EP3615948 - SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 30.07.2021 Database last updated on 19.10.2024 | |
Former | Request for examination was made Status updated on 31.01.2020 | ||
Former | The international publication has been made Status updated on 02.11.2018 | ||
Former | unknown Status updated on 18.05.2018 | Most recent event Tooltip | 11.10.2024 | Change - German title | published on 13.11.2024 [2024/46] | 11.10.2024 | Change - French title | published on 13.11.2024 [2024/46] | Applicant(s) | For all designated states Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Anna van Buerenplein 1 2595 DA 's-Gravenhage / NL | [2020/10] | Inventor(s) | 01 /
PIRAS, Daniele c/o TNO IP & Contracting Anna van Buerenplein 1 2595 DA 's-Gravenhage / NL | 02 /
VAN NEER, Paul Louis Maria Joseph c/o TNO IP & Contracting Anna van Buerenplein 1 2595 DA 's-Gravenhage / NL | 03 /
SADEGHIAN MARNANI, Hamed c/o TNO IP & Contracting Anna van Buerenplein 1 2595 DA 's-Gravenhage / NL | [2020/10] | Representative(s) | V.O. P.O. Box 87930 2508 DH Den Haag / NL | [2020/10] | Application number, filing date | 18722242.7 | 23.04.2018 | [2020/10] | WO2018NL50256 | Priority number, date | EP20170167754 | 24.04.2017 Original published format: EP 17167754 | [2020/10] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2018199746 | Date: | 01.11.2018 | Language: | EN | [2018/44] | Type: | A1 Application with search report | No.: | EP3615948 | Date: | 04.03.2020 | Language: | EN | The application published by WIPO in one of the EPO official languages on 01.11.2018 takes the place of the publication of the European patent application. | [2020/10] | Search report(s) | International search report - published on: | EP | 01.11.2018 | Classification | IPC: | G01Q60/32, G01N29/06 | [2020/10] | CPC: |
G01Q60/32 (EP,KR);
G01Q60/42 (US);
G01N29/0681 (EP,KR,US);
G01N29/265 (EP,KR,US);
G01Q60/363 (EP,KR);
B82Y15/00 (US);
B82Y30/00 (US);
B82Y35/00 (US);
G01N2291/0422 (EP,KR,US);
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2020/10] | Title | German: | UNTEROBERFLÄCHIGE RASTERKRAFTMIKROSKOPIE MIT GEFÜHRTEN ULTRASCHALLWELLEN | [2024/46] | English: | SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES | [2020/10] | French: | MICROSCOPIE À FORCE ATOMIQUE SOUS LA SURFACE AVEC DES ONDES ULTRASONORES GUIDÉES | [2024/46] |
Former [2020/10] | UNTERIRDISCHE ATOMKRAFTMIKROSKOPIE MIT GEFÜHRTEN ULTRASCHALLWELLEN | ||
Former [2020/10] | MICROSCOPIE À FORCE ATOMIQUE SOUTERRAINE À ONDES ULTRASONORES GUIDÉES | Entry into regional phase | 23.10.2019 | National basic fee paid | 23.10.2019 | Designation fee(s) paid | 23.10.2019 | Examination fee paid | Examination procedure | 23.10.2019 | Examination requested [2020/10] | 23.10.2019 | Date on which the examining division has become responsible | 29.04.2020 | Amendment by applicant (claims and/or description) | 03.08.2021 | Despatch of a communication from the examining division (Time limit: M04) | 20.08.2021 | Reply to a communication from the examining division | 07.10.2022 | Despatch of a communication from the examining division (Time limit: M04) | 13.02.2023 | Reply to a communication from the examining division | Fees paid | Renewal fee | 06.07.2020 | Renewal fee patent year 03 | 29.04.2021 | Renewal fee patent year 04 | 25.04.2022 | Renewal fee patent year 05 | 25.04.2023 | Renewal fee patent year 06 | 24.04.2024 | Renewal fee patent year 07 |
Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [A]WO2008141301 (VEECO INSTR INC [US], et al); | [A]JP2012083130 (FUJITSU LTD); |