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Extract from the Register of European Patents

EP About this file: EP3518268

EP3518268 - CHARGED-PARTICLE SOURCE AND METHOD FOR CLEANING A CHARGED-PARTICLE SOURCE USING BACK-SPUTTERING [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  22.08.2024
Database last updated on 02.09.2024
FormerGrant of patent is intended
Status updated on  01.08.2024
FormerExamination is in progress
Status updated on  30.10.2020
FormerRequest for examination was made
Status updated on  31.01.2020
FormerThe application has been published
Status updated on  28.06.2019
Most recent event   Tooltip22.08.2024(Expected) grantpublished on 25.09.2024 [2024/39]
Applicant(s)For all designated states
IMS Nanofabrication GmbH
Wolfholzgasse 20-24
2345 Brunn am Gebirge / AT
[2024/11]
Former [2019/31]For all designated states
IMS Nanofabrication GmbH
Schreygasse 3
1020 Wien / AT
Inventor(s)01 / Platzgummer, Elmar
Strudlhofgasse 17
1090 Wien / AT
02 / Capriotti, Mattia
Leystraße 127
1200 Vienna / AT
03 / Spengler, Christoph
Diefenbachgasse 38-7
1150 Wien / AT
 [2019/31]
Representative(s)Patentanwaltskanzlei Matschnig & Forsthuber OG
Biberstraße 22
Postfach 36
1010 Wien / AT
[2019/31]
Application number, filing date19154110.129.01.2019
[2019/31]
Priority number, dateEP2018015414030.01.2018         Original published format: EP 18154140
[2019/31]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3518268
Date:31.07.2019
Language:EN
[2019/31]
Type: B1 Patent specification
No.:EP3518268
Date:25.09.2024
Language:EN
[2024/39]
Search report(s)(Supplementary) European search report - dispatched on:EP03.07.2019
ClassificationIPC:H01J37/063, H01J37/317, H01J37/06, H01J37/08
[2024/32]
CPC:
H01J37/08 (EP); H01J37/073 (KR); H01J1/304 (KR);
H01J37/06 (EP); H01J37/063 (EP); H01J37/3174 (EP,KR);
H01J37/3177 (EP); H01J2237/022 (EP); H01J2237/06308 (EP);
H01J2237/06316 (EP) (-)
Former IPC [2019/31]H01J37/06, H01J37/08
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/10]
Former [2019/31]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:LADUNGSTRÄGERQUELLE UND VERFAHREN ZUR REINIGUNG EINER LADUNGSTRÄGERQUELLE MITTELS RÜCKSPUTTERING[2019/31]
English:CHARGED-PARTICLE SOURCE AND METHOD FOR CLEANING A CHARGED-PARTICLE SOURCE USING BACK-SPUTTERING[2019/31]
French:SOURCE DE PARTICULES CHARGÉES ET PROCÉDÉ DE NETTOYAGE D'UNE SOURCE DE PARTICULES CHARGÉES À L'AIDE DE RÉTROPULVÉRISATION[2019/31]
Examination procedure29.01.2020Examination requested  [2020/10]
29.01.2020Date on which the examining division has become responsible
28.10.2020Despatch of a communication from the examining division (Time limit: M04)
14.01.2021Reply to a communication from the examining division
21.09.2023Despatch of a communication from the examining division (Time limit: M06)
18.03.2024Reply to a communication from the examining division
02.08.2024Communication of intention to grant the patent
20.08.2024Fee for grant paid
20.08.2024Fee for publishing/printing paid
20.08.2024Receipt of the translation of the claim(s)
Fees paidRenewal fee
07.01.2021Renewal fee patent year 03
26.01.2022Renewal fee patent year 04
18.01.2023Renewal fee patent year 05
31.01.2024Renewal fee patent year 06
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Documents cited:Search[A]US2005001178  (PARKER N WILLIAM [US], et al);
 [A]JP2007172862  (HITACHI HIGH TECH CORP);
 [A]EP2312609  (INTEGRATED CIRCUIT TESTING [DE]);
 [A]US8736170  (LIU KUN [US], et al)
by applicantUS6768125
 EP2187427
 EP2363875
 US8222621
 US8378320
 US9053906
 US9653263
 US9799487
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.