 - 44, ISBN 978-0-387-46283-7, XP055458292 [A] 1-11 * the whole document *
International search[YA]JPH1032188  (TOSHIBA CORP) [Y] 1-6, 9-11 * , entire text; all drawings & US 5894057 A entire text; all drawings *[A] 7-8;
 [YA]US2005186538  (UCKELMANN INGO [DE]) [Y] 1-6, 9-11 * , entire text; all drawings & EP 1568472 A1 & DE 102004009127 A * [A] 7-8
by applicantJP2003531034
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.