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Extract from the Register of European Patents

EP About this file: EP4038520

EP4038520 - METHODS AND APPARATUS TO ATTEST OBJECTS IN EDGE COMPUTING ENVIRONMENTS [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  08.07.2022
Database last updated on 14.06.2024
FormerThe international publication has been made
Status updated on  10.04.2021
Most recent event   Tooltip01.03.2024The date on which the examining division becomes responsible, has been established 
01.03.2024Amendment by applicant 
Applicant(s)For all designated states
INTEL Corporation
2200 Mission College Blvd.
Santa Clara, CA 95054 / US
[2022/32]
Inventor(s)01 / SMITH, Ned M.
375 SW Delta Drive
Beaverton, Oregon 97006 / US
02 / SABELLA, Dario
Emil-Dittler Strasse 12
81479 Munich / DE
03 / DOSHI, Kshitij Arun
2101 E Balboa Drive
Tempe, Arizona 85282 / US
04 / GUIM BERNAT, Francesc
Casanova 148, 6e 1a
08036 Barcelona / ES
05 / GADIYAR, Rajesh
2641 W Erie Street
Chandler, Arizona 85224 / US
 [2022/32]
Representative(s)Maiwald GmbH
Engineering
Elisenhof
Elisenstrasse 3
80335 München / DE
[N/P]
Former [2022/32]Maiwald Patent- und Rechtsanwaltsgesellschaft mbH
Engineering
Elisenhof
Elisenstrasse 3
80335 München / DE
Application number, filing date20871565.630.09.2020
[2022/32]
WO2020US53649
Priority number, dateUS201962908386P30.09.2019         Original published format: US 201962908386 P
[2022/32]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021067510
Date:08.04.2021
Language:EN
[2021/14]
Type: A1 Application with search report 
No.:EP4038520
Date:10.08.2022
Language:EN
The application published by WIPO in one of the EPO official languages on 08.04.2021 takes the place of the publication of the European patent application.
[2022/32]
Search report(s)International search report - published on:KR08.04.2021
(Supplementary) European search report - dispatched on:EP02.08.2023
ClassificationIPC:G06F21/30, H04L9/32, H04L67/125, G06F21/44
[2023/35]
CPC:
H04L67/125 (EP); H04L63/08 (US); G06F21/44 (EP);
H04L9/3247 (EP); H04L9/3297 (EP)
Former IPC [2022/32]G06F21/30, H04L29/06, H04L29/08, H04L9/32
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/32]
TitleGerman:VERFAHREN UND VORRICHTUNG ZUR BESTÄTIGUNG VON OBJEKTEN IN EDGE-COMPUTING-UMGEBUNGEN[2022/32]
English:METHODS AND APPARATUS TO ATTEST OBJECTS IN EDGE COMPUTING ENVIRONMENTS[2022/32]
French:PROCÉDÉS ET APPAREIL PERMETTANT L'ATTESTATION D'OBJETS DANS DES ENVIRONNEMENTS INFORMATIQUES PÉRIPHÉRIQUES[2022/32]
Entry into regional phase24.01.2022National basic fee paid 
24.01.2022Search fee paid 
24.01.2022Designation fee(s) paid 
24.01.2022Examination fee paid 
Examination procedure24.01.2022Examination requested  [2022/32]
29.02.2024Amendment by applicant (claims and/or description)
29.02.2024Date on which the examining division has become responsible
Fees paidRenewal fee
26.08.2022Renewal fee patent year 03
29.08.2023Renewal fee patent year 04
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Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XI]US2011320823  (SAROIU STEFAN [US], et al) [X] 1-4,6-10,13-16 * paragraph [0021] * * paragraph [0029] - paragraph [0052] * * paragraph [0055] * * figure 3 * [I] 5,11,12;
 [A]JP2015219796  (YAHOO JAPAN CORP) [A] 1-16 * paragraph [0048] - paragraph [0050] *;
 [A]WO2016137307  (SAMSUNG ELECTRONICS CO LTD [KR]) [A] 1-16* paragraph [0049] *
International search[Y]US8850588  (KUMAR SRINIVAS [US], et al) [Y] 1-22,24-25;
 [A]WO2018026841  (GEORGIA TECH RES INST [US])[A] 1-22,24-25;
 [A]US2018373863  (DOMKE FELIX STEFAN [DE]) [A] 1-22,24-25;
 [A]US2019138294  (SMITH NED M [US], et al) [A] 1-22,24-25;
 [Y]US2019230002  (BERNAT FRANCESC GUIM [ES], et al) [Y] 1-22,24-25
by applicantUS2011320823
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.