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Extract from the Register of European Patents

EP About this file: EP3551965

EP3551965 - DISTANCE SENSOR PROJECTING PARALLEL PATTERNS [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  16.06.2022
Database last updated on 06.07.2024
FormerRequest for examination was made
Status updated on  13.09.2019
FormerThe international publication has been made
Status updated on  16.06.2018
Most recent event   Tooltip14.04.2024New entry: Date of oral proceedings 
Applicant(s)For all designated states
Magik Eye Inc.
235 East 40th Street Suite 91
New York, New York 10016 / US
[2019/42]
Inventor(s)01 / KIMURA, Akiteru
4-1-19-901 Myojin-cho
Hachioji-shi
Tokyo 192-0046 / JP
 [2019/42]
Representative(s)Marks & Clerk LLP
15 Fetter Lane
London EC4A 1BW / GB
[N/P]
Former [2019/42]Asquith, Julian Peter
Marks & Clerk LLP
Fletcher House
Heatley Road The Oxford Science Park
Oxford OX4 4GE / GB
Application number, filing date17877786.805.12.2017
[2019/42]
WO2017US64680
Priority number, dateUS201662430998P07.12.2016         Original published format: US 201662430998 P
[2019/42]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2018106670
Date:14.06.2018
Language:EN
[2018/24]
Type: A1 Application with search report 
No.:EP3551965
Date:16.10.2019
Language:EN
The application published by WIPO in one of the EPO official languages on 14.06.2018 takes the place of the publication of the European patent application.
[2019/42]
Search report(s)International search report - published on:KR14.06.2018
(Supplementary) European search report - dispatched on:EP03.07.2020
ClassificationIPC:G01C3/08, G01B11/25, G01S17/08, G06K9/00, G06K9/20
[2020/32]
CPC:
G01C3/08 (EP,US); G06T7/571 (KR); G01B11/026 (EP);
G01B11/22 (KR); G01S17/48 (EP); G01S7/4815 (EP);
G06T7/521 (US); G06T7/564 (US); G06T7/70 (KR);
G06V10/145 (EP,US); G06V20/58 (EP,US); H04N23/56 (US);
G01S17/931 (EP); G06T2207/10004 (US); G06T2207/10148 (KR);
G06T2207/30252 (US) (-)
Former IPC [2019/42]G01C3/08
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2019/42]
TitleGerman:ABSTANDSSENSOR MIT PROJIZIERUNG PARALLELER MUSTER[2019/42]
English:DISTANCE SENSOR PROJECTING PARALLEL PATTERNS[2019/42]
French:CAPTEUR DE DISTANCE PROJETANT DES MOTIFS PARALLÈLES[2019/42]
Entry into regional phase31.05.2019National basic fee paid 
31.05.2019Search fee paid 
31.05.2019Designation fee(s) paid 
31.05.2019Examination fee paid 
Examination procedure31.05.2019Examination requested  [2019/42]
28.01.2021Amendment by applicant (claims and/or description)
15.06.2022Despatch of a communication from the examining division (Time limit: M06)
16.12.2022Reply to a communication from the examining division
15.10.2024Date of oral proceedings
Fees paidRenewal fee
10.12.2019Renewal fee patent year 03
09.12.2020Renewal fee patent year 04
16.12.2021Renewal fee patent year 05
09.12.2022Renewal fee patent year 06
12.12.2023Renewal fee patent year 07
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US2016117561  (MIYAZAWA TAKEO [JP], et al) [A] 1-19* abstract *;
 [XI]US2016327385  (KIMURA AKITERU [JP]) [X] 1,18,19 * the whole document * [I] 2-17
International search[A]US2003071891  (GENG Z JASON [US]) [A] 1-22 * See paragraph [0043] and figure 5. *;
 [A]US2007206099  (MATSUO KOICHI [JP], et al) [A] 1-22 * See paragraphs [0070]-[0101] and figures 1, 7-16. *;
 [A]US2012113252  (YANG SHU-SIAN [TW], et al) [A] 1-22* See paragraphs [0024], [0034]-[0035] and figures 1, 7-8. *;
 [A]US2014009571  (GENG ZHENG JASON [US]) [A] 1-22 * See paragraphs [0034]-[0035] and figure 3. *;
 [X]US2016327385  (KIMURA AKITERU [JP]) [X] 1-22 * See paragraphs [0002], [0032]-[0039], claims 1, 9-10, 17 and figures 1A-1B, 2-7, 20. *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.