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Extract from the Register of European Patents

EP About this file: EP3779417

EP3779417 - SAMPLE HOLDING DEVICE FOR X-RAY ANALYSIS [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  15.03.2024
Database last updated on 03.10.2024
FormerGrant of patent is intended
Status updated on  20.12.2023
FormerExamination is in progress
Status updated on  28.04.2023
FormerRequest for examination was made
Status updated on  08.10.2021
FormerThe application has been published
Status updated on  15.01.2021
Most recent event   Tooltip15.03.2024(Expected) grantpublished on 17.04.2024  [2024/16]
Applicant(s)For all designated states
Rigaku Corporation
3-9-12, Matsubara-cho Akishima-shi
Tokyo 196-8666 / JP
[2021/07]
Inventor(s)01 / ITO, Koichiro
c/o Rigaku Corporation
3-9-12, Matsubara-cho
Akishima-shi, Tokyo, 196-8666 / JP
 [2024/03]
Former [2021/07]01 / ITO, Koichiro
c/o Rigaku Corporation, 3-9-12, Matsubara-cho
Akishima-shi
Tokyo, 196-8666 / JP
Representative(s)Lambacher, Michael, et al
V. Füner Ebbinghaus Finck Hano
Patentanwälte
Mariahilfplatz 3
81541 München / DE
[2021/07]
Application number, filing date20190798.713.08.2020
[2021/07]
Priority number, dateJP2019014938316.08.2019         Original published format: JP 2019149383
[2021/07]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP3779417
Date:17.02.2021
Language:EN
[2021/07]
Type: A3 Search report 
No.:EP3779417
Date:07.04.2021
Language:EN
[2021/14]
Type: B1 Patent specification 
No.:EP3779417
Date:17.04.2024
Language:EN
[2024/16]
Search report(s)(Supplementary) European search report - dispatched on:EP04.03.2021
ClassificationIPC:G01N23/20025
[2021/07]
CPC:
G01N23/20025 (EP,CN,KR,US); G01N23/2204 (CN,KR,US); G01T7/02 (KR);
G21F7/02 (KR); G01N2223/056 (US); G01N2223/1016 (US);
G01N2223/309 (US); G01N23/207 (US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/45]
Former [2021/07]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:PROBENHALTEVORRICHTUNG ZUR RÖNTGENANALYSE[2021/07]
English:SAMPLE HOLDING DEVICE FOR X-RAY ANALYSIS[2021/07]
French:DISPOSITIF DE SUPPORT D'ÉCHANTILLON POUR ANALYSE AUX RAYONS X[2021/07]
Examination procedure05.10.2021Amendment by applicant (claims and/or description)
05.10.2021Examination requested  [2021/45]
05.10.2021Date on which the examining division has become responsible
03.05.2023Despatch of a communication from the examining division (Time limit: M04)
31.08.2023Reply to a communication from the examining division
21.12.2023Communication of intention to grant the patent
08.03.2024Fee for grant paid
08.03.2024Fee for publishing/printing paid
08.03.2024Receipt of the translation of the claim(s)
Fees paidRenewal fee
25.08.2022Renewal fee patent year 03
25.08.2023Renewal fee patent year 04
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US3409769  (MCKINNEY CHARLES N, et al) [A] 1-7* column 7, line 26 - line 60; figures 5,6 *;
 [A]US3478207  (GOERKE ROLF, et al) [A] 1-7 * column 4, line 30 - line 32; figures 6-8 *;
 [XYI]US3973120  (KESSELS HENRICUS MATHIAS MARIE) [X] 1,3,7 * column 2, line 4 - line 35 * * column 3, line 32 - line 37 * [Y] 2 [I] 6;
 [A]US5181233  (RINK WILLIAM J [US], et al) [A] 1-7 * column 2, line 41 - column 3, line 66; figures 1-3 *;
 [Y]WO9915886  (UNIV BIRMINGHAM [GB], et al) [Y] 2 * page 7, line 3 - line 17; figure 2 *;
 [X]US2003095634  (DOSHO AKIHIDE [JP]) [X] 1 * paragraph [0048] - paragraph [0050]; figure 2 *;
 [A]WO2006021961  (QUANTOMIX LTD [IL], et al) [A] 1-7 * page 12, line 4 - line 12 *;
 [X]  - RITTER J J, "AN HERMETICALLY SEALED INERT ATMOSPHERE CELL FOR X-RAY POWDER DIFFRACTION", POWDER DIFFRACTION, JCPDS-INTERNATIONAL CENTRE FOR DIFFRACTION DATA, WSARTHMORE, US, (19880301), vol. 3, no. 1, ISSN 0885-7156, page 30/31, XP009040615 [X] 1 * page 30, column rhc; figure 1 *
 [A]  - RODRIGUEZ MARK A. ET AL, "A beryllium dome specimen holder for XRD analysis of air sensitive materials", POWDER DIFFRACTION, US, (20080601), vol. 23, no. 2, doi:10.1154/1.2912452, ISSN 0885-7156, pages 121 - 124, XP055776503 [A] 1-7 * figure 1 *

DOI:   http://dx.doi.org/10.1154/1.2912452
by applicantJPH116805
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.