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Extract from the Register of European Patents

EP About this file: EP3646046

EP3646046 - DEVICE FOR MEASURING WEAK MAGNETIC FIELDS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  22.12.2023
Database last updated on 27.07.2024
FormerThe patent has been granted
Status updated on  13.01.2023
FormerGrant of patent is intended
Status updated on  17.10.2022
FormerExamination is in progress
Status updated on  16.04.2021
FormerRequest for examination was made
Status updated on  03.04.2020
FormerThe international publication has been made
Status updated on  04.01.2019
Formerunknown
Status updated on  20.07.2018
Most recent event   Tooltip24.05.2024Lapse of the patent in a contracting state
New state(s): IT
published on 26.06.2024  [2024/26]
Applicant(s)For all designated states
Centre National de la Recherche Scientifique
3, rue Michel-Ange
75016 Paris / FR
For all designated states
Université d'Orléans
Château de la Source
Avenue du Parc Floral
45100 Orléans / FR
For all designated states
Commissariat à l'Energie Atomique et aux Energies Alternatives
Bâtiment "Le Ponant D"
25, rue Leblanc
75015 Paris / FR
[2020/19]
Inventor(s)01 / CAVOIT, Claude
Usseau
Route Eugnes
58320 Parigny les Vaux / FR
02 / BARADUC, Claire
137 avenue du 8 mai 1945
38850 Chirens / FR
03 / SABON, Philippe
7 rue Victor Hugo
38430 Moirans / FR
04 / BOCHEUX, Amandine
9 rue du Dr Schweitzer
38100 Grenoble / FR
05 / PREJBEANU, Ioan-Lucian
41 rue de Comboire
38170 Seyssinet Pariset / FR
 [2020/19]
Representative(s)IPAZ
Bâtiment Platon
Parc Les Algorithmes
91190 Saint-Aubin / FR
[2023/07]
Former [2020/19]IPAZ
Parc Les Algorithmes, Bâtiment Platon
CS 70003 Saint-Aubin
91192 Gif-sur-Yvette Cedex / FR
Application number, filing date18738220.527.06.2018
[2020/19]
WO2018EP67180
Priority number, dateFR2017005597228.06.2017         Original published format: FR 1755972
[2020/19]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report
No.:WO2019002334
Date:03.01.2019
Language:FR
[2019/01]
Type: A1 Application with search report 
No.:EP3646046
Date:06.05.2020
Language:FR
The application published by WIPO in one of the EPO official languages on 03.01.2019 takes the place of the publication of the European patent application.
[2020/19]
Type: B1 Patent specification 
No.:EP3646046
Date:15.02.2023
Language:FR
[2023/07]
Search report(s)International search report - published on:EP03.01.2019
ClassificationIPC:G01R33/04, G01R33/09
[2020/19]
CPC:
G01R33/098 (EP); G01R33/04 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/19]
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:VORRICHTUNG ZUR MESSUNG SCHWACHER MAGNETFELDER[2020/19]
English:DEVICE FOR MEASURING WEAK MAGNETIC FIELDS[2020/19]
French:DISPOSITIF DE MESURE DE CHAMPS MAGNETIQUES FAIBLES[2020/19]
Entry into regional phase20.01.2020National basic fee paid 
20.01.2020Designation fee(s) paid 
20.01.2020Examination fee paid 
Examination procedure20.01.2020Examination requested  [2020/19]
20.01.2020Date on which the examining division has become responsible
10.08.2020Amendment by applicant (claims and/or description)
19.04.2021Despatch of a communication from the examining division (Time limit: M06)
29.09.2021Reply to a communication from the examining division
18.10.2022Communication of intention to grant the patent
26.12.2022Fee for grant paid
26.12.2022Fee for publishing/printing paid
26.12.2022Receipt of the translation of the claim(s)
Opposition(s)16.11.2023No opposition filed within time limit [2024/04]
Fees paidRenewal fee
22.05.2020Renewal fee patent year 03
28.05.2021Renewal fee patent year 04
25.05.2022Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT15.02.2023
CZ15.02.2023
DK15.02.2023
EE15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
IT15.02.2023
LT15.02.2023
LV15.02.2023
MC15.02.2023
NL15.02.2023
PL15.02.2023
RO15.02.2023
RS15.02.2023
SE15.02.2023
SI15.02.2023
SK15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
IE27.06.2023
LU27.06.2023
[2024/26]
Former [2024/21]AT15.02.2023
CZ15.02.2023
DK15.02.2023
EE15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
MC15.02.2023
NL15.02.2023
PL15.02.2023
RO15.02.2023
RS15.02.2023
SE15.02.2023
SI15.02.2023
SK15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
IE27.06.2023
LU27.06.2023
Former [2024/15]AT15.02.2023
CZ15.02.2023
DK15.02.2023
EE15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
MC15.02.2023
NL15.02.2023
PL15.02.2023
RO15.02.2023
RS15.02.2023
SE15.02.2023
SI15.02.2023
SK15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
LU27.06.2023
Former [2024/11]AT15.02.2023
CZ15.02.2023
DK15.02.2023
EE15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
MC15.02.2023
NL15.02.2023
PL15.02.2023
RO15.02.2023
RS15.02.2023
SE15.02.2023
SI15.02.2023
SK15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
Former [2024/09]AT15.02.2023
CZ15.02.2023
DK15.02.2023
EE15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
MC15.02.2023
NL15.02.2023
PL15.02.2023
RO15.02.2023
RS15.02.2023
SE15.02.2023
SK15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
Former [2023/50]AT15.02.2023
CZ15.02.2023
DK15.02.2023
EE15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
NL15.02.2023
PL15.02.2023
RO15.02.2023
RS15.02.2023
SE15.02.2023
SK15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
Former [2023/49]AT15.02.2023
CZ15.02.2023
DK15.02.2023
EE15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
NL15.02.2023
PL15.02.2023
RO15.02.2023
RS15.02.2023
SE15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
Former [2023/48]AT15.02.2023
DK15.02.2023
EE15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
NL15.02.2023
PL15.02.2023
RS15.02.2023
SE15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
Former [2023/46]AT15.02.2023
DK15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
NL15.02.2023
PL15.02.2023
RS15.02.2023
SE15.02.2023
SM15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
Former [2023/39]AT15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
NL15.02.2023
PL15.02.2023
RS15.02.2023
SE15.02.2023
NO15.05.2023
GR16.05.2023
IS15.06.2023
PT15.06.2023
Former [2023/38]AT15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
NL15.02.2023
PL15.02.2023
RS15.02.2023
SE15.02.2023
NO15.05.2023
GR16.05.2023
PT15.06.2023
Former [2023/37]AT15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
NL15.02.2023
RS15.02.2023
SE15.02.2023
NO15.05.2023
GR16.05.2023
PT15.06.2023
Former [2023/36]AT15.02.2023
ES15.02.2023
FI15.02.2023
HR15.02.2023
LT15.02.2023
LV15.02.2023
NL15.02.2023
RS15.02.2023
SE15.02.2023
NO15.05.2023
PT15.06.2023
Former [2023/35]AT15.02.2023
ES15.02.2023
HR15.02.2023
LT15.02.2023
NL15.02.2023
RS15.02.2023
NO15.05.2023
PT15.06.2023
Former [2023/34]ES15.02.2023
LT15.02.2023
RS15.02.2023
PT15.06.2023
Former [2023/33]ES15.02.2023
LT15.02.2023
Cited inInternational search[Y]US2004100855  (SAITO YOSHIAKI [JP], et al) [Y] 1 * paragraph [0096] - paragraph [0098] * * claim 3 *;
 [Y]US2006043960  (ITOH TOMOKI [JP], et al) [Y] 1 * abstract * * paragraph [0055] * * paragraph [0081] *;
 [Y]FR2943795  (CENTRE NAT RECH SCIENT [FR]) [Y] 1* abstract *;
 [XAYI]WO2012116933  (UNIV HANNOVER [DE], et al) [X] 1-3 * abstract * * et description correspondante * [A] 14 [Y] 1 [I] 4-13
ExaminationUS5452163
 US2013164549
by applicantUS7974048
 US8015694
 EP2411825
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.