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EP4029055
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EP About this file: EP4029055
| EP4029055 - SYSTEMS AND PROCESSES FOR INCREASING SEMICONDUCTOR DEVICE RELIABILITY [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 17.06.2022 Database last updated on 03.09.2024 | |
| Former | The international publication has been made Status updated on 17.04.2021 | Most recent event Tooltip | 27.08.2024 | New entry: Renewal fee paid | Applicant(s) | For all designated states Wolfspeed, Inc. 4600 Silicon Drive Durham, NC 27703 / US | [2022/29] | Inventor(s) | 01 /
JOO, Sung Chul 611 Stafford Brook Lane Cary, North Carolina 27519 / US | 02 /
POWELL, Jack 8544 Wolverton Fields Drive Wake Forest, North Carolina 27587 / US | 03 /
FARRELL, Donald 2311 Carriage Oaks Drive Raleigh, North Carolina 27614 / US | 04 /
MILLON, Bradley 5002 Lindon Oaks Avenue Durham, North Carolina 27713 / US | [2022/29] | Representative(s) | Isarpatent Patent- und Rechtsanwälte Barth Charles Hassa Peckmann & Partner mbB Friedrichstrasse 31 80801 München / DE | [2022/29] | Application number, filing date | 20875483.8 | 19.08.2020 | [2022/29] | WO2020US46981 | Priority number, date | US201916597224 | 09.10.2019 Original published format: US201916597224 | [2022/29] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2021071591 | Date: | 15.04.2021 | Language: | EN | [2021/15] | Type: | A1 Application with search report | No.: | EP4029055 | Date: | 20.07.2022 | Language: | EN | The application published by WIPO in one of the EPO official languages on 15.04.2021 takes the place of the publication of the European patent application. | [2022/29] | Search report(s) | International search report - published on: | US | 15.04.2021 | (Supplementary) European search report - dispatched on: | EP | 06.10.2023 | Classification | IPC: | H01L27/00, H01L33/62, H01L23/482, H01L23/528, H01L29/872, H01L23/00 | [2023/45] | CPC: |
H01P1/047 (EP);
H01L23/4821 (KR);
H01L24/37 (EP,US);
H01L21/4885 (KR);
H01L23/4824 (KR);
H01L23/488 (KR);
H01L23/562 (EP,KR,US);
H01L23/66 (EP,KR,US);
H01L24/03 (KR);
H01L24/07 (KR);
H01L24/35 (US);
H01L24/40 (EP,US);
H01L24/84 (EP,US);
H01P11/003 (EP,US);
H01P3/003 (US);
H01P5/02 (EP);
H05K1/115 (KR);
H01L2223/6627 (EP,US);
H01L2224/37012 (EP,US);
H01L2224/37147 (EP);
H01L2224/37155 (EP);
H01L2224/3716 (EP);
H01L2224/40091 (EP);
H01L2224/40105 (EP);
H01L2224/40111 (EP);
H01L2224/40157 (EP,US);
H01L2224/40159 (EP);
H01L2224/40227 (EP);
H01L2224/40229 (EP);
H01L2224/84801 (EP);
H01L2924/10272 (EP);
H01L2924/1033 (EP);
H01L2924/12032 (EP);
H01L2924/13064 (EP);
H01L2924/13091 (EP);
H01L2924/1421 (EP);
H01L2924/19033 (US);
H01L2924/3025 (EP);
H01L2924/3512 (EP);
H01L2924/35121 (EP,US)
(-)
| C-Set: |
H01L2224/37147, H01L2924/00014 (EP);
H01L2224/37155, H01L2924/01027 (EP);
H01L2224/3716, H01L2924/01027 (EP);
H01L2224/3716, H01L2924/01028 (EP) |
| Former IPC [2022/29] | H01L27/00, H01L33/62, H01L23/482, H01L23/528, H01L29/872 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2022/29] | Title | German: | SYSTEME UND VERFAHREN ZUM ERHÖHEN DER ZUVERLÄSSIGKEIT VON HALBLEITERBAUELEMENTEN | [2022/29] | English: | SYSTEMS AND PROCESSES FOR INCREASING SEMICONDUCTOR DEVICE RELIABILITY | [2022/29] | French: | SYSTÈMES ET PROCÉDÉS POUR ACCROÎTRE LA FIABILITÉ D'UN DISPOSITIF À SEMI-CONDUCTEUR | [2022/29] | Entry into regional phase | 13.04.2022 | National basic fee paid | 13.04.2022 | Search fee paid | 13.04.2022 | Designation fee(s) paid | 13.04.2022 | Examination fee paid | Examination procedure | 13.04.2022 | Examination requested [2022/29] | 25.04.2024 | Amendment by applicant (claims and/or description) | 25.04.2024 | Date on which the examining division has become responsible | Fees paid | Renewal fee | 29.08.2022 | Renewal fee patent year 03 | 28.08.2023 | Renewal fee patent year 04 | 27.08.2024 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XYI]US2014264611 (LEE KISUN [KR], et al) [X] 1-6,8-10,13-15 * paragraphs [0001] - [0046]; figures 14-17 * [Y] 11,12 [I] 7; | [XYI]US2018047697 (LUEDEKE HEINRICH [DE], et al) [X] 1-6,8,13-15 * the whole document * [Y] 11,12 [I] 7,9,10; | [Y] - Tapan Pattnayak ET AL, "Antenna Design and RF Layout Guidelines", (20180124), URL: https://web.archive.org/web/20180124131035if_/http://www.cypress.com:80/file/136236/download, (20190124), XP055547079 [Y] 11,12 * pages 1-46; figures 48-52 * | International search | [XY]US2010090330 (NAKAZATO ISAO [JP]) [X] 1,2,4,6,8,13,14,16, 18,20 * , entire document, especially fig 1, 2, 3B, para [0017], [0022], [0036], [0038], [0040], [0041]-[0045], [0060]-[0061], [0069]. * [Y] 3, 5, 7, 9-12, 15, 17, 19, 21-24; | [Y]US2014070235 (ANDREWS PETER SCOTT [US], et al) [Y] 7, 19 * , entire document, especially fig 9B, para [0007], [0053], [0056]-[0057]. *; | [Y]US2015001691 (HIGGINS III LEO M [US]) [Y] 3, 5, 15, 17 * , entire document, especially fig 2, para [0017], [0020]. *; | [Y]US2017125881 (MANGRUM MARC ALAN [US], et al) [Y] 9-12,21-24* , entire document, especially fig 15, 17, 30, 31 para [0009], [0062], [0075], [0097]-[0098], [0100]-[0101], [0130], [0132]-[0133], [0159]. * |