EP3528276 - MICROSCOPY IMAGING METHOD [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 24.07.2020 Database last updated on 16.07.2024 | |
Former | Request for examination was made Status updated on 06.03.2020 | ||
Former | The application has been published Status updated on 19.07.2019 | Most recent event Tooltip | 11.05.2024 | New entry: Renewal fee paid | Applicant(s) | For all designated states Fibics Incorporated 1431 Merivale Road Lower Level, Suite 100 Ottawa, ON K2E 0B9 / CA | [2019/34] | Inventor(s) | 01 /
Phaneuf, Michael, William 20 Hampton Avenue Ottawa, Ontario K1Y 0N2 / CA | 02 /
Lagarec, Ken, Guillaume 135 Carruthers Avenue, Unit B Ottawa, Ontario K1Y 1N4 / CA | [2019/34] | Representative(s) | Kaminski Harmann Patentanwälte AG Landstrasse 124 9490 Vaduz / LI | [2019/34] | Application number, filing date | 18211266.4 | 14.05.2012 | [2019/34] | Priority number, date | US201161485713P | 13.05.2011 Original published format: US 201161485713 P | [2019/34] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP3528276 | Date: | 21.08.2019 | Language: | EN | [2019/34] | Type: | A3 Search report | No.: | EP3528276 | Date: | 04.09.2019 | Language: | EN | [2019/36] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 01.08.2019 | Classification | IPC: | H01J37/28, H01J37/22, H01J37/30, H01J37/305 | [2019/36] | CPC: |
H01J37/222 (EP,US);
H01J37/26 (US);
H01J37/28 (EP,US);
H01J37/3005 (EP,US);
H01J37/304 (US);
H01J37/3045 (EP,US);
H01J37/3056 (EP,US);
G06T2207/10061 (EP,US);
H01J2237/226 (EP,US);
|
Former IPC [2019/34] | H01J37/28, H01J37/22 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2020/15] |
Former [2019/34] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Title | German: | MIKROSKOPIEBILDGEBUNGSVERFAHREN | [2019/34] | English: | MICROSCOPY IMAGING METHOD | [2019/34] | French: | PROCÉDÉ D'IMAGERIE PAR MICROSCOPIE | [2019/34] | Examination procedure | 03.03.2020 | Amendment by applicant (claims and/or description) | 03.03.2020 | Examination requested [2020/15] | 03.03.2020 | Date on which the examining division has become responsible | 23.07.2020 | Despatch of a communication from the examining division (Time limit: M04) | 23.11.2020 | Reply to a communication from the examining division | 25.03.2021 | Despatch of a communication from the examining division (Time limit: M06) | 26.10.2021 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time | 28.12.2021 | Reply to a communication from the examining division | 22.03.2024 | Despatch of a communication from the examining division (Time limit: M04) | Parent application(s) Tooltip | EP12785045.1 / EP2707893 | Request for further processing for: | The application is deemed to be withdrawn due to failure to reply to the examination report | 28.12.2021 | Request for further processing filed | 28.12.2021 | Full payment received (date of receipt of payment) Request granted | 10.01.2022 | Decision despatched | Fees paid | Renewal fee | 10.12.2018 | Renewal fee patent year 03 | 10.12.2018 | Renewal fee patent year 04 | 10.12.2018 | Renewal fee patent year 05 | 10.12.2018 | Renewal fee patent year 06 | 10.12.2018 | Renewal fee patent year 07 | 07.05.2019 | Renewal fee patent year 08 | 27.04.2020 | Renewal fee patent year 09 | 23.03.2021 | Renewal fee patent year 10 | 04.05.2022 | Renewal fee patent year 11 | 26.04.2023 | Renewal fee patent year 12 | 09.05.2024 | Renewal fee patent year 13 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XAY]WO0245125 (YEDA RES & DEV [IL], et al); | [Y]US2005253067 (KAWADA HIROKI [JP], et al); | [Y]US2009314937 (SELLMAIR JOSEF [DE]); | WO2010029708 [ ] (HITACHI HIGH TECH CORP [JP], et al); | [AP]US2011181688 (MIYAMOTO ATSUSHI [JP], et al); | by applicant | US7312448 |