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Extract from the Register of European Patents

EP About this file: EP3344977

EP3344977 - METHOD AND SYSTEM FOR ANALYSIS OF SAMPLES USING LASER INDUCED BREAKDOWN SPECTROSCOPY [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  17.05.2024
Database last updated on 26.06.2024
FormerThe patent has been granted
Status updated on  09.06.2023
FormerGrant of patent is intended
Status updated on  14.02.2023
FormerExamination is in progress
Status updated on  06.07.2018
FormerRequest for examination was made
Status updated on  08.06.2018
FormerThe international publication has been made
Status updated on  11.03.2017
Most recent event   Tooltip07.06.2024Lapse of the patent in a contracting state
New state(s): MC
published on 10.07.2024 [2024/28]
Applicant(s)For all designated states
Elemission Inc.
2216 Rue des Crécerelles
Laval, Québec H7L 5S1 / CA
[2018/28]
Inventor(s)01 / ÖZCAN, Lütfü Çelebi
2125 Rue John McMurdy
Saint-Laurent, Québec H4R 3H8 / CA
02 / DOUCET, François
2216 Rue des Crécerelles
Laval, Québec H7L 5S1 / CA
 [2018/28]
Representative(s)Schmidt, Martin Peter
IXAS Conseil
22 avenue René Cassin
69009 Lyon / FR
[2023/28]
Former [2018/28]Schmidt, Martin Peter
IXAS Conseil
15, rue Emile Zola
69002 Lyon / FR
Application number, filing date16840957.102.09.2016
[2018/28]
WO2016IB55289
Priority number, dateUS201562213431P02.09.2015         Original published format: US 201562213431 P
[2018/28]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2017037680
Date:09.03.2017
Language:EN
[2017/10]
Type: A1 Application with search report 
No.:EP3344977
Date:11.07.2018
Language:EN
The application published by WIPO in one of the EPO official languages on 09.03.2017 takes the place of the publication of the European patent application.
[2018/28]
Type: B1 Patent specification 
No.:EP3344977
Date:12.07.2023
Language:EN
[2023/28]
Search report(s)International search report - published on:CA09.03.2017
(Supplementary) European search report - dispatched on:EP07.06.2018
ClassificationIPC:G01N21/71, G01N21/84, G01N21/88, G01N1/34, G01J3/02, B07C5/342, G01N21/85
[2018/28]
CPC:
G01N21/718 (EP,US); B07C5/342 (EP,US); G01N1/34 (EP,US);
G01N21/85 (EP,US); G01N21/8806 (EP,US); G01J3/0289 (EP,US);
G01N2021/845 (EP,US); G01N2201/0633 (US); G01N2201/0636 (EP,US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2018/28]  
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
MDNot yet paid
TitleGerman:VERFAHREN UND SYSTEM ZUR ANALYSE VON PROBEN MITHILFE DER LASERINDUZIERTEN BREAKDOWN-SPEKTROSKOPIE[2023/10]
English:METHOD AND SYSTEM FOR ANALYSIS OF SAMPLES USING LASER INDUCED BREAKDOWN SPECTROSCOPY[2018/28]
French:PROCÉDÉ ET SYSTÈME D'ANALYSE D'ÉCHANTILLONS UTILISANT LA SPECTROSCOPIE PAR CLAQUAGE INDUIT PAR ÉCLAIR LASER[2018/28]
Former [2018/28]VERFAHREN UND SYSTEM ZUR ANALYSE VON PROBEN MITHILFE EINER LASERINDUZIERTEN BREAKDOWN-SPEKTROSKOPIE
Entry into regional phase03.04.2018National basic fee paid 
03.04.2018Search fee paid 
03.04.2018Designation fee(s) paid 
22.03.2018Examination fee paid 
Examination procedure22.03.2018Amendment by applicant (claims and/or description)
22.03.2018Examination requested  [2018/28]
22.03.2018Date on which the examining division has become responsible
05.07.2018Despatch of a communication from the examining division (Time limit: M06)
14.01.2019Reply to a communication from the examining division
29.04.2021Despatch of a communication from the examining division (Time limit: M06)
29.10.2021Reply to a communication from the examining division
15.02.2023Communication of intention to grant the patent
31.05.2023Fee for grant paid
31.05.2023Fee for publishing/printing paid
31.05.2023Receipt of the translation of the claim(s)
Opposition(s)15.04.2024No opposition filed within time limit [2024/25]
Fees paidRenewal fee
01.10.2018Renewal fee patent year 03
05.07.2019Renewal fee patent year 04
30.09.2020Renewal fee patent year 05
30.09.2021Renewal fee patent year 06
30.09.2022Renewal fee patent year 07
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Lapses during opposition  TooltipCZ12.07.2023
HR12.07.2023
MC12.07.2023
PL12.07.2023
RO12.07.2023
RS12.07.2023
SK12.07.2023
SM12.07.2023
NO12.10.2023
GR13.10.2023
IS12.11.2023
[2024/28]
Former [2024/23]CZ12.07.2023
HR12.07.2023
PL12.07.2023
RO12.07.2023
RS12.07.2023
SK12.07.2023
SM12.07.2023
NO12.10.2023
GR13.10.2023
IS12.11.2023
Former [2024/20]HR12.07.2023
PL12.07.2023
RS12.07.2023
SM12.07.2023
NO12.10.2023
GR13.10.2023
IS12.11.2023
Former [2024/10]HR12.07.2023
PL12.07.2023
RS12.07.2023
NO12.10.2023
GR13.10.2023
IS12.11.2023
Former [2024/09]NO12.10.2023
GR13.10.2023
IS12.11.2023
Former [2024/08]NO12.10.2023
GR13.10.2023
Documents cited:Search[A]JPH03183933  (HITACHI LTD) [A] 1-10* abstract *;
 [I]US2006084957  (DELFYETT PETER [US], et al) [I] 1-10 * paragraphs [0009] , [0014] , [0020] , [0031] * * paragraph [0032] - paragraph [0034]; figure 2 * * paragraph [0039] - paragraph [0044] * * paragraph [0052] - paragraph [0061] * * paragraph [0071] - paragraph [0072] *;
 [I]CA2931676  (NAT RES COUNCIL CANADA [CA]) [I] 1,2,7 * page 9, line 21 - page 10, line 27; figure 1 * * page 13, line 16 - page 14, line 12 *
International search[Y]WO2006122429  (ECOLE POLYTECH [CA], et al) [Y] 1-20*paragraphs 0039-0044*;
 [Y]CA2931676  (NAT RES COUNCIL CANADA [CA]) [Y] 1-20 *page 1, lines 12 -page 2, line 2; page 3, line 30 - page 6, line 22; page 4, lines 10-19; and page 13, lines 4-15; page 9, line 21 - page 10, line 6; page 10, lines 21-24; and page 12, lines 6-27*
ExaminationUS2014204377
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.