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Extract from the Register of European Patents

EP About this file: EP4022669

EP4022669 - ELECTROSTATIC LENS FOR CONTROLLING BEAM OF ELECTRONS [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  03.06.2022
Database last updated on 30.10.2024
FormerThe international publication has been made
Status updated on  05.03.2021
Most recent event   Tooltip26.06.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Scienta Omicron AB
Box 15120
750 15 Uppsala / SE
[2022/27]
Inventor(s)01 / OLOFSSON, Mikael
Torkelsgatan 30 D
753 29 Uppsala / SE
 [2022/27]
Representative(s)Zacco Sweden AB
P.O. Box 5581
Löjtnantsgatan 21
114 85 Stockholm / SE
[2022/27]
Application number, filing date20856886.527.08.2020
[2022/27]
WO2020SE50824
Priority number, dateSE2019000014330.08.2019         Original published format: SE 1900143
SE2019005107724.09.2019         Original published format: SE 1951077
[2022/27]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021040609
Date:04.03.2021
Language:EN
[2021/09]
Type: A1 Application with search report 
No.:EP4022669
Date:06.07.2022
Language:EN
The application published by WIPO in one of the EPO official languages on 04.03.2021 takes the place of the publication of the European patent application.
[2022/27]
Search report(s)International search report - published on:SE04.03.2021
(Supplementary) European search report - dispatched on:EP08.09.2023
ClassificationIPC:H01J49/44, G01N23/227, H01J37/05, H01J49/00, H01J49/28, H01J49/46, H01J49/48
[2022/27]
CPC:
G01N23/227 (EP); H01J49/48 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/27]
TitleGerman:ELEKTROSTATISCHE LINSE ZUR STEUERUNG EINES ELEKTRONENSTRAHLS[2022/27]
English:ELECTROSTATIC LENS FOR CONTROLLING BEAM OF ELECTRONS[2022/27]
French:LENTILLE ÉLECTROSTATIQUE POUR COMMANDER UN FAISCEAU D'ÉLECTRONS[2022/27]
Entry into regional phase21.02.2022National basic fee paid 
21.02.2022Search fee paid 
21.02.2022Designation fee(s) paid 
21.02.2022Examination fee paid 
Examination procedure21.02.2022Examination requested  [2022/27]
25.03.2024Amendment by applicant (claims and/or description)
25.03.2024Date on which the examining division has become responsible
Fees paidRenewal fee
20.07.2022Renewal fee patent year 03
19.07.2023Renewal fee patent year 04
26.06.2024Renewal fee patent year 05
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]JP2003207470  (JEOL LTD) [X] 1-7,10-12,14 * figures 1,5,6,7 * * paragraph [0003] - paragraph [0031] *;
 [XI]US2014361161  (WANNBERG BJÖRN [SE]) [X] 1,3-6,8,10,13-16 * figures 4,5A,5B,7,8A,8B * * paragraphs [0010] , [0041] - paragraph [0072] *[I] 9
International search[A]EP0452969  (HITACHI LTD [JP]) [A] 1-16 * ; abstract *;
 [A]EP0462554  (HITACHI LTD [JP]) [A] 1-16 * ; abstract; figure 1 *;
 [A]EP0910109  (ADVANTEST CORP [JP]) [A] 1-16 * ; abstract *;
 [A]US2006145087  (PARKER N W [US]) [A] 1-16 * ; abstract *;
 [A]US7233008  (PETROV IGOR [IL], et al) [A] 1-16* ; abstract *;
 [A]WO2008087386  (OXFORD INSTR ANALYTICAL LTD [GB], et al) [A] 1-16 * ; abstract *;
 [A]JP2009146042  (FUJI XEROX CO LTD) [A] 1-16 * ; abstract from EPODOC *;
 [A]US2014001372  (SCHWIND GREGORY A [US], et al) [A] 1-16 * ; figure 1; claims 1,8; paragraph [0053] *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.