EP3465182 - METHOD AND APPARATUS FOR X-RAY MICROSCOPY [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 22.01.2021 Database last updated on 20.07.2024 | |
Former | Request for examination was made Status updated on 08.03.2019 | ||
Former | The international publication has been made Status updated on 16.12.2017 | Most recent event Tooltip | 22.01.2021 | Application deemed to be withdrawn | published on 24.02.2021 [2021/08] | Applicant(s) | For all designated states Sigray Inc. 5750 Imhoff Drive Suite I Concord, CA 94520 / US | [2019/15] | Inventor(s) | 01 /
YUN, Wenbing 5750 Imhoff Drive Ste I Concord CA 94520 / US | 02 /
LEWIS, Sylvia Jia Yun 5750 Imhoff Drive Ste I Concord CA 94520 / US | 03 /
KIRZ, Janos 5750 Imhoff Drive Ste I Concord CA 94520 / US | 04 /
SESHADRI, Srivatsan 5750 Imhoff Drive Ste I Concord CA 94520 / US | 05 /
LYON, Alan Francis 5750 Imhoff Drive Ste I Concord, CA 94520 / US | 06 /
VINE, David 5750 Imhoff Drive, Suite I Concord, CA 94520 / US | [2019/15] | Representative(s) | Tevlin, Christopher Michael Marks & Clerk LLP 1 New York Street Manchester M1 4HD / GB | [2019/15] | Application number, filing date | 17810765.2 | 02.06.2017 | [2019/15] | WO2017US35800 | Priority number, date | US201615173711 | 05.06.2016 Original published format: US201615173711 | US201662401164P | 28.09.2016 Original published format: US 201662401164 P | US201662429587P | 02.12.2016 Original published format: US 201662429587 P | US201662429760P | 03.12.2016 Original published format: US 201662429760 P | US201762485916P | 15.04.2017 Original published format: US 201762485916 P | US201715605957 | 26.05.2017 Original published format: US201715605957 | [2019/15] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2017213996 | Date: | 14.12.2017 | Language: | EN | [2017/50] | Type: | A1 Application with search report | No.: | EP3465182 | Date: | 10.04.2019 | Language: | EN | The application published by WIPO in one of the EPO official languages on 14.12.2017 takes the place of the publication of the European patent application. | [2019/15] | Search report(s) | International search report - published on: | US | 14.12.2017 | (Supplementary) European search report - dispatched on: | EP | 17.02.2020 | Classification | IPC: | G01N23/04, G21K1/06, G21K1/02, G21K7/00, // G01N23/201 | [2020/12] | CPC: |
G01N23/04 (EP,KR,US);
G01N23/041 (EP,US);
G01N23/201 (EP,KR,US);
G21K1/025 (EP,KR);
G21K1/06 (EP,KR);
G21K7/00 (EP,KR);
|
Former IPC [2019/15] | G01N23/20, G01N23/201, G21K1/06, G21K1/10, H01J35/16 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2019/15] | Title | German: | VERFAHREN UND VORRICHTUNG ZUR RÖNTGENMIKROSKOPIE | [2019/15] | English: | METHOD AND APPARATUS FOR X-RAY MICROSCOPY | [2019/15] | French: | PROCÉDÉ ET APPAREIL DE MICROSCOPIE À RAYONS X | [2019/15] | Entry into regional phase | 04.01.2019 | National basic fee paid | 04.01.2019 | Search fee paid | 04.01.2019 | Designation fee(s) paid | 04.01.2019 | Examination fee paid | Examination procedure | deleted | Date on which the examining division has become responsible | 04.01.2019 | Examination requested [2019/15] | 02.08.2019 | Amendment by applicant (claims and/or description) | 16.09.2020 | Application deemed to be withdrawn, date of legal effect [2021/08] | 06.10.2020 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2021/08] | Fees paid | Renewal fee | 04.01.2019 | Renewal fee patent year 03 | 28.04.2020 | Renewal fee patent year 04 |
Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US2010260315 (SATO GENTA [JP], et al) [A] 1-15 * paragraph [0002] * * paragraph [0025] - paragraph [0035]; figure - *; | [X]US2015117599 (YUN WENBING [US], et al) [X] 1-15 * paragraph [0002] * * paragraph [0005] - paragraph [0016] * * paragraph [0084] - paragraph [0086] * * paragraph [0096] * * paragraph [0102] * * paragraph [0105] * * paragraph [0171] * * figure - *; | [A]WO2015168473 (SIGRAY INC [US]) [A] 1-15 * paragraph [0005] - paragraph [0016]; figure - *; | [A]WO2015176023 (SIGRAY INC [US]) [A] 1-15 * paragraph [0008] - paragraph [0035] ** paragraph [0114] - paragraph [0119]; figures 15-16 * | International search | [Y]US2010012845 (BAEUMER CHRISTIAN [DE], et al) [Y] 30 * , entire document *; | [A]US2014064445 (ADLER DAVID LEWIS [US]) [A] 1-32 * , entire document *; | [Y]US2015110252 (YUN WENBING [US], et al) [Y] 12, 13, 16, 17, 28 * , entire document *; | [A]US2015117599 (YUN WENBING [US], et al) [A] 1-32 * , entire document *; | [Y]US2015194287 (YUN WENBING [US], et al) [Y] 29 * , entire document *; | [Y]US2015243397 (YUN WENBING [US], et al) [Y] 1-32 * , entire document *; | [A]US2015247811 (YUN WENBING [US], et al) [A] 1-32 * , entire document *; | [Y]US2015260663 (YUN WENBING [US], et al) [Y] 1-32 * , entire document *; | [Y]WO2015176023 (SIGRAY INC [US]) [Y] 3-5, 9 * , entire document *; | [A]US2016066870 (YUN WENBING [US], et al) [A] 1-32* , entire document * |