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Extract from the Register of European Patents

EP About this file: EP3615948

EP3615948 - SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  30.07.2021
Database last updated on 19.10.2024
FormerRequest for examination was made
Status updated on  31.01.2020
FormerThe international publication has been made
Status updated on  02.11.2018
Formerunknown
Status updated on  18.05.2018
Most recent event   Tooltip11.10.2024Change - German titlepublished on 13.11.2024 [2024/46]
11.10.2024Change - French titlepublished on 13.11.2024 [2024/46]
Applicant(s)For all designated states
Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
[2020/10]
Inventor(s)01 / PIRAS, Daniele
c/o TNO
IP & Contracting
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
02 / VAN NEER, Paul Louis Maria Joseph
c/o TNO
IP & Contracting
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
03 / SADEGHIAN MARNANI, Hamed
c/o TNO
IP & Contracting
Anna van Buerenplein 1
2595 DA 's-Gravenhage / NL
 [2020/10]
Representative(s)V.O.
P.O. Box 87930
2508 DH Den Haag / NL
[2020/10]
Application number, filing date18722242.723.04.2018
[2020/10]
WO2018NL50256
Priority number, dateEP2017016775424.04.2017         Original published format: EP 17167754
[2020/10]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2018199746
Date:01.11.2018
Language:EN
[2018/44]
Type: A1 Application with search report 
No.:EP3615948
Date:04.03.2020
Language:EN
The application published by WIPO in one of the EPO official languages on 01.11.2018 takes the place of the publication of the European patent application.
[2020/10]
Search report(s)International search report - published on:EP01.11.2018
ClassificationIPC:G01Q60/32, G01N29/06
[2020/10]
CPC:
G01Q60/32 (EP,KR); G01Q60/42 (US); G01N29/0681 (EP,KR,US);
G01N29/265 (EP,KR,US); G01Q60/363 (EP,KR); B82Y15/00 (US);
B82Y30/00 (US); B82Y35/00 (US); G01N2291/0422 (EP,KR,US);
G01N2291/0425 (EP,KR,US); G01Q60/34 (EP) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/10]
TitleGerman:UNTEROBERFLÄCHIGE RASTERKRAFTMIKROSKOPIE MIT GEFÜHRTEN ULTRASCHALLWELLEN[2024/46]
English:SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES[2020/10]
French:MICROSCOPIE À FORCE ATOMIQUE SOUS LA SURFACE AVEC DES ONDES ULTRASONORES GUIDÉES[2024/46]
Former [2020/10]UNTERIRDISCHE ATOMKRAFTMIKROSKOPIE MIT GEFÜHRTEN ULTRASCHALLWELLEN
Former [2020/10]MICROSCOPIE À FORCE ATOMIQUE SOUTERRAINE À ONDES ULTRASONORES GUIDÉES
Entry into regional phase23.10.2019National basic fee paid 
23.10.2019Designation fee(s) paid 
23.10.2019Examination fee paid 
Examination procedure23.10.2019Examination requested  [2020/10]
23.10.2019Date on which the examining division has become responsible
29.04.2020Amendment by applicant (claims and/or description)
03.08.2021Despatch of a communication from the examining division (Time limit: M04)
20.08.2021Reply to a communication from the examining division
07.10.2022Despatch of a communication from the examining division (Time limit: M04)
13.02.2023Reply to a communication from the examining division
Fees paidRenewal fee
06.07.2020Renewal fee patent year 03
29.04.2021Renewal fee patent year 04
25.04.2022Renewal fee patent year 05
25.04.2023Renewal fee patent year 06
24.04.2024Renewal fee patent year 07
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Cited inInternational search[A]WO2008141301  (VEECO INSTR INC [US], et al);
 [A]JP2012083130  (FUJITSU LTD);
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.