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Extract from the Register of European Patents

EP About this file: EP3465182

EP3465182 - METHOD AND APPARATUS FOR X-RAY MICROSCOPY [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  22.01.2021
Database last updated on 20.07.2024
FormerRequest for examination was made
Status updated on  08.03.2019
FormerThe international publication has been made
Status updated on  16.12.2017
Most recent event   Tooltip22.01.2021Application deemed to be withdrawnpublished on 24.02.2021  [2021/08]
Applicant(s)For all designated states
Sigray Inc.
5750 Imhoff Drive
Suite I
Concord, CA 94520 / US
[2019/15]
Inventor(s)01 / YUN, Wenbing
5750 Imhoff Drive Ste I
Concord CA 94520 / US
02 / LEWIS, Sylvia Jia Yun
5750 Imhoff Drive Ste I
Concord CA 94520 / US
03 / KIRZ, Janos
5750 Imhoff Drive Ste I
Concord CA 94520 / US
04 / SESHADRI, Srivatsan
5750 Imhoff Drive Ste I
Concord CA 94520 / US
05 / LYON, Alan Francis
5750 Imhoff Drive Ste I
Concord, CA 94520 / US
06 / VINE, David
5750 Imhoff Drive, Suite I
Concord, CA 94520 / US
 [2019/15]
Representative(s)Tevlin, Christopher Michael
Marks & Clerk LLP
1 New York Street
Manchester M1 4HD / GB
[2019/15]
Application number, filing date17810765.202.06.2017
[2019/15]
WO2017US35800
Priority number, dateUS20161517371105.06.2016         Original published format: US201615173711
US201662401164P28.09.2016         Original published format: US 201662401164 P
US201662429587P02.12.2016         Original published format: US 201662429587 P
US201662429760P03.12.2016         Original published format: US 201662429760 P
US201762485916P15.04.2017         Original published format: US 201762485916 P
US20171560595726.05.2017         Original published format: US201715605957
[2019/15]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2017213996
Date:14.12.2017
Language:EN
[2017/50]
Type: A1 Application with search report 
No.:EP3465182
Date:10.04.2019
Language:EN
The application published by WIPO in one of the EPO official languages on 14.12.2017 takes the place of the publication of the European patent application.
[2019/15]
Search report(s)International search report - published on:US14.12.2017
(Supplementary) European search report - dispatched on:EP17.02.2020
ClassificationIPC:G01N23/04, G21K1/06, G21K1/02, G21K7/00, // G01N23/201
[2020/12]
CPC:
G01N23/04 (EP,KR,US); G01N23/041 (EP,US); G01N23/201 (EP,KR,US);
G21K1/025 (EP,KR); G21K1/06 (EP,KR); G21K7/00 (EP,KR);
G01N2223/6116 (EP,KR); G01N23/044 (EP,US); G21K2207/005 (EP,KR) (-)
Former IPC [2019/15]G01N23/20, G01N23/201, G21K1/06, G21K1/10, H01J35/16
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2019/15]
TitleGerman:VERFAHREN UND VORRICHTUNG ZUR RÖNTGENMIKROSKOPIE[2019/15]
English:METHOD AND APPARATUS FOR X-RAY MICROSCOPY[2019/15]
French:PROCÉDÉ ET APPAREIL DE MICROSCOPIE À RAYONS X[2019/15]
Entry into regional phase04.01.2019National basic fee paid 
04.01.2019Search fee paid 
04.01.2019Designation fee(s) paid 
04.01.2019Examination fee paid 
Examination proceduredeletedDate on which the examining division has become responsible
04.01.2019Examination requested  [2019/15]
02.08.2019Amendment by applicant (claims and/or description)
16.09.2020Application deemed to be withdrawn, date of legal effect  [2021/08]
06.10.2020Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2021/08]
Fees paidRenewal fee
04.01.2019Renewal fee patent year 03
28.04.2020Renewal fee patent year 04
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US2010260315  (SATO GENTA [JP], et al) [A] 1-15 * paragraph [0002] * * paragraph [0025] - paragraph [0035]; figure - *;
 [X]US2015117599  (YUN WENBING [US], et al) [X] 1-15 * paragraph [0002] * * paragraph [0005] - paragraph [0016] * * paragraph [0084] - paragraph [0086] * * paragraph [0096] * * paragraph [0102] * * paragraph [0105] * * paragraph [0171] * * figure - *;
 [A]WO2015168473  (SIGRAY INC [US]) [A] 1-15 * paragraph [0005] - paragraph [0016]; figure - *;
 [A]WO2015176023  (SIGRAY INC [US]) [A] 1-15 * paragraph [0008] - paragraph [0035] ** paragraph [0114] - paragraph [0119]; figures 15-16 *
International search[Y]US2010012845  (BAEUMER CHRISTIAN [DE], et al) [Y] 30 * , entire document *;
 [A]US2014064445  (ADLER DAVID LEWIS [US]) [A] 1-32 * , entire document *;
 [Y]US2015110252  (YUN WENBING [US], et al) [Y] 12, 13, 16, 17, 28 * , entire document *;
 [A]US2015117599  (YUN WENBING [US], et al) [A] 1-32 * , entire document *;
 [Y]US2015194287  (YUN WENBING [US], et al) [Y] 29 * , entire document *;
 [Y]US2015243397  (YUN WENBING [US], et al) [Y] 1-32 * , entire document *;
 [A]US2015247811  (YUN WENBING [US], et al) [A] 1-32 * , entire document *;
 [Y]US2015260663  (YUN WENBING [US], et al) [Y] 1-32 * , entire document *;
 [Y]WO2015176023  (SIGRAY INC [US]) [Y] 3-5, 9 * , entire document *;
 [A]US2016066870  (YUN WENBING [US], et al) [A] 1-32* , entire document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.