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Extract from the Register of European Patents

EP About this file: EP3686590

EP3686590 - LASER DESORPTION/IONIZATION METHOD AND MASS SPECTROMETRY METHOD [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  26.07.2024
Database last updated on 27.07.2024
FormerThe patent has been granted
Status updated on  18.08.2023
FormerGrant of patent is intended
Status updated on  22.05.2023
FormerRequest for examination was made
Status updated on  26.06.2020
FormerThe international publication has been made
Status updated on  30.03.2019
Most recent event   Tooltip26.07.2024No opposition filed within time limitpublished on 28.08.2024 [2024/35]
Applicant(s)For all designated states
Hamamatsu Photonics K.K.
1126-1, Ichino-cho
Higashi-ku
Hamamatsu-shi, Shizuoka 435-8558 / JP
[2020/31]
Inventor(s)01 / NAITO Yasuhide
c/o The Graduate School for the Creation of New
Photonics Industries.
1955-1
Kurematsu-cho, Nishi-ku
Hamamatsu-shi Shizuoka 431-1202 / JP
02 / OHMURA Takayuki
c/o Hamamatsu Photonics K.K.
1126-1
Ichino-cho
Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
03 / KOTANI Masahiro
c/o Hamamatsu Photonics K.K.
1126-1
Ichino-cho
Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
 [2020/31]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstraße 4
80802 München / DE
[2020/31]
Application number, filing date18859270.303.08.2018
[2020/31]
WO2018JP29260
Priority number, dateJP2017018160121.09.2017         Original published format: JP 2017181601
[2020/31]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2019058784
Date:28.03.2019
Language:JA
[2019/13]
Type: A1 Application with search report 
No.:EP3686590
Date:29.07.2020
Language:EN
[2020/31]
Type: B1 Patent specification 
No.:EP3686590
Date:20.09.2023
Language:EN
[2023/38]
Search report(s)International search report - published on:JP28.03.2019
(Supplementary) European search report - dispatched on:EP12.05.2021
ClassificationIPC:H01J49/04, H01J49/16, G01N27/623
[2023/22]
CPC:
H01J49/0418 (EP,US); G01N27/623 (EP,US); H01J49/022 (US);
H01J49/025 (US); H01J49/161 (EP); H01J49/164 (US)
Former IPC [2021/23]H01J49/04, H01J49/16
Former IPC [2020/31]G01N27/62, H01J49/04, H01J49/10, H01J49/16
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/31]
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:LASER-DESORPTIONS-/IONISATIONSVERFAHREN UND MASSENSPEKTROMETRIEVERFAHREN[2020/31]
English:LASER DESORPTION/IONIZATION METHOD AND MASS SPECTROMETRY METHOD[2020/31]
French:PROCÉDÉ DE DÉSORPTION/IONISATION LASER ET PROCÉDÉ DE SPECTROMÉTRIE DE MASSE[2020/31]
Entry into regional phase16.04.2020Translation filed 
16.04.2020National basic fee paid 
16.04.2020Search fee paid 
16.04.2020Designation fee(s) paid 
16.04.2020Examination fee paid 
Examination procedure16.04.2020Examination requested  [2020/31]
02.08.2021Amendment by applicant (claims and/or description)
23.05.2023Communication of intention to grant the patent
16.08.2023Fee for grant paid
16.08.2023Fee for publishing/printing paid
16.08.2023Receipt of the translation of the claim(s)
Opposition(s)21.06.2024No opposition filed within time limit [2024/35]
Fees paidRenewal fee
16.04.2020Renewal fee patent year 03
13.08.2021Renewal fee patent year 04
28.06.2022Renewal fee patent year 05
05.07.2023Renewal fee patent year 06
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT20.09.2023
CZ20.09.2023
DK20.09.2023
EE20.09.2023
ES20.09.2023
FI20.09.2023
HR20.09.2023
IT20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
PL20.09.2023
RO20.09.2023
RS20.09.2023
SE20.09.2023
SK20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
PT22.01.2024
[2024/33]
Former [2024/26]AT20.09.2023
CZ20.09.2023
EE20.09.2023
ES20.09.2023
FI20.09.2023
HR20.09.2023
IT20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
PL20.09.2023
RO20.09.2023
RS20.09.2023
SE20.09.2023
SK20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
PT22.01.2024
Former [2024/25]AT20.09.2023
CZ20.09.2023
EE20.09.2023
ES20.09.2023
FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
PL20.09.2023
RO20.09.2023
RS20.09.2023
SE20.09.2023
SK20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
PT22.01.2024
Former [2024/23]AT20.09.2023
CZ20.09.2023
EE20.09.2023
ES20.09.2023
FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
RO20.09.2023
RS20.09.2023
SE20.09.2023
SK20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
PT22.01.2024
Former [2024/20]FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
RS20.09.2023
SE20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
Former [2024/14]FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
RS20.09.2023
SE20.09.2023
NO20.12.2023
GR21.12.2023
Former [2024/10]FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
RS20.09.2023
SE20.09.2023
NO20.12.2023
GR21.12.2023
Former [2024/09]FI20.09.2023
LT20.09.2023
SE20.09.2023
NO20.12.2023
GR21.12.2023
Former [2024/08]LT20.09.2023
NO20.12.2023
GR21.12.2023
Documents cited:Search[A]US6617575  (CRAMER RAINER KARL [GB]) [A] 1-5 * column 7, line 27 - line 29 * * column 9, line 28 - line 37 * * column 11, line 33 - line 51 * * column 14, line 37 - line 44 * * column 15, line 8 - line 37 ** figures 1A, 3A *;
 [IA]EP3214437  (HAMAMATSU PHOTONICS KK [JP]) [I] 1,2,5 * paragraph [0005] * * paragraph [0034] * * paragraph [0028] * * paragraph [0038] - paragraph [0044] * * paragraph [0077] - paragraph [0081] * * figure 17 * [A] 3,4
International search[A]JP3122331U  (SHIMADZU CORP.) [A] 1-5* , entire text, all drawings (Family: none) *;
 [A]WO2007046162  (JAPAN SCIENCE & TECH AGENCY [JP], et al) [A] 1-5 * , entire text, all drawings & US 2009/0095897 A1, whole document *;
 [A]WO2007066518  (NEC CORP [JP], et al) [A] 1-5 * , entire text, all drawings & US 2009/0301227 A1, whole document *;
 [A]JP2015197305  (CITIZEN FINEDEVICE CO LTD, et al) [A] 1-5 * , entire text, all drawings (Family: none) *;
 [A]WO2017038709  (HAMAMATSU PHOTONICS KK [JP]) [A] 1-5 * , entire text, all drawings & JP 2017-122732 A & US 2018/0158660 A1, whole document & EP 3214436 A1 & CN 107076705 A *
ExaminationEP3214437
by applicantUS7695978
 JP2014021048
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.