EP3923292 - TEST CIRCUIT AND MEMORY CHIP USING THE TEST CIRCUIT [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 17.03.2023 Database last updated on 24.08.2024 | |
Former | Request for examination was made Status updated on 12.11.2021 | ||
Former | The international publication has been made Status updated on 24.04.2021 | Most recent event Tooltip | 24.08.2024 | New entry: Date of cancellation oral proceedings | Applicant(s) | For all designated states Changxin Memory Technologies, Inc. No. 388, Xingye Avenue Economic and Technological Development Area Hefei, Anhui 230000 / CN | [2021/50] | Inventor(s) | 01 /
WANG, Jia No. 388, Xingye Avenue Economic and Technological Development Area Hefei, Anhui 230000 / CN | 02 /
ZHANG, Liang No. 388, Xingye Avenue Economic and Technological Development Area Hefei, Anhui 230000 / CN | 03 /
LI, Hongwen No. 388, Xingye Avenue Economic and Technological Development Area Hefei, Anhui 230000 / CN | [N/P] |
Former [2021/50] | 01 /
WANG, Jia Hefei, Anhui 230000 / CN | ||
02 /
ZHANG, Liang Hefei, Anhui 230000 / CN | |||
03 /
LI, Hongwen Hefei, Anhui 230000 / CN | Representative(s) | Lavoix Bayerstraße 83 80335 München / DE | [2021/50] | Application number, filing date | 20876871.3 | 10.06.2020 | [2021/50] | WO2020CN95339 | Priority number, date | CN201910981722 | 16.10.2019 Original published format: CN201910981722 | [2021/50] | Filing language | ZH | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2021073128 | Date: | 22.04.2021 | Language: | ZH | [2021/16] | Type: | A1 Application with search report | No.: | EP3923292 | Date: | 15.12.2021 | Language: | EN | [2021/50] | Search report(s) | International search report - published on: | CN | 22.04.2021 | (Supplementary) European search report - dispatched on: | EP | 12.04.2022 | Classification | IPC: | G11C29/40, G11C29/12, G11C29/34, G11C7/10 | [2022/19] | CPC: |
G11C29/34 (EP,US);
G11C29/40 (EP,US);
G11C29/12 (EP);
G11C7/1069 (EP)
|
Former IPC [2021/50] | G11C29/40 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2021/50] | Title | German: | TESTSCHALTUNG UND SPEICHERCHIP UNTER VERWENDUNG DER TESTSCHALTUNG | [2021/50] | English: | TEST CIRCUIT AND MEMORY CHIP USING THE TEST CIRCUIT | [2021/50] | French: | CIRCUIT DE TEST ET PUCE DE MÉMOIRE UTILISANT LE CIRCUIT DE TEST | [2021/50] | Entry into regional phase | 07.09.2021 | Translation filed | 07.09.2021 | National basic fee paid | 07.09.2021 | Search fee paid | 07.09.2021 | Designation fee(s) paid | 07.09.2021 | Examination fee paid | Examination procedure | 07.09.2021 | Examination requested [2021/50] | 31.10.2022 | Amendment by applicant (claims and/or description) | 16.03.2023 | Despatch of a communication from the examining division (Time limit: M04) | 13.07.2023 | Reply to a communication from the examining division | 23.08.2024 | Cancellation of oral proceeding that was planned for 28.11.2024 | 28.11.2024 | Date of oral proceedings (cancelled) | Fees paid | Renewal fee | 17.03.2022 | Renewal fee patent year 03 | 31.03.2023 | Renewal fee patent year 04 | 31.03.2024 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US6134178 (YAMAZAKI AKIRA [JP], et al); | [A]DE10224255 (INFINEON TECHNOLOGIES AG [DE]); | [Y]US7440350 (OBARA TADAHIRO [JP], et al); | [XY]US2012124436 (OKAHIRO TETSUAKI [JP], et al) | International search | [A]CN101080778 (QIMONDA AG [DE]) [A] 1-12* entire document *; | [X]US2012124436 (OKAHIRO TETSUAKI [JP], et al) [X] 1-12 * abstract, description paragraphs 2-97, figures 1-9 *; | [A]CN106445831 (SHENZHEN ZTE MICROELECTRONICS TECHNOLOGY CO LTD) [A] 1-12 * entire document *; | [PX]CN210271794U (CHANGXIN MEMORY TECH INC) [PX] 1-12 * entire document * |