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Extract from the Register of European Patents

EP About this file: EP3923292

EP3923292 - TEST CIRCUIT AND MEMORY CHIP USING THE TEST CIRCUIT [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  17.03.2023
Database last updated on 24.08.2024
FormerRequest for examination was made
Status updated on  12.11.2021
FormerThe international publication has been made
Status updated on  24.04.2021
Most recent event   Tooltip24.08.2024New entry: Date of cancellation oral proceedings 
Applicant(s)For all designated states
Changxin Memory Technologies, Inc.
No. 388, Xingye Avenue
Economic and Technological Development Area
Hefei, Anhui 230000 / CN
[2021/50]
Inventor(s)01 / WANG, Jia
No. 388, Xingye Avenue Economic and Technological
Development Area
Hefei, Anhui 230000 / CN
02 / ZHANG, Liang
No. 388, Xingye Avenue Economic and Technological
Development Area
Hefei, Anhui 230000 / CN
03 / LI, Hongwen
No. 388, Xingye Avenue Economic and Technological
Development Area
Hefei, Anhui 230000 / CN
[N/P]
Former [2021/50]01 / WANG, Jia
Hefei, Anhui 230000 / CN
02 / ZHANG, Liang
Hefei, Anhui 230000 / CN
03 / LI, Hongwen
Hefei, Anhui 230000 / CN
Representative(s)Lavoix
Bayerstraße 83
80335 München / DE
[2021/50]
Application number, filing date20876871.310.06.2020
[2021/50]
WO2020CN95339
Priority number, dateCN20191098172216.10.2019         Original published format: CN201910981722
[2021/50]
Filing languageZH
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021073128
Date:22.04.2021
Language:ZH
[2021/16]
Type: A1 Application with search report 
No.:EP3923292
Date:15.12.2021
Language:EN
[2021/50]
Search report(s)International search report - published on:CN22.04.2021
(Supplementary) European search report - dispatched on:EP12.04.2022
ClassificationIPC:G11C29/40, G11C29/12, G11C29/34, G11C7/10
[2022/19]
CPC:
G11C29/34 (EP,US); G11C29/40 (EP,US); G11C29/12 (EP);
G11C7/1069 (EP)
Former IPC [2021/50]G11C29/40
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/50]
TitleGerman:TESTSCHALTUNG UND SPEICHERCHIP UNTER VERWENDUNG DER TESTSCHALTUNG[2021/50]
English:TEST CIRCUIT AND MEMORY CHIP USING THE TEST CIRCUIT[2021/50]
French:CIRCUIT DE TEST ET PUCE DE MÉMOIRE UTILISANT LE CIRCUIT DE TEST[2021/50]
Entry into regional phase07.09.2021Translation filed 
07.09.2021National basic fee paid 
07.09.2021Search fee paid 
07.09.2021Designation fee(s) paid 
07.09.2021Examination fee paid 
Examination procedure07.09.2021Examination requested  [2021/50]
31.10.2022Amendment by applicant (claims and/or description)
16.03.2023Despatch of a communication from the examining division (Time limit: M04)
13.07.2023Reply to a communication from the examining division
23.08.2024Cancellation of oral proceeding that was planned for 28.11.2024
28.11.2024Date of oral proceedings (cancelled)
Fees paidRenewal fee
17.03.2022Renewal fee patent year 03
31.03.2023Renewal fee patent year 04
31.03.2024Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US6134178  (YAMAZAKI AKIRA [JP], et al);
 [A]DE10224255  (INFINEON TECHNOLOGIES AG [DE]);
 [Y]US7440350  (OBARA TADAHIRO [JP], et al);
 [XY]US2012124436  (OKAHIRO TETSUAKI [JP], et al)
International search[A]CN101080778  (QIMONDA AG [DE]) [A] 1-12* entire document *;
 [X]US2012124436  (OKAHIRO TETSUAKI [JP], et al) [X] 1-12 * abstract, description paragraphs 2-97, figures 1-9 *;
 [A]CN106445831  (SHENZHEN ZTE MICROELECTRONICS TECHNOLOGY CO LTD) [A] 1-12 * entire document *;
 [PX]CN210271794U  (CHANGXIN MEMORY TECH INC) [PX] 1-12 * entire document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.