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Extract from the Register of European Patents

EP About this file: EP3839599

EP3839599 - METROLOGY SYSTEM WITH TRANSPARENT WORKPIECE SURFACE MODE [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  21.05.2021
Database last updated on 28.09.2024
Most recent event   Tooltip27.11.2023New entry: Renewal fee paid 
Applicant(s)For all designated states
Mitutoyo Corporation
20-1, Sakado 1-chome
Takatsu-ku
Kawasaki-shi, Kanagawa 213-8533 / JP
[2021/25]
Inventor(s)01 / BRYLL, Robert Kamil
c/o Micro Encoder, Inc.
11533 Northeast 118th Street
Kirkland, WA Washington 98034 / US
 [2021/25]
Representative(s)MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB
Paul-Heyse-Strasse 29
80336 München / DE
[2021/25]
Application number, filing date20209157.523.11.2020
[2021/25]
Priority number, dateUS20191672043219.12.2019         Original published format: US201916720432
[2021/25]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3839599
Date:23.06.2021
Language:EN
[2021/25]
Search report(s)(Supplementary) European search report - dispatched on:EP07.04.2021
ClassificationIPC:G02B21/36
[2021/25]
CPC:
G02B21/367 (EP,US); G01N21/01 (CN); H04N23/67 (US);
G01B11/24 (EP); G01N21/88 (US); G01N21/8806 (EP);
G01N21/8851 (CN); G01N21/958 (EP); G02B21/361 (US);
G02B21/368 (EP,US); H04N23/673 (EP); G01N2021/0162 (CN);
G01N2021/0181 (CN) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/25]
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:METROLOGIESYSTEM MIT TRANSPARENTEM WERKSTÜCKOBERFLÄCHENMODUS[2021/25]
English:METROLOGY SYSTEM WITH TRANSPARENT WORKPIECE SURFACE MODE[2021/25]
French:SYSTÈME DE MÉTROLOGIE AVEC MODE DE SURFACE DE PIÈCE TRANSPARENTE[2021/25]
Examination procedure23.11.2020Examination requested  [2021/25]
14.12.2021Amendment by applicant (claims and/or description)
Fees paidRenewal fee
28.11.2022Renewal fee patent year 03
27.11.2023Renewal fee patent year 04
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See the Register of the Unified Patent Court for opt-out data
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Documents cited:Search[XI]US2013100272  (PRICE JEFFREY H [US], et al) [X] 1,13 * abstract * * Table 1 * * paragraph [0005] * * paragraphs [0012] , [0023] , [0133] , [0140] * * paragraphs [0073] , [0080] , [0083] * [I] 2-12,14-16;
 [A]  - MUHAMMAD M ET AL, "Sampling for Shape from Focus in Optical Microscopy", IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, IEEE COMPUTER SOCIETY, USA, (20120301), vol. 34, no. 3, doi:10.1109/TPAMI.2011.144, ISSN 0162-8828, pages 564 - 573, XP011490653 [A] 1-16 * the whole document *

DOI:   http://dx.doi.org/10.1109/TPAMI.2011.144
 [A]  - RORY M. POWER ET AL, "Adaptable, illumination patterning light sheet microscopy", SCIENTIFIC REPORTS, (20180625), vol. 8, no. 1, doi:10.1038/s41598-018-28036-2, XP055738783 [A] 1-16 * the whole document *

DOI:   http://dx.doi.org/10.1038/s41598-018-28036-2
 [A]  - PIAZZA SIMONLUCA ET AL, "Enhanced volumetric imaging in 2-photon microscopy via acoustic lens beam shaping", JOURNAL OF BIOPHOTONICS, DE, vol. 11, no. 2, doi:10.1002/jbio.201700050, ISSN 1864-063X, (20170725), URL: https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fjbio.201700050, XP055787772 [A] 1-16 * the whole document *

DOI:   http://dx.doi.org/10.1002/jbio.201700050
by applicantUS6542180
 US7030351
 US7324682
 US7454053
 US7570795
 US7627162
 US8111905
 US8111938
 US8581162
 US9060117
 US9143674
 US9830694
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.