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Extract from the Register of European Patents

EP About this file: EP4040172

EP4040172 - ARC FAULT DETECTION CIRCUIT AND METHOD FOR DETECTING AN ARC FAULT [Right-click to bookmark this link]
StatusGrant of patent is intended
Status updated on  25.03.2024
Database last updated on 16.07.2024
FormerRequest for examination was made
Status updated on  10.02.2023
FormerThe application has been published
Status updated on  08.07.2022
Most recent event   Tooltip25.03.2024New entry: Communication of intention to grant a patent 
Applicant(s)For all designated states
ABB Schweiz AG
Bruggerstrasse 66
5400 Baden / CH
[2022/32]
Inventor(s)01 / Varga, Matija
8006 Zurich / CH
02 / Maret, Yannick
5405 Dättwil / CH
03 / Butti, Agostino
20151 Milano / IT
04 / Ghezzi, Luca
21013 Gallarate / IT
 [2022/32]
Representative(s)Sykora & König Patentanwälte PartG mbB
Maximilianstraße 2
80539 München / DE
[N/P]
Former [2022/32]Qip Patentanwälte Dr. Kuehn & Partner mbB
Goethestraße 8
80336 München / DE
Application number, filing date21155820.008.02.2021
[2022/32]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP4040172
Date:10.08.2022
Language:EN
[2022/32]
Search report(s)(Supplementary) European search report - dispatched on:EP16.07.2021
ClassificationIPC:G01R31/12, H01H9/50, H02H1/00
[2022/32]
CPC:
G01R31/1227 (EP); G01R31/12 (CN); H02H1/0015 (EP);
H01H9/50 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2023/11]
Former [2022/32]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:LICHTBOGENFEHLERDETEKTIONSSCHALTUNG UND VERFAHREN ZUR DETEKTION EINES LICHTBOGENFEHLERS[2022/32]
English:ARC FAULT DETECTION CIRCUIT AND METHOD FOR DETECTING AN ARC FAULT[2022/32]
French:CIRCUIT DE DÉTECTION DE DÉFAUT D'ARC ET PROCÉDÉ DE DÉTECTION DE DÉFAUT D'ARC[2022/32]
Examination procedure07.02.2023Amendment by applicant (claims and/or description)
07.02.2023Examination requested  [2023/11]
07.02.2023Date on which the examining division has become responsible
26.03.2024Communication of intention to grant the patent
Fees paidRenewal fee
28.02.2023Renewal fee patent year 03
26.02.2024Renewal fee patent year 04
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Documents cited:Search[XYI]EP2706636  (SAMSUNG ELECTRONICS CO LTD [KR]) [X] 1-4,6,7,11,13-15 * abstract * [Y] 10,12 [I] 5,8,9;
 [Y]EP3015872  (DET INT HOLDING LTD [KY]) [Y] 10,12 * paragraph [0044] *;
 [X]US9897642  (JOHNSON JAY [US]) [X] 1,14 * abstract * * column 2, line 3 - column 3, line 17 ** column 5, lines 35-45 *
by applicantEP3386051
 EP3439127
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.