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Extract from the Register of European Patents

EP About this file: EP3594665

EP3594665 - OPTICAL INSPECTION DEVICE AND METHOD [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  20.11.2020
Database last updated on 11.09.2024
FormerThe application has been published
Status updated on  13.12.2019
Most recent event   Tooltip20.11.2020Application deemed to be withdrawnpublished on 23.12.2020  [2020/52]
Applicant(s)For all designated states
Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
[2020/03]
Inventor(s)01 / van der Zwan, Bertram Adriaan
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
02 / Oostrom, Sjoerd
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
03 / Speet, Bart Gerardus
c/o TNO
IP & Contracting
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
 [2020/10]
Former [2020/03]01 / van der Zwan, Bertram Adriaan
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
02 / Oostrom, Sjoerd
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
03 / Speet, Bert Gerardus
c/o TNO
IP & Contracting
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
Representative(s)V.O.
P.O. Box 87930
Carnegieplein 5
2508 DH Den Haag / NL
[2020/03]
Application number, filing date18183504.213.07.2018
[2020/03]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3594665
Date:15.01.2020
Language:EN
[2020/03]
Search report(s)(Supplementary) European search report - dispatched on:EP07.01.2019
ClassificationIPC:G01N21/88
[2020/03]
CPC:
G01N21/8806 (EP,US); G01N21/31 (US); G01N21/95 (US);
G02B21/365 (US); G01N2201/02 (US); G01N2201/0633 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/03]
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:OPTISCHE INSPEKTIONSVORRICHTUNG UND VERFAHREN[2020/03]
English:OPTICAL INSPECTION DEVICE AND METHOD[2020/03]
French:DISPOSITIF ET PROCÉDÉ D'INSPECTION OPTIQUE[2020/03]
Examination procedure16.07.2020Application deemed to be withdrawn, date of legal effect  [2020/52]
05.08.2020Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2020/52]
Fees paidPenalty fee
Additional fee for renewal fee
31.07.202003   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]US2002088952  (RAO NAGARAJA P [US], et al) [X] 1-15 * abstract * * page 5 - page 8 *;
 [A]US2015285743  (TUNG DAVID M [US], et al) [A] 1-15 * abstract ** paragraph [0050] *;
 [X]  - CHARALAMPOS BAKOLIAS ET AL, "Dark-field Scheimpflug imaging for surface inspection", PROCEEDINGS OF SPIE, 1000 20th St. Bellingham WA 98225-6705 USA, (19970415), vol. 3029, doi:10.1117/12.271248, ISSN 0277-786X, ISBN 978-1-5106-2099-5, pages 57 - 68, XP055535904 [X] 1-15 * abstract * * page 57 - page 60 *

DOI:   http://dx.doi.org/10.1117/12.271248
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.