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Extract from the Register of European Patents

EP About this file: EP3854492

EP3854492 - APPARATUS FOR CLEANING COMPONENT OF SEMICONDUCTOR PRODUCTION APPARATUS, METHOD FOR CLEANING COMPONENT OF SEMICONDUCTOR PRODUCTION APPARATUS, AND SYSTEM FOR CLEANING COMPONENT OF SEMICONDUCTOR PRODUCTION APPARATUS [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  17.05.2024
Database last updated on 06.07.2024
FormerGrant of patent is intended
Status updated on  11.03.2024
FormerExamination is in progress
Status updated on  24.11.2023
FormerRequest for examination was made
Status updated on  25.06.2021
FormerThe international publication has been made
Status updated on  22.05.2020
Most recent event   Tooltip17.05.2024(Expected) grantpublished on 19.06.2024  [2024/25]
Applicant(s)For all designated states
Taiyo Nippon Sanso Corporation
3-26, Koyama 1-chome Shinagawa-ku
Tokyo 142-8558 / JP
[2021/30]
Inventor(s)01 / YAMAGUCHI Akira
c/o TAIYO NIPPON SANSO CORPORATION
3-26, Koyama 1-chome
Shinagawa-ku
Tokyo 142-8558 / JP
02 / ARIMURA Tadanobu
c/o TAIYO NIPPON SANSO CORPORATION
3-26, Koyama 1-chome
Shinagawa-ku
Tokyo 142-8558 / JP
 [2024/25]
Former [2021/30]01 / YAMAGUCHI Akira
c/o TAIYO NIPPON SANSO CORPORATION, 3-26, Koyama
1-chome, Shinagawa-ku
Tokyo 142-8558 / JP
02 / ARIMURA Tadanobu
c/o TAIYO NIPPON SANSO CORPORATION, 3-26, Koyama
1-chome, Shinagawa-ku
Tokyo 142-8558 / JP
Representative(s)HGF
HGF Limited
1 City Walk
Leeds LS11 9DX / GB
[2024/25]
Former [2021/30]HGF
1 City Walk
Leeds LS11 9DX / GB
Application number, filing date19884724.625.10.2019
[2021/30]
WO2019JP41870
Priority number, dateJP2018021579116.11.2018         Original published format: JP 2018215791
[2021/30]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2020100554
Date:22.05.2020
Language:JA
[2020/21]
Type: A1 Application with search report 
No.:EP3854492
Date:28.07.2021
Language:EN
[2021/30]
Type: B1 Patent specification 
No.:EP3854492
Date:19.06.2024
Language:EN
[2024/25]
Search report(s)International search report - published on:JP22.05.2020
(Supplementary) European search report - dispatched on:EP23.12.2021
ClassificationIPC:H01L21/67, C23C16/34, C23C16/44
[2024/12]
CPC:
H01L21/67109 (EP); C23C16/4405 (US); C23C16/34 (EP);
C23C16/4401 (EP); H01L21/02041 (US); H01L21/67028 (EP,US);
H01L21/67098 (US) (-)
Former IPC [2022/04]B08B7/00, H01L21/205, H01L21/67, C23C16/44
Former IPC [2021/30]B08B7/00, H01L21/205
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/30]
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:VORRICHTUNG ZUR REINIGUNG EINER KOMPONENTE EINER HALBLEITERHERSTELLUNGSEINRICHTUNG, VERFAHREN ZUR REINIGUNG EINER KOMPONENTE EINER HALBLEITERHERSTELLUNGSEINRICHTUNG UND SYSTEM ZUR REINIGUNG EINER KOMPONENTE EINER HALBLEITERHERSTELLUNGSEINRICHTUNG[2021/30]
English:APPARATUS FOR CLEANING COMPONENT OF SEMICONDUCTOR PRODUCTION APPARATUS, METHOD FOR CLEANING COMPONENT OF SEMICONDUCTOR PRODUCTION APPARATUS, AND SYSTEM FOR CLEANING COMPONENT OF SEMICONDUCTOR PRODUCTION APPARATUS[2021/30]
French:APPAREIL DE NETTOYAGE DE COMPOSANT D'APPAREIL DE PRODUCTION DE SEMI-CONDUCTEUR, PROCÉDÉ DE NETTOYAGE DE COMPOSANT D'APPAREIL DE PRODUCTION DE SEMI-CONDUCTEUR, ET SYSTÈME DE NETTOYAGE DE COMPOSANT D'APPAREIL DE PRODUCTION DE SEMI-CONDUCTEUR[2021/30]
Entry into regional phase21.04.2021Translation filed 
21.04.2021National basic fee paid 
21.04.2021Search fee paid 
21.04.2021Designation fee(s) paid 
21.04.2021Examination fee paid 
Examination procedure21.04.2021Examination requested  [2021/30]
23.05.2022Amendment by applicant (claims and/or description)
23.11.2023Despatch of a communication from the examining division (Time limit: M04)
22.01.2024Reply to a communication from the examining division
12.03.2024Communication of intention to grant the patent
10.05.2024Fee for grant paid
10.05.2024Fee for publishing/printing paid
10.05.2024Receipt of the translation of the claim(s)
Fees paidRenewal fee
11.10.2021Renewal fee patent year 03
14.10.2022Renewal fee patent year 04
26.09.2023Renewal fee patent year 05
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Documents cited:Search[XYI]JPH07249585  (FUJITSU LTD);
 [YA]US2002062837  (MIYANAGA MAMIKO [JP], et al);
 [YA]JP2018041883  (TAIYO NIPPON SANSO CORP)
International search[YA]JPH1187326  (EBARA CORP);
 [YA]JP2001515282  ;
 [YA]JP2010245376  (TAIYO NIPPON SANSO CORP);
 [YA]JP2011501429  ;
 [YA]JP2015192063  (TOKYO ELECTRON LTD);
 [XYA]JP2017168607  (TAIYO NIPPON SANSO CORP);
 [A]JP2018041883  (TAIYO NIPPON SANSO CORP)
by applicantJP2013062342
 JP2015073132
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.