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Extract from the Register of European Patents

EP About this file: EP4018443

EP4018443 - SEQUENTIAL SLC READ OPTIMIZATION [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  27.05.2022
Database last updated on 14.09.2024
FormerThe international publication has been made
Status updated on  26.02.2021
Most recent event   Tooltip26.08.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Micron Technology, Inc.
8000 South Federal Way
Boise, ID 83716 / US
[2022/26]
Inventor(s)01 / IWASAKI, Tomoko Ogura
5925 Hosta Lane
San Jose, California 95124 / US
02 / EVANS, Tracy D.
825 East State Street
Boise, Idaho 83712 / US
03 / TRIVEDI, Avani F.
3303 South Island Fox Avenue
Boise, Idaho 83616 / US
04 / LIMAYE, Aparna U.
1472 East Spinnaker Court
Boise, Idaho 83706 / US
05 / HUANG, Jianmin
116 Club Drive
San Carlos, California 94070 / US
 [2022/26]
Representative(s)Marks & Clerk LLP
15 Fetter Lane
London EC4A 1BW / GB
[N/P]
Former [2022/26]Granleese, Rhian Jane, et al
Marks & Clerk LLP
15 Fetter Lane
London EC4A 1BW / GB
Application number, filing date20854956.820.08.2020
[2022/26]
WO2020US47263
Priority number, dateUS201962889240P20.08.2019         Original published format: US 201962889240 P
US20201694779517.08.2020         Original published format: US202016947795
[2022/26]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021035085
Date:25.02.2021
Language:EN
[2021/08]
Type: A1 Application with search report 
No.:EP4018443
Date:29.06.2022
Language:EN
The application published by WIPO in one of the EPO official languages on 25.02.2021 takes the place of the publication of the European patent application.
[2022/26]
Search report(s)International search report - published on:KR25.02.2021
(Supplementary) European search report - dispatched on:EP25.08.2023
ClassificationIPC:G06F13/16, G11C16/26, G11C11/56, G11C8/06, G11C8/08, G11C7/10, G06F3/06
[2023/39]
CPC:
G11C11/5642 (EP,KR); G11C16/26 (EP,KR); G11C11/4087 (US);
G06F12/0246 (KR,US); G06F13/1631 (EP); G11C11/4074 (US);
G11C11/4085 (US); G06F2212/7201 (KR,US) (-)
Former IPC [2022/26]G11C8/06, G11C8/08, G11C7/10, G06F3/06
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/26]
TitleGerman:SEQUENTIELLE SLC-LESEOPTIMIERUNG[2022/26]
English:SEQUENTIAL SLC READ OPTIMIZATION[2022/26]
French:OPTIMISATION SÉQUENTIELLE DE LECTURE DE SLC[2022/26]
Entry into regional phase18.03.2022National basic fee paid 
18.03.2022Search fee paid 
18.03.2022Designation fee(s) paid 
18.03.2022Examination fee paid 
Examination procedure18.03.2022Examination requested  [2022/26]
22.03.2024Amendment by applicant (claims and/or description)
22.03.2024Date on which the examining division has become responsible
Fees paidRenewal fee
18.03.2022Renewal fee patent year 03
28.08.2023Renewal fee patent year 04
26.08.2024Renewal fee patent year 05
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Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XI]US6559850  (STRONGIN GEOFFREY S [US], et al);
 [A]US2012311247  (YEH CHIH-KANG [TW]);
 [A]US2013262745  (LIN GARY [US], et al)
International search[A]US2009073771  (LI YAN [US]) [A] 1-20;
 [Y]US7688614  (MORIMOTO HIDENORI [JP]) [Y] 4-6,11-13,18-20;
 [A]KR20100122720  (SAMSUNG ELECTRONICS CO LTD [KR]) [A] 1-20;
 [A]KR20140116617  (AJOU UNIV IND ACAD COOP FOUND [KR])[A] 1-20;
 [YX]US9514057  (MARCU ALON [IL], et al) [Y] 4-6,11-13,18-20 [X] 1-3,7-10,14-17
by applicantUS6559850
 US2012311247
 US2013262745
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.