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Extract from the Register of European Patents

EP About this file: EP3929656

EP3929656 - DEFECT-MITIGATION LAYERS IN ELECTROCHROMIC DEVICES [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  08.12.2023
Database last updated on 26.07.2024
FormerRequest for examination was made
Status updated on  01.07.2022
FormerThe application has been published
Status updated on  26.11.2021
Most recent event   Tooltip20.07.2024New entry: Reply to examination report 
20.07.2024New entry: Fee payment for request for further processing 
Applicant(s)For all designated states
View, Inc.
195 South Milpitas Boulevard
Milpitas, CA 95035 / US
[2021/52]
Inventor(s)01 / Kailasam, Sridhar
Fremont, California 94539 / US
02 / Friedman, Robin
Sunnyvale, California 94085 / US
03 / Gillaspie, Dane
Collierville, Tennessee 38017 / US
04 / Pradhan, Anshu
Collierville, Tennessee 38017 / US
05 / Rozbicki, Robert
Los Gatos, California 95033 / US
06 / Mehtani, Disha
Milpitas, California 95035 / US
 [2021/52]
Representative(s)Haseltine Lake Kempner LLP
One Portwall Square
Portwall Lane
Bristol BS1 6BH / GB
[N/P]
Former [2021/52]Haseltine Lake Kempner LLP
Redcliff Quay
120 Redcliff Street
Bristol BS1 6HU / GB
Application number, filing date21184089.707.02.2014
[2021/52]
Priority number, dateUS20131376350508.02.2013         Original published format: US201313763505
[2021/52]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3929656
Date:29.12.2021
Language:EN
[2021/52]
Search report(s)(Supplementary) European search report - dispatched on:EP29.11.2021
ClassificationIPC:G02F1/1524
[2021/52]
CPC:
G02F1/1524 (EP,KR,US); G02F1/133345 (RU,US); G02F1/155 (EP,KR,US);
G02F1/15 (US); C23C14/028 (US); C23C14/06 (US);
C23C14/0635 (US); C23C14/0641 (US); C23C14/0652 (US);
C23C14/0676 (US); C23C14/08 (US); C23C14/081 (US);
C23C14/083 (US); C23C14/086 (US); C23C14/34 (US);
G02F1/1309 (US); G02F1/1523 (RU,US); G02F1/1533 (US);
H01B13/00 (KR,US); H01B5/14 (KR,US); H01J37/3429 (EP,US);
H01J37/3476 (EP,US); G02F2001/1536 (EP,KR,US); G02F2001/1555 (US);
G02F2201/508 (EP,KR,US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/31]
Former [2021/52]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:DEFEKTABSCHWÄCHUNGSSCHICHTEN IN ELEKTROCHROMEN VORRICHTUNGEN[2021/52]
English:DEFECT-MITIGATION LAYERS IN ELECTROCHROMIC DEVICES[2021/52]
French:COUCHES D'ATTÉNUATION DE DÉFAUT DANS DES DISPOSITIFS ÉLECTROCHROMIQUES[2021/52]
Examination procedure23.06.2022Amendment by applicant (claims and/or description)
23.06.2022Examination requested  [2022/31]
23.06.2022Date on which the examining division has become responsible
11.12.2023Despatch of a communication from the examining division (Time limit: M06)
02.07.2024Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
18.07.2024Reply to a communication from the examining division
Parent application(s)   TooltipEP14749144.3  / EP2954370
EP19183372.2  / EP3567423
Request for further processing for:The application is deemed to be withdrawn due to failure to reply to the examination report
18.07.2024Request for further processing filed
18.07.2024Full payment received (date of receipt of payment)
Request granted
26.07.2024Decision despatched
Fees paidRenewal fee
06.07.2021Renewal fee patent year 03
06.07.2021Renewal fee patent year 04
06.07.2021Renewal fee patent year 05
06.07.2021Renewal fee patent year 06
06.07.2021Renewal fee patent year 07
06.07.2021Renewal fee patent year 08
25.02.2022Renewal fee patent year 09
27.02.2023Renewal fee patent year 10
27.02.2024Renewal fee patent year 11
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US2003179432  (VINCENT JOHN B [US], et al);
 [Y]EP2078980  (SHINODA PLASMA CO LTD [JP]);
 [Y]CN101438205B  (GENTEX CORP);
 [Y]WO2011137080  (SOLADIGM INC [US], et al)
by applicantUS20090645111
 US20090645159
 US20100772055
 US20100772075
 US20100814279
 US20100814277
 WO2012US34556
 WO2012US42514
 WO2012US57606
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.