EP4038520 - METHODS AND APPARATUS TO ATTEST OBJECTS IN EDGE COMPUTING ENVIRONMENTS [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 08.07.2022 Database last updated on 14.06.2024 | |
Former | The international publication has been made Status updated on 10.04.2021 | Most recent event Tooltip | 01.03.2024 | The date on which the examining division becomes responsible, has been established | 01.03.2024 | Amendment by applicant | Applicant(s) | For all designated states INTEL Corporation 2200 Mission College Blvd. Santa Clara, CA 95054 / US | [2022/32] | Inventor(s) | 01 /
SMITH, Ned M. 375 SW Delta Drive Beaverton, Oregon 97006 / US | 02 /
SABELLA, Dario Emil-Dittler Strasse 12 81479 Munich / DE | 03 /
DOSHI, Kshitij Arun 2101 E Balboa Drive Tempe, Arizona 85282 / US | 04 /
GUIM BERNAT, Francesc Casanova 148, 6e 1a 08036 Barcelona / ES | 05 /
GADIYAR, Rajesh 2641 W Erie Street Chandler, Arizona 85224 / US | [2022/32] | Representative(s) | Maiwald GmbH Engineering Elisenhof Elisenstrasse 3 80335 München / DE | [N/P] |
Former [2022/32] | Maiwald Patent- und Rechtsanwaltsgesellschaft mbH Engineering Elisenhof Elisenstrasse 3 80335 München / DE | Application number, filing date | 20871565.6 | 30.09.2020 | [2022/32] | WO2020US53649 | Priority number, date | US201962908386P | 30.09.2019 Original published format: US 201962908386 P | [2022/32] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2021067510 | Date: | 08.04.2021 | Language: | EN | [2021/14] | Type: | A1 Application with search report | No.: | EP4038520 | Date: | 10.08.2022 | Language: | EN | The application published by WIPO in one of the EPO official languages on 08.04.2021 takes the place of the publication of the European patent application. | [2022/32] | Search report(s) | International search report - published on: | KR | 08.04.2021 | (Supplementary) European search report - dispatched on: | EP | 02.08.2023 | Classification | IPC: | G06F21/30, H04L9/32, H04L67/125, G06F21/44 | [2023/35] | CPC: |
H04L67/125 (EP);
H04L63/08 (US);
G06F21/44 (EP);
H04L9/3247 (EP);
H04L9/3297 (EP)
|
Former IPC [2022/32] | G06F21/30, H04L29/06, H04L29/08, H04L9/32 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2022/32] | Title | German: | VERFAHREN UND VORRICHTUNG ZUR BESTÄTIGUNG VON OBJEKTEN IN EDGE-COMPUTING-UMGEBUNGEN | [2022/32] | English: | METHODS AND APPARATUS TO ATTEST OBJECTS IN EDGE COMPUTING ENVIRONMENTS | [2022/32] | French: | PROCÉDÉS ET APPAREIL PERMETTANT L'ATTESTATION D'OBJETS DANS DES ENVIRONNEMENTS INFORMATIQUES PÉRIPHÉRIQUES | [2022/32] | Entry into regional phase | 24.01.2022 | National basic fee paid | 24.01.2022 | Search fee paid | 24.01.2022 | Designation fee(s) paid | 24.01.2022 | Examination fee paid | Examination procedure | 24.01.2022 | Examination requested [2022/32] | 29.02.2024 | Amendment by applicant (claims and/or description) | 29.02.2024 | Date on which the examining division has become responsible | Fees paid | Renewal fee | 26.08.2022 | Renewal fee patent year 03 | 29.08.2023 | Renewal fee patent year 04 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XI]US2011320823 (SAROIU STEFAN [US], et al) [X] 1-4,6-10,13-16 * paragraph [0021] * * paragraph [0029] - paragraph [0052] * * paragraph [0055] * * figure 3 * [I] 5,11,12; | [A]JP2015219796 (YAHOO JAPAN CORP) [A] 1-16 * paragraph [0048] - paragraph [0050] *; | [A]WO2016137307 (SAMSUNG ELECTRONICS CO LTD [KR]) [A] 1-16* paragraph [0049] * | International search | [Y]US8850588 (KUMAR SRINIVAS [US], et al) [Y] 1-22,24-25; | [A]WO2018026841 (GEORGIA TECH RES INST [US])[A] 1-22,24-25; | [A]US2018373863 (DOMKE FELIX STEFAN [DE]) [A] 1-22,24-25; | [A]US2019138294 (SMITH NED M [US], et al) [A] 1-22,24-25; | [Y]US2019230002 (BERNAT FRANCESC GUIM [ES], et al) [Y] 1-22,24-25 | by applicant | US2011320823 |